Works matching DE "SINGLE event effects"

Results: 217

Proteostasis in ice: the role of heat shock proteins and ubiquitin in the freeze tolerance of the intertidal mussel, Mytilus trossulus.

Published in:

Journal of Comparative Physiology B: Biochemical, Systemic & Environmental Physiology, 2023, v. 193, n. 2, p. 155, doi. 10.1007/s00360-022-01473-2

By:

Gill, Lauren T.;
Kennedy, Jessica R.;
Marshall, Katie E.

Publication type:

Article

Foresail-2: Space Physics Mission in a Challenging Environment.

Published in:

Space Science Reviews, 2023, v. 219, n. 8, p. 1, doi. 10.1007/s11214-023-01012-7

By:

Anger, Marius;
Niemelä, Petri;
Cheremetiev, Kiril;
Clayhills, Bruce;
Fetzer, Anton;
Lundén, Ville;
Hiltunen, Markus;
Kärkkäinen, Tomi;
Mayank, M.;
Turc, Lucile;
Osmane, Adnane;
Palmroth, Minna;
Kilpua, Emilia;
Oleynik, Philipp;
Vainio, Rami;
Virtanen, Pasi;
Toivanen, Petri;
Janhunen, Pekka;
Fischer, David;
Le Bonhomme, Guillaume

Publication type:

Article

Development of a Support System for Radiation Resistance Testing.

Published in:

Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2019, v. 17, n. 2, p. 263, doi. 10.2322/tastj.17.263

By:

Akihiro NAGATA;
Atsushi YASUDA;
Hiromasa WATANABE;
Toshihiro KAMEDA

Publication type:

Article

LEO Single Event Upset Emulator for Validation of FPGA Based Avionics Systems.

Published in:

Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2014, v. 12, n. ists 29, p. 19

By:

IBRAHIM, Mohamed Mahmoud;
Kenichi ASAMI;
Mengu CHO

Publication type:

Article

Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser.

Published in:

Photonics, 2022, v. 9, n. 4, p. N.PAG, doi. 10.3390/photonics9040270

By:

Cui, Yixin;
Ma, Yingqi;
Shangguan, Shipeng;
Han, Jianwei

Publication type:

Article

Single event response of ferroelectric spacer engineered SOI FinFET at 14 nm technology node.

Published in:

Scientific Reports, 2023, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-36952-1

By:

Liu, Baojun;
Zhu, Jing

Publication type:

Article

Effect of temperature and single event transient on crosstalk in coupled single‐walled carbon nanotube (SWCNT) bundle interconnects.

Published in:

International Journal of Circuit Theory & Applications, 2021, v. 49, n. 10, p. 3408, doi. 10.1002/cta.3089

By:

Liu, Baojun;
Li, Cheng;
Li, Chuang;
Zhang, Shuang

Publication type:

Article

Optimal Partial Reconfiguration for Permanent Fault Recovery on SRAM-Based FPGAs in Space Mission.

Published in:

Advances in Mechanical Engineering (Sage Publications Inc.), 2013, v. 5, p. 1, doi. 10.1155/2013/783673

By:

Jie Zhang;
Yong Guan;
Chunjing Mao

Publication type:

Article

New Protection Technique Against Unidirectional MEUs for FIR Filters.

Published in:

Circuits, Systems & Signal Processing, 2018, v. 37, n. 1, p. 367, doi. 10.1007/s00034-017-0556-z

By:

Omidi, Reza;
Zarrabi, Houman

Publication type:

Article

How Personal Transformation Occurs Following a Single Peak Experience in Nature: A Phenomenological Account.

Published in:

Journal of Humanistic Psychology, 2020, v. 60, n. 6, p. 865, doi. 10.1177/0022167817714692

By:

Naor, Lia;
Mayseless, Ofra

Publication type:

Article

Theoretical and quantitative analyses of the fault slip rate uncertainties from single event and erosion of the accumulated offset.

Published in:

Island Arc, 2013, v. 22, n. 2, p. 185, doi. 10.1111/iar.12015

By:

Ren, Zhikun;
Zhang, Zhuqi;
Chen, Tao;
Wang, Weitao

Publication type:

Article

Dose-dependent long-term effects of a single radiation event on behaviour and glial cells.

Published in:

International Journal of Radiation Biology, 2021, v. 97, n. 2, p. 156, doi. 10.1080/09553002.2021.1857455

By:

Ung, Marie-Claire;
Garrett, Lillian;
Dalke, Claudia;
Leitner, Valentin;
Dragosa, Daniel;
Hladik, Daniela;
Neff, Frauke;
Wagner, Florian;
Zitzelsberger, Horst;
Miller, Gregor;
de Angelis, Martin Hrabĕ;
Rößler, Ute;
Vogt Weisenhorn, Daniela;
Wurst, Wolfgang;
Graw, Jochen;
Hölter, Sabine M.

