Works matching DE "FINITE difference time domain method"
1
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 22, n. 10, p. 1, doi. 10.1002/pssa.202400978
- Xu, Xiangyu;
- Liu, Zhaoqiang;
- Zhang, Yonghui;
- Tian, Kangkai;
- Chu, Chunshuang;
- Wei, Xuecheng;
- Zhang, Zihui
- Article
2
- Journal of Mining Science, 2025, v. 61, n. 1, p. 57, doi. 10.1134/S1062739125010065
- Denisova, E. V.;
- Sokolov, K. O.;
- Khmelinin, A. P.;
- Voitenko, A. A.;
- Orlov, D. V.
- Article
3
- Optical & Quantum Electronics, 2025, v. 57, n. 6, p. 1, doi. 10.1007/s11082-025-08285-y
- Article
4
- Optical & Quantum Electronics, 2025, v. 57, n. 6, p. 1, doi. 10.1007/s11082-025-08285-y
- Article
5
- International Journal of Nanoscience, 2022, v. 21, n. 1, p. 1, doi. 10.1142/S0219581X22500077
- Sahu, Aditya K.;
- Raj, Satyabrata
- Article
6
- International Journal of Nanoscience, 2018, v. 17, n. 5, p. N.PAG, doi. 10.1142/S0219581X18500035
- Usha, V.;
- Vettumperumal, R.;
- Kalyanaraman, S.;
- Thangavel, R.
- Article
7
- Particle & Particle Systems Characterization, 2020, v. 37, n. 1, p. N.PAG, doi. 10.1002/ppsc.201900345
- Jiang, Tao;
- Goel, Pratibha;
- Zhao, Hui;
- Ma, Rui;
- Zhu, Linghua;
- Liu, Xiangjiang;
- Tang, Longhua
- Article
8
- Annalen der Physik, 2020, v. 532, n. 6, p. 1, doi. 10.1002/andp.201900574
- Article
9
- Advanced Functional Materials, 2014, v. 24, n. 19, p. 2794, doi. 10.1002/adfm.201303368
- Luo, Lin‐Bao;
- Chen, Jing‐Jing;
- Wang, Ming‐Zheng;
- Hu, Han;
- Wu, Chun‐Yan;
- Li, Qiang;
- Wang, Li;
- Huang, Jian‐An;
- Liang, Feng‐Xia
- Article
10
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 11, p. 936, doi. 10.1134/S1061830920110042
- Lei Gao;
- Luo, Yi;
- Song, Hantao;
- Kong, Gangqiang;
- Hu, Guohui
- Article
11
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 11, p. 791, doi. 10.1134/S1061830919110020
- Bazulin, E. G.;
- Konovalov, D. A.
- Article
12
- Russian Journal of Nondestructive Testing, 2018, v. 54, n. 7, p. 469, doi. 10.1134/S1061830918070021
- Bazulin, E. G.;
- Konovalov, D. A.;
- Sadykov, M. S.
- Article
13
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 9, p. 525, doi. 10.1134/S106183091509003X
- Article
14
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 4, p. 217, doi. 10.1134/S1061830915040026
- Article
15
- Noise & Vibration Worldwide, 2015, v. 46, n. 11, p. 30
- Article
16
- IET Control Theory & Applications (Wiley-Blackwell), 2018, v. 12, n. 8, p. 1086, doi. 10.1049/iet-cta.2017.0583
- Zhuoyue Song;
- Chao Duan;
- Housheng Su;
- Jinchang Hu
- Article
17
- IET Control Theory & Applications (Wiley-Blackwell), 2014, v. 8, n. 5, p. 311, doi. 10.1049/iet-cta.2013.0570
- Yunliang Wei;
- Wei Xing Zheng
- Article
18
- IUG Journal for Natural Studies, 2017, p. 345
- Article
19
- Journal of Test & Measurement Technology, 2023, v. 37, n. 2, p. 146, doi. 10.3969/j.issn.1671-7449.2023.02.009
- Article
20
- Electronics (2079-9292), 2024, v. 13, n. 23, p. 4814, doi. 10.3390/electronics13234814
- Chen, Meng;
- He, Xinbo;
- Wei, Bing
- Article
21
- Electronics (2079-9292), 2024, v. 13, n. 10, p. 1835, doi. 10.3390/electronics13101835
- Article
22
- Electronics (2079-9292), 2024, v. 13, n. 7, p. 1189, doi. 10.3390/electronics13071189
- Chen, Juan;
- Guo, Jiale;
- Mou, Chunhui;
- Xu, Zikun;
- Wang, Jianguo
- Article
23
- Electronics (2079-9292), 2023, v. 12, n. 12, p. 2655, doi. 10.3390/electronics12122655
- Chen, Zihao;
- Cai, Pinggen;
- Wen, Qiye;
- Chen, Hao;
- Tang, Yongjian;
- Yi, Zao;
- Wei, Kaihua;
- Li, Gongfa;
- Tang, Bin;
- Yi, Yougen
- Article
24
