Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 2
1
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 161, doi. 10.1093/jmicro/52.2.161
- T. Takagi;
- S.A. Ishijima;
- H. Ochi;
- M. Osumi
- Article
2
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 153, doi. 10.1093/jmicro/52.2.153
- M. Nishimura*;
- M. Wada;
- T. Akiba;
- M. Yamada
- Article
3
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 145, doi. 10.1093/jmicro/52.2.145
- S. Tsuyama;
- S. Matsushita;
- S. Nonaka;
- S. Yonezawa;
- F. Murata
- Article
4
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 133, doi. 10.1093/jmicro/52.2.133
- S.K. Biswas;
- M. Yamaguchi;
- *;
- N. Naoe;
- T. Takashima;
- K. Takeo
- Article
5
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 125, doi. 10.1093/jmicro/52.2.125
- Article
6
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 119, doi. 10.1093/jmicro/52.2.119
- T. Akita;
- *;
- M. Okumura;
- K. Tanaka;
- S. Tsubota;
- M. Haruta
- Article
7
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 111, doi. 10.1093/jmicro/52.2.111
- D. Golberg*;
- M. Mitome;
- K. Kurashima;
- Y. Bando
- Article
8
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 101, doi. 10.1093/jmicro/52.2.101
- A. Yamada;
- *;
- O. Hirahara;
- T. Tsuchida;
- N. Sugano;
- M. Date
- Article
9
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 243, doi. 10.1093/jmicro/52.2.243
- Article
10
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 237, doi. 10.1093/jmicro/52.2.237
- T. Sugawara;
- M. Sato;
- T. Takagi;
- T. Kamasaki;
- N. Ohno;
- M. Osumi;
- *
- Article
11
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 227, doi. 10.1093/jmicro/52.2.227
- R. Igarashi;
- T. Sahara;
- M. Shimizu-Ishiura;
- T. Sasaki*
- Article
12
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 217, doi. 10.1093/jmicro/52.2.217
- K. Ogawa;
- *;
- H. Noguchi;
- M. Tsuji;
- F. Sasaki
- Article
13
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 197
- U-R. Heinrich1;
- *;
- M. Lioudyno;
- J. Maurer;
- W. Mann;
- P.S. Guth2;
- U. Förstermann
- Article
14
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 183, doi. 10.1093/jmicro/52.2.183
- H. Suzuki;
- *;
- H. Yamazaki;
- K. Tanoue
- Article
15
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 175, doi. 10.1093/jmicro/52.2.175
- Article
16
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 91
- R.M. Öksüzoglu1;
- *;
- T.E. Weirich;
- H. Fuess
- Article
17
- Journal of Electron Microscopy, 2003, v. 52, n. 2, p. 207, doi. 10.1093/jmicro/52.2.207
- M.S. Diarra;
- P. Lacasse;
- *;
- E. Deschênes1;
- G. Grondin;
- C. Paradis-Bleau;
- D. Petitclerc
- Article