Publication type:

Article

Effect of Underlap and Its Soft Error Performance in 30 nm Junctionless Based 6T- SRAM Cell.

Published in:

Telkomnika, 2015, v. 13, n. 2, p. 451, doi. 10.12928/TELKOMNIKA.v13i2.1298

By:

Chitra, P.;
Ramakrishnan, V. N.

Publication type:

Article

An Enhanced LPRAFF with Tri-State Inverter Embedded Non-Clock Gating via the CT-GWO Algorithm.

Published in:

IETE Journal of Research, 2025, v. 71, n. 1, p. 199, doi. 10.1080/03772063.2024.2403697

By:

Kamalakannan, R. S.;
Senthilkumar, R.;
Venkatachalam, K.;
Tamilarasi, K.

Publication type:

Article

Scanning the Issue.

Published in:

IETE Journal of Research, 2024, v. 70, n. 4, p. 3297, doi. 10.1080/03772063.2024.2361531

By:

Koul, Shiban K;
Kumar, Arun;
Mallik, Ranjan K

Publication type:

Article

Scanning the Issue.

Published in:

IETE Journal of Research, 2023, v. 69, n. 3, p. 1167, doi. 10.1080/03772063.2023.2185354

By:

Kumar, Arun;
Koul, Shiban K;
Mallik, Ranjan K

Publication type:

Article

Effects of Total Dose Radiation on Single Event Effect of the Uniaxial Strained Si Nano NMOSFET.

Published in:

IETE Journal of Research, 2023, v. 69, n. 3, p. 1522, doi. 10.1080/03772063.2020.1871420

By:

Hao, Minru;
Zhang, Yan;
Shao, Min;
Chen, Guoxiang;
Wang, Bin

Publication type:

Article

Reliable Implementation on SRAM-based FPGA using Evolutionary Methods.

Published in:

IETE Journal of Research, 2013, v. 59, n. 5, p. 597, doi. 10.4103/0377-2063.123766

By:

Jahanirad, Hadi;
Mohammadi, Karim

Publication type:

Article

Message of Guest Editors.

Published in:

Journal of Integrated Circuits & Systems, 2022, v. 17, n. 3, p. 1

By:

Cristina;
Renato

Publication type:

Article

Asynchronous Circuit Principles and a Survey of Associated Design Tools.

Published in:

Journal of Integrated Circuits & Systems, 2022, v. 17, n. 3, p. 1, doi. 10.29292/jics.v17i3.677

By:

Calazans, Ney L. V.;
Sartori, Marcos L. L.

Publication type:

Article

Single Event Transient on Combinational Logic: An Introduction and their Mitigation.

Published in:

Journal of Integrated Circuits & Systems, 2022, v. 17, n. 3, p. 1, doi. 10.29292/jics.v17i3.650

By:

Kessler, Henrique;
Ferraz, Bruno T.;
da Rosa Jr., Leomar;
Aguiar, Ygor Q.;
Camargo, Vinícius V. A.

Publication type:

Article

Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions.

Published in:

Journal of Integrated Circuits & Systems, 2021, v. 16, n. 3, p. 1, doi. 10.29292/jics.v16i3.567

By:

González, Carlos J.;
Machado, Diego N.;
Vaz, Rafael G.;
Bôas, Alexis C. Vilas;
Gonçalez, Odair L.;
Puchner, Helmut;
Added, Nemitala;
Macchione, Eduardo L. A.;
Aguiar, Vitor A. P.;
Kastensmidt, Fernanda L.;
Medina, Nilberto H.;
Guazzelli, Marcilei A.;
Balen, Tiago R.

Publication type:

Article

A Comparative Analysis of Electrical Behavior and Soft Error Impact on XOR Logic Gates in Nanotechnologies.

Published in:

Journal of Integrated Circuits & Systems, 2020, v. 15, n. 2, p. 1, doi. 10.29292/jics.v15i2.131

By:

Oliveira, Rafael N. M.;
Meinhardt, Cristina

Publication type:

Article

An Approach to Emulate and Validate the Effects of Single Event Upsets using the PREDICT FUTRE Hardware Integrated Framework.

Published in:

Defence Science Journal, 2020, v. 70, n. 3, p. 272, doi. 10.14429/dsj.70.15283

By:

P., Balasubramanian;
Moorthi, S.

Publication type:

Article

An investigation into the impact of LET on the Single Event Burnout (SEB) sensitivity of a 3.3 kV PiN diode.

Published in:

Radiation Physics & Engineering, 2024, v. 5, n. 3, p. 57, doi. 10.22034/rpe.2024.469537.1226

By:

Soleimaninia, Masoumeh

Publication type:

Article

A Review on SEU Mitigation Techniques for FPGA Configuration Memory.