- Electronics (2079-9292), 2023, v. 12, n. 9, p. 2121, doi. 10.3390/electronics12092121
- Article
25
- Electronics (2079-9292), 2023, v. 12, n. 2, p. 291, doi. 10.3390/electronics12020291
- Kawecki, Jarosław;
- Januszkiewicz, Łukasz;
- Di Barba, Paolo;
- Kropidłowski, Karol
- Article
26
- Electronics (2079-9292), 2022, v. 11, n. 24, p. 4167, doi. 10.3390/electronics11244167
- Mou, Chunhui;
- Chen, Juan;
- Peng, Huaiyun
- Article
27
- Electronics (2079-9292), 2022, v. 11, n. 23, p. 3921, doi. 10.3390/electronics11233921
- Liu, Tao;
- Xu, Le;
- Li, Qiwei;
- Yao, Bin;
- Shi, Xiaowei
- Article
28
- Electronics (2079-9292), 2022, v. 11, n. 19, p. 3030, doi. 10.3390/electronics11193030
- Sun, Yuechang;
- Shi, Lang;
- Du, Peng;
- Zhao, Xiaoyu;
- Zhou, Shengjun
- Article
29
- Electronics (2079-9292), 2022, v. 11, n. 13, p. N.PAG, doi. 10.3390/electronics11131974
- Giovannetti, Giulio;
- Frijia, Francesca;
- Flori, Alessandra;
- Galante, Angelo;
- Rizza, Carlo;
- Alecci, Marcello
- Article
30
- Electronics (2079-9292), 2022, v. 11, n. 3, p. 307, doi. 10.3390/electronics11030307
- Guiana, Brian;
- Zadehgol, Ata
- Article
31
- Electronics (2079-9292), 2021, v. 10, n. 22, p. 2733, doi. 10.3390/electronics10222733
- Kim, Minhyuk;
- Park, SangWook
- Article
32
- Electronics (2079-9292), 2021, v. 10, n. 19, p. 2337, doi. 10.3390/electronics10192337
- Liu, Tao;
- Xu, Le;
- He, Yao;
- Wu, Han;
- Yang, Yong;
- Wu, Nankai;
- Yang, Xiaoning;
- Shi, Xiaowei;
- Wei, Feng
- Article
33
- Electronics (2079-9292), 2021, v. 10, n. 18, p. 2249, doi. 10.3390/electronics10182249
- Januszkiewicz, Łukasz;
- Barba, Paolo Di;
- Kawecki, Jarosław
- Article
34
- Electronics (2079-9292), 2021, v. 10, n. 4, p. 369, doi. 10.3390/electronics10040369
- Wu, Chen;
- Elangage, Janaka;
- Kobayashi, Hirokazu;
- Leone, Giovanni
- Article
35
- Electronics (2079-9292), 2020, v. 9, n. 10, p. 1569, doi. 10.3390/electronics9101569
- Choroszucho, Agnieszka;
- Butrylo, Boguslaw;
- Steckiewicz, Adam;
- Stankiewicz, Jacek Maciej
- Article
36
- Electronics (2079-9292), 2020, v. 9, n. 10, p. 1575, doi. 10.3390/electronics9101575
- Kang, Zhen;
- Huang, Ming;
- Li, Weilin;
- Wang, Yufeng;
- Yang, Fang
- Article
37
- Electronics (2079-9292), 2020, v. 9, n. 5, p. 829, doi. 10.3390/electronics9050829
- Lo Gerfo, Fabio Paolo;
- Livreri, Patrizia
- Article
38
- Electrotehnica, Electronica, Automatica, 2020, v. 68, n. 1, p. 28
- Azizi, Hakim;
- Chebout, Mohammed;
- Moulai, Hocine;
- Bréard, Arnaud;
- Vollaire, Christian
- Article
39
- Archives of Control Sciences, 2016, v. 26, n. 3, p. 429, doi. 10.1515/acsc-2016-0023
- Article
40
- Shock & Vibration, 2018, p. 1, doi. 10.1155/2018/1293273
- Li, Zhanfu;
- Tong, Xin;
- Zhou, Bi;
- Ge, Xiaole;
- Ling, Jingxiu
- Article
41
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-88878-5
- Bahrami-Chenaghlou, Faezeh;
- Habibzadeh-Sharif, Amir;
- Ahmadpour, Afshin
- Article
42
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep03427
- Wanlin Wang;
- Wang Zhang;
- Jiajun Gu;
- Qinglei Liu;
- Tao Deng;
- Di Zhang;
- Hai-Qing Lin
- Article
43
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep02928
- Adachi, Michael M.;
- Labelle, André J.;
- Thon, Susanna M.;
- Xinzheng Lan;
- Hoogland, Sjoerd;
- Sargent, Edward H.
- Article
44
- International Journal for Numerical Methods in Engineering, 2023, v. 124, n. 5, p. 1035, doi. 10.1002/nme.7144
- Mönkölä, Sanna;
- Räty, Joona
- Article
45
- International Journal of Applied Mechanics, 2020, v. 12, n. 10, p. N.PAG, doi. 10.1142/S1758825120501161
- Ghachi, Ratiba F.;
- Alnahhal, Wael I.;
- Abdeljaber, Osama;
- Renno, Jamil;
- Tahidul Haