Works matching IS 00218898 AND DT 2003 AND VI 36 AND IP 5
Results: 34
forthcoming meetings and short courses.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1299
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books received.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1299
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OLEX: new software for visualization and analysis of extended crystal structures.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1283, doi. 10.1107/S0021889803015267
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Microscope detection options for colorless protein crystals grown in lipidic cubic phases.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1295, doi. 10.1107/S0021889803013724
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CIF applications. XIV. Reporting of Rietveld results using pdCIF: GSAS2CIF.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1290, doi. 10.1107/S0021889803016819
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CIF applications. XIII. CIFEDIT, a program for viewing and editing CIFs.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1288, doi. 10.1107/S0021889803016790
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CIF applications. XII. Inspecting Rietveld fits from pdCIF: pdCIFplot.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1285, doi. 10.1107/S0021889803016789
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A quick and gentle method for mounting crystals in capillaries.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1297, doi. 10.1107/S0021889803014006
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PRIMUS: a Windows PC-based system for small-angle scattering data analysis.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1277, doi. 10.1107/S0021889803012779
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SAPI: a direct-methods program for finding heavy-atom sites with SAD or SIR data.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1274, doi. 10.1107/S0021889803014031
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M[subg]Cl[sub2].2.5C[sub2]H[sub5]OH-NaCl mixed crystals.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1272, doi. 10.1107/S0021889803018879
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A contribution to the practical implementation of a variable-geometry converging multichannel collimator for SANS.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1266
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Not on Bravais--Miller indices.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1270, doi. 10.1107/S0021889803014778
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Intensity and resolution effects in converging multichannel collimators for SANS by Monte Carlo simulation.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1262
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Investigation of distorted subsurface layers of thick perfect crystals.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1256, doi. 10.1107/S002188980301481X
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Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1240, doi. 10.1107/S0021889803014924
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In situ X-ray diffraction studies of aluminium-induced crystallization of hydrogenated amorphous silicon.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1236, doi. 10.1107/S0021889803014912
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Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1230, doi. 10.1107/S0021889803014766
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Scan profiles for neutron spectrometers. III. Rectangular-profile elements by numerical methods.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1225, doi. 10.1107/S002188980301447X
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Scan profiles for neutron spectrometers. II. Rectangular-profile elements by acceptance-diagram methods.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1214, doi. 10.1107/S0021889803014456
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Scan profiles for neutron spectrometers. I. Gaussian-profile elements by acceptance-diagram methods.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1204, doi. 10.1107/S0021889803014468
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Twinning in La[sub0.95]Sr[sub0.05]Mg[sub0.1]O[sub2.92] crystal studied by white-beam (Laue) X-ray microdiffraction.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1197, doi. 10.1107/S002188980301433X
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Estimation of chord length distributions from small-angle scattering using indirect Fourier transformation.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1190, doi. 10.1107/S0021889803014262
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Strategies for solving neighboring-element problems: a case study using resonant X-ray diffraction and pulsed neutron diffraction to examine Sr[sub8]Ga[sub16]Ge[sub30].
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1182, doi. 10.1107/S0021889803013955
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General-case data interpretation of spin-echo small-angle neutron scattering.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1177, doi. 10.1107/S0021889803013736
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Accuracy in Rietveld quantitative phase analysis of Portland cements.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1169, doi. 10.1107/S002188980301375X
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In situ determination of stresses from time-of-flight neutron transmission spectra.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1159, doi. 10.1107/S0021889803013748
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Determination of nanoparticle structure type, size and strain distribution from X-ray data for monatomic f.c.c-derived non-crystallographic nanoclusters.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1148, doi. 10.1107/S0021889803013542
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Thick-mode resonance of a PZT/Si wafer stack investigated by X-ray diffraction in Bragg geometry.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1144, doi. 10.1107/S0021889803012998
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Residual stresses in tool steel due to hard-turning.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1135, doi. 10.1107/S0021889803012755
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Monte Carlo simulation of models for biological systems: thermodynamic properties and small-angle scattering from collections of interacting binary mixtures of spheres.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1128
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A full-pattern fitting algorithm for energy-dispersive X-ray diffraction.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1123, doi. 10.1107/S0021889803012597
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Automatic inference of protein quaternary structure from crystals.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1116, doi. 10.1107/S0021889803012421
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Diffraction peak profiles from spherical crystallites with lognormal size distribution.
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- Journal of Applied Crystallography, 2003, v. 36, n. 5, p. 1107, doi. 10.1107/S0021889803011580
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