Published in:

IETE Technical Review, 2018, v. 35, n. 2, p. 157, doi. 10.1080/02564602.2016.1265905

By:

Nidhin, T. S.;
Bhattacharyya, Anindya;
Behera, R. P.;
Jayanthi, T.

Publication type:

Article

Mechanism and Equivalence of Single Event Effects Induced by 14 MeV Neutrons in High-Speed QDR SRAM.

Published in:

Applied Sciences (2076-3417), 2022, v. 12, n. 19, p. 9685, doi. 10.3390/app12199685

By:

Yang, Shaohua;
Zhang, Zhangang;
Lei, Zhifeng;
Tong, Teng;
Li, Xiaohui;
Xi, Kai;
Wu, Fugen

Publication type:

Article

Experimental Study on the Space Electrostatic Discharge Effect and the Single Event Effect of SRAM Devices for Satellites.

Published in:

Applied Sciences (2076-3417), 2022, v. 12, n. 14, p. 7129, doi. 10.3390/app12147129

By:

Wang, Xuan;
Chen, Rui;
Yuan, Runjie;
Chen, Qian;
Liang, Yanan;
Han, Jianwei

Publication type:

Article

Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node.

Published in:

Applied Sciences (2076-3417), 2022, v. 12, n. 9, p. N.PAG, doi. 10.3390/app12094229

By:

Elash, Christopher J.;
Li, Zongru;
Jin, Chen;
Chen, Li;
Xing, Jiesi;
Yang, Zhiwu;
Shi, Shuting

Publication type:

Article

Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices.

Published in:

Applied Sciences (2076-3417), 2022, v. 12, n. 8, p. 4086, doi. 10.3390/app12084086

By:

Tan, Cher-Ming

Publication type:

Article

Lineal Energy of Proton in Silicon by a Microdosimetry Simulation.

Published in:

Applied Sciences (2076-3417), 2021, v. 11, n. 3, p. 1113, doi. 10.3390/app11031113

By:

Chiang, Yueh;
Tan, Cher Ming;
Tung, Chuan-Jong;
Lee, Chung-Chi;
Chao, Tsi-Chian;
Meola, Carosena

Publication type:

Article

Investigate the Equivalence of Neutrons and Protons in Single Event Effects Testing: A Geant4 Study.

Published in:

Applied Sciences (2076-3417), 2020, v. 10, n. 9, p. 3234, doi. 10.3390/app10093234

By:

Chiang, Yueh;
Tan, Cher Ming;
Chao, Tsi-Chian;
Lee, Chung-Chi;
Tung, Chuan-Jong

Publication type:

Article

Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research.

Published in:

Applied Sciences (2076-3417), 2020, v. 10, n. 9, p. 3018, doi. 10.3390/app10093018

By:

Gu, Cheng;
Belev, George;
Tian, Haonan;
Shi, Shuting;
Nofal, Issam;
Wen, Shijie;
Chen, Li

Publication type:

Article

Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier.

Published in:

Energies (19961073), 2024, v. 17, n. 18, p. 4725, doi. 10.3390/en17184725

By:

Cardenas Chavez, Jaime;
Hiemstra, Dave;
Noguera Cundar, Adriana;
Johnson, Brayden;
Baik, David;
Chen, Li

Publication type:

Article

A Fault-Tolerant Strategy for Three-Level Flying-Capacitor DC/DC Converter in Spacecraft Power System †.

Published in:

Energies (19961073), 2023, v. 16, n. 1, p. 556, doi. 10.3390/en16010556

By:

Li, Haijin;
Gu, Yu;
Zhang, Xiaofeng;
Liu, Zhigang;
Zhang, Longlong;
Zeng, Yi

Publication type:

Article

AniMAIRE‐A New Openly Available Tool for Calculating Atmospheric Ionising Radiation Dose Rates and Single Event Effects During Anisotropic Conditions.

Published in:

Space Weather: The International Journal of Research & Applications, 2024, v. 22, n. 10, p. 1, doi. 10.1029/2024SW003985

By:

Davis, C. S. W.;
Baird, F.;
Lei, F.;
Ryden, K.;
Dyer, C.

Publication type:

Article

NAIRAS Model Run‐On‐Request Service at CCMC.

Published in:

Space Weather: The International Journal of Research & Applications, 2023, v. 21, n. 5, p. 1, doi. 10.1029/2023SW003473

By:

Mertens, C. J.;
Gronoff, G. P.;
Zheng, Y.;
Petrenko, M.;
Buhler, J.;
Phoenix, D.;
Willis, E.;
Jun, I.;
Minow, J.

