Works matching IS 00218898 AND DT 2003 AND VI 36 AND IP 5

Results: 34

forthcoming meetings and short courses.

Published in:: Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1299
Publication type:: Article

A quick and gentle method for mounting crystals in capillaries.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1297, doi. 10.1107/S0021889803014006

By:

Basavappa, Ravi;
Petri, Edward T.;
Tolbert, Blanton S.

Publication type:

Article

books received.

Published in:: Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1299
Publication type:: Article

CIF applications. XIV. Reporting of Rietveld results using pdCIF: GSAS2CIF.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1290, doi. 10.1107/S0021889803016819

By:

Toby, Brian H.;
Dreele, Robert B. Von;
Larson, Allen C.

Publication type:

Article

Microscope detection options for colorless protein crystals grown in lipidic cubic phases.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1295, doi. 10.1107/S0021889803013724

By:

Nollert, Peter

Publication type:

Article

CIF applications. XIII. CIFEDIT, a program for viewing and editing CIFs.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1288, doi. 10.1107/S0021889803016790

By:

Toby, Brian H.

Publication type:

Article

CIF applications. XII. Inspecting Rietveld fits from pdCIF: pdCIFplot.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1285, doi. 10.1107/S0021889803016789

By:

Toby, Brian H.

Publication type:

Article

OLEX: new software for visualization and analysis of extended crystal structures.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1283, doi. 10.1107/S0021889803015267

By:

Dolomanov, Oleg V.;
Blake, Alexander J.;
Champness, Neil R.;
Schröder, Martin

Publication type:

Article

PRIMUS: a Windows PC-based system for small-angle scattering data analysis.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1277, doi. 10.1107/S0021889803012779

By:

Konarev, Petr V.;
Volkov, Vladimir V.;
Sokolova, Anna V.;
Koch, Michel H. J.;
Svergun, Dmitri I.

Publication type:

Article

SAPI: a direct-methods program for finding heavy-atom sites with SAD or SIR data.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1274, doi. 10.1107/S0021889803014031

By:

Hao, Q.;
Gu, Y. X.;
Yao, J. X.;
Zheng, C. D.;
Fan, H. F.

Publication type:

Article

M[subg]Cl[sub2].2.5C[sub2]H[sub5]OH-NaCl mixed crystals.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1272, doi. 10.1107/S0021889803018879

By:

Jiang, Xue;
Fan, Zhiqiang

Publication type:

Article

Not on Bravais--Miller indices.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1270, doi. 10.1107/S0021889803014778

By:

Schwarzenbach, D.

Publication type:

Article

A contribution to the practical implementation of a variable-geometry converging multichannel collimator for SANS.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1266

By:

Falc&asline;o, A. N.;
Margaca, F. M. A.;
Carvalho, F. G.

Publication type:

Article

Intensity and resolution effects in converging multichannel collimators for SANS by Monte Carlo simulation.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1262

By:

Falc&asline;o, A. N.;
Margaca, F. M. A.;
Carvalho, F. G.

Publication type:

Article

Investigation of distorted subsurface layers of thick perfect crystals.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1256, doi. 10.1107/S002188980301481X

By:

Aboyan, A. O.;
Drmeyan, H. R.

Publication type:

Article

Scan profiles for neutron spectrometers. I. Gaussian-profile elements by acceptance-diagram methods.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1204, doi. 10.1107/S0021889803014468

By:

Cussen, L. D.

Publication type:

Article

Twinning in La[sub0.95]Sr[sub0.05]Mg[sub0.1]O[sub2.92] crystal studied by white-beam (Laue) X-ray microdiffraction.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1197, doi. 10.1107/S002188980301433X

By:

Savytskii, D. I.;
Trots, D. M.;
Vasylechko, L. O.;
Tamura, N.;
Berkowski, M.

Publication type:

Article

Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1230, doi. 10.1107/S0021889803014766

By:

Lai, X.;
Roberts, K. J.;
Avanci, L. H.;
Cardoso, L. P.;
Sasaki, J. M.

