Works matching IS 00135194 AND DT 2016 AND VI 52 AND IP 3
1
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 176, doi. 10.1049/el.2015.3707
- Article
2
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 217, doi. 10.1049/el.2015.3639
- Fangzheng Zhang;
- Bindong Gao;
- Shilong Pan
- Article
3
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 225, doi. 10.1049/el.2015.3514
- Kang Liu;
- Xin Tu;
- Xiang Li;
- Yongqiang Cheng
- Article
4
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 327, doi. 10.1049/el.2015.3979
- Yuan, Yabo;
- Wang, Bo;
- Wu, Bin
- Article
5
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 173
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 202, doi. 10.1049/el.2015.3965
- Martina, M.;
- Condo, C.;
- Roch, M. R.;
- Masera, G.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 226, doi. 10.1049/el.2015.3907
- Fioranelli, F.;
- Ritchie, M.;
- Balleri, A.;
- Griffiths, H.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 175, doi. 10.1049/el.2015.3637
- Jun, S.;
- Sanz-Izquierdo, B.;
- Parker, E. A.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 216, doi. 10.1049/el.2015.3375
- Article
12
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 200, doi. 10.1049/el.2015.3598
- Article
13
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 230, doi. 10.1049/el.2015.3539
- Takada, Y.;
- Okamoto, N.;
- Saito, T.;
- Kondo, K.;
- Yoshimura, T.;
- Fujimura, N.;
- Higuchi, K.;
- Kitajima, A.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 195, doi. 10.1049/el.2015.2978
- Zhengwei Shen;
- Lishuang Cheng
- Article
15
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 245, doi. 10.1049/el.2015.3593
- Article
16
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 204, doi. 10.1049/el.2015.3541
- Article
17
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 223, doi. 10.1049/el.2015.3510
- Juntaek Oh;
- Jingyu Jang;
- Songcheol Hong
- Article
18
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 197, doi. 10.1049/el.2015.3495
- B. Li;
- H. Li;
- Söderström, U.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 187, doi. 10.1049/el.2015.3381
- Yazdani, B.;
- Khorami, A.;
- Sharifkhani, M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 177, doi. 10.1049/el.2015.3488
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 185, doi. 10.1049/el.2015.3460
- Karthick, P. A.;
- Ramakrishnan, S.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 228, doi. 10.1049/el.2015.2951
- Article
23
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 179, doi. 10.1049/el.2015.3452
- Hyunwoong Shin;
- Jihwan Jeon;
- Hyeondong Kim
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 183, doi. 10.1049/el.2015.3449
- Article
25
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 219, doi. 10.1049/el.2015.3017
- Xuming Yu;
- Huan Sun;
- Yuehang Xu;
- Wei Hong
- Article
26
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 208, doi. 10.1049/el.2015.3329
- Dias, P. C.;
- Morais, F. O.;
- França, M. B.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 243, doi. 10.1049/el.2015.3249
- Bowei Yang;
- Weisi Guo;
- Yanliang Jin;
- Siyi Wang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 234, doi. 10.1049/el.2015.3221
- Article
29
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 188, doi. 10.1049/el.2015.3138
- Yanfang Liu;
- Hong Liu;
- Haisheng Wu;
- Dan Zou
- Article
30
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 212, doi. 10.1049/el.2015.3108
- Lingxiao Jiao;
- Yongle Wu;
- Yuanan Liu;
- Weimin Wang;
- Jian-Xin Chen
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 210, doi. 10.1049/el.2015.2937
- Ting Zhang;
- Fei Xiao;
- Jingfu Bao;
- Xiaohong
- Article
32
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 325, doi. 10.1049/el.2015.1703
- Wu, Shang‐Chi;
- Lee, Tai‐Cheng
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 319, doi. 10.1049/el.2015.3694
- Arriaga‐Trejo, I.A.;
- Flores‐Troncoso, J.;
- Villanueva, J.;
- Simón, J.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 308, doi. 10.1049/el.2015.3232
- Rana, M.;
- Kabir, A.;
- Rafi, Md.;
- MRazib, M.;
- Jarin, S.;
- Khan, A.G.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 235, doi. 10.1049/el.2015.2934
- Lee, Y. K.;
- Yang, S. H.;
- Lee, C. B.;
- Lee, J. G.;
- Hwang, S. W.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 198, doi. 10.1049/el.2015.2907
- Bae, M.;
- Jo, S.-H.;
- Choi, B.-S.;
- Lee, H. H.;
- Choi, P.;
- Shin, J.-K.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 239, doi. 10.1049/el.2015.2845
- Akande, K.;
- Iqbal, N.;
- Zerguine, A.;
- Chambers, J.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 221, doi. 10.1049/el.2015.2711
- Hernandez, W.;
- Maldonado-Correa, J. L.;
- Méndez, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 181, doi. 10.1049/el.2015.2610
- Hongbin Ge;
- Yuan Yao;
- Junsheng Yu;
- Xiaodong Chen;
- Valderas, Daniel
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 193, doi. 10.1049/el.2015.2602
- Proietti, A.;
- Liparulo, L.;
- Panella, M.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 214, doi. 10.1049/el.2015.2541
- Jianzhong Chen;
- Jie Shen;
- Ni Gao;
- Anxue Zhang
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 237, doi. 10.1049/el.2015.2418
- Tripon-Canseliet, C.;
- Zegaoui, M.;
- Jestin, G.;
- Coinon, C.;
- Berger, P.;
- Baili, G.;
- Descamps-Mandine, A.;
- Maksimovic, I.;
- Decoster, D.;
- Hodé, J. M.;
- Dolfi, D.;
- Chazelas, J.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 206, doi. 10.1049/el.2015.2528
- Tartagni, M.;
- Crescentini, M.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 241, doi. 10.1049/el.2015.2405
- Article
45
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 190, doi. 10.1049/el.2015.1749
- Badgujar, K. D.;
- Park, P. G.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 232, doi. 10.1049/el.2015.1607
- Chie-In Lee;
- Yan-Ting Lin;
- Wei-Cheng Lin
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 316, doi. 10.1049/el.2015.3092
- Khalili, A.;
- Soliman, A.A.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 287, doi. 10.1049/el.2015.3439
- Hao, Jinguang;
- Pei, Wenjiang;
- Wang, Kai;
- Xia, Yili
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 285, doi. 10.1049/el.2015.3547
- Article
50
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 3, p. 323, doi. 10.1049/el.2015.3239
- Khattabi, Y.;
- Matalgah, M.M.
- Article