Publication type:

Article

A New Model for Nowcasting the Aviation Radiation Environment With Comparisons to In Situ Measurements During GLEs.

Published in:

Space Weather: The International Journal of Research & Applications, 2022, v. 20, n. 8, p. 1, doi. 10.1029/2022SW003155

By:

Hands, A. D. P.;
Lei, F.;
Davis, C. S.;
Clewer, B. J.;
Dyer, C. S.;
Ryden, K. A.

Publication type:

Article

Author Index Volume 31 (2022).

Published in:: Journal of Circuits, Systems & Computers, 2022, v. 31, n. 18, p. 1, doi. 10.1142/S0218126622990018
Publication type:: Article

Transistor-Level Radiation Hardening by Design Techniques in Complex Gates.

Published in:

Journal of Circuits, Systems & Computers, 2022, v. 31, n. 18, p. 1, doi. 10.1142/S0218126622400096

By:

Ferraz, Bruno T.;
Kessler, Henrique;
Camargo, Vinícius V. A.

Publication type:

Article

Reconfigurable FET-Based Tunable Ring Oscillator and Its Single Event Effect Performance.

Published in:

Journal of Circuits, Systems & Computers, 2022, v. 31, n. 18, p. 1, doi. 10.1142/S0218126622400084

By:

Durga Jayakumar, G.;
Kumar Pal, Susanta;
Srinivasan, R.

Publication type:

Article

Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors.

Published in:

Journal of Circuits, Systems & Computers, 2022, v. 31, n. 18, p. 1, doi. 10.1142/S0218126622400072

By:

Andjelkovic, Marko;
Marjanovic, Milos;
Drasko, Bojan;
Calligaro, Cristiano;
Schrape, Oliver;
Gatti, Umberto;
Kuentzer, Felipe A.;
Ilic, Stefan;
Ristic, Goran;
Krstic, Milos

Publication type:

Article

Joint Effects of Aging and Process Variations on Soft Error Rate of Nano-Scale Digital Circuits.

Published in:

Journal of Circuits, Systems & Computers, 2021, v. 30, n. 1, p. N.PAG, doi. 10.1142/S0218126621500122

By:

Aghadadi, Mohammad Sajjad;
Fazeli, Mahdi;
Beitollahi, Hakem

Publication type:

Article

Double Modular Redundancy (DMR) Based Fault Tolerance Technique for Combinational Circuits.

Published in:

Journal of Circuits, Systems & Computers, 2018, v. 27, n. 6, p. N.PAG, doi. 10.1142/S0218126618500974

By:

Sheikh, Ahmad T.;
El-Maleh, Aiman H.

Publication type:

Article

Impact of Single Event Upset on Voltage and Current Behaviors of CNTFET SRAM and a Comparison with CMOS SRAM.

Published in:

Journal of Circuits, Systems & Computers, 2017, v. 26, n. 2, p. 1, doi. 10.1142/S0218126617500207

By:

Rajalakshmi, T. R.;
Sudhakar, R.

Publication type:

Article

Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations.

Published in:

Journal of Circuits, Systems & Computers, 2015, v. 24, n. 1, p. 1, doi. 10.1142/S0218126615500073

By:

Rajaei, Ramin;
Tabandeh, Mahmoud;
Fazeli, Mahdi

Publication type:

Article

AN EFFECTIVE CONTROL FLOW CHECKING METHOD FOR MULTITASK PROCESSING IN HARSH ENVIRONMENTS.

Published in:

Journal of Circuits, Systems & Computers, 2013, v. 22, n. 8, p. -1, doi. 10.1142/S0218126613500679

By:

ASGHARI, SEYYED AMIR;
ABDI, ATENA;
KAYNAK, OKYAY;
TAHERI, HASSAN;
PEDRAM, HOSSEIN

Publication type:

Article

DG-FINFET-BASED SRAM CONFIGURATIONS FOR INCREASED SEU IMMUNITY.

Published in:

Journal of Circuits, Systems & Computers, 2012, v. 21, n. 4, p. -1, doi. 10.1142/S0218126612500326

By:

RATHOD, S. S.;
SAXENA, A. K.;
DASGUPTA, S.

Publication type:

Article

Reduction of Single Event Latch-up Using FinFET Based 7T SRAM Cell.

Published in:

Journal of Active & Passive Electronic Devices, 2015, v. 10, n. 3-4, p. 235

By:

SABLE, VARUN;
AKASHE, SHYAM

Publication type:

Article

Calculation of the high-energy neutron flux for anticipating errors and recovery techniques in exascale supercomputer centres.

Published in:

Journal of Supercomputing, 2023, v. 79, n. 8, p. 8205, doi. 10.1007/s11227-022-04981-8

By:

Asorey, Hernán;
Mayo-García, Rafael

Publication type:

Article