Publication type:

Article

Scan profiles for neutron spectrometers. III. Rectangular-profile elements by numerical methods.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1225, doi. 10.1107/S002188980301447X

By:

Cussen, L. D.;
Wildes, A. R.

Publication type:

Article

Scan profiles for neutron spectrometers. II. Rectangular-profile elements by acceptance-diagram methods.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1214, doi. 10.1107/S0021889803014456

By:

Cussen, L. D.

Publication type:

Article

Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1240, doi. 10.1107/S0021889803014924

By:

Bunge, Hans Joachim;
Wcislak, Leszek;
Klein, Helmut;
Garbe, Ulf;
Schneider, Jochen Richard

Publication type:

Article

In situ X-ray diffraction studies of aluminium-induced crystallization of hydrogenated amorphous silicon.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1236, doi. 10.1107/S0021889803014912

By:

Kishore, Ram;
Hotz, Chris;
Naseem, H. A.;
Brown, W. D.

Publication type:

Article

Strategies for solving neighboring-element problems: a case study using resonant X-ray diffraction and pulsed neutron diffraction to examine Sr[sub8]Ga[sub16]Ge[sub30].

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1182, doi. 10.1107/S0021889803013955

By:

Zhang, Yuegang;
Wilkinson, Angus P.;
Noles, George S.;
Lee, Peter L.;
Hodges, Jason P.

Publication type:

Article

Estimation of chord length distributions from small-angle scattering using indirect Fourier transformation.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1190, doi. 10.1107/S0021889803014262

By:

Hansen, Steen

Publication type:

Article

General-case data interpretation of spin-echo small-angle neutron scattering.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1177, doi. 10.1107/S0021889803013736

By:

Zhao, Jinkui

Publication type:

Article

Accuracy in Rietveld quantitative phase analysis of Portland cements.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1169, doi. 10.1107/S002188980301375X

By:

De Ia Torre, A. C.;
Aranda, M. A. C.

Publication type:

Article

In situ determination of stresses from time-of-flight neutron transmission spectra.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1159, doi. 10.1107/S0021889803013748

By:

Steuwer, Axel;
Santisteban, Javier Roberto;
Withers, Philip J.;
Edwards, Lyndon;
Fitzpatrick, Mike E.

Publication type:

Article

Determination of nanoparticle structure type, size and strain distribution from X-ray data for monatomic f.c.c-derived non-crystallographic nanoclusters.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1148, doi. 10.1107/S0021889803013542

By:

Cervellino, Antonio;
Giannini, Cinzia;
Guagliardi, Antonietta

Publication type:

Article

Thick-mode resonance of a PZT/Si wafer stack investigated by X-ray diffraction in Bragg geometry.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1144, doi. 10.1107/S0021889803012998

By:

Souza, Paulo Eduardo Narcizo de;
Cusatis, César;
Saul, Cyro Ketzer;
Rodrigues, Antônio Ricardo Dropler;
Camargo, Paul César de

Publication type:

Article

Residual stresses in tool steel due to hard-turning.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1135, doi. 10.1107/S0021889803012755

By:

Ordas, Nerea;
Penalva, Man Luz;
Fernández, Justino;
Garc&iacutea-Rosales, Carmen

Publication type:

Article

Monte Carlo simulation of models for biological systems: thermodynamic properties and small-angle scattering from collections of interacting binary mixtures of spheres.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1128

By:

Sjöberg, Bo

Publication type:

Article

A full-pattern fitting algorithm for energy-dispersive X-ray diffraction.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1123, doi. 10.1107/S0021889803012597

By:

Yu-Hui Dong, Janet M.;
Jing Liu;
Yan-Chun Li, Janet M.;
Xiao-Dong Li

Publication type:

Article

Automatic inference of protein quaternary structure from crystals.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1116, doi. 10.1107/S0021889803012421

By:

Ponstingl, Hannes;
kabir, Thomas;
Thornton, Janet M.

Publication type:

Article

Diffraction peak profiles from spherical crystallites with lognormal size distribution.

Published in:

Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1107, doi. 10.1107/S0021889803011580

By:

Ida, T.;
Shimazaki, S.;
Hibino, H.;
Toraya, H.

Publication type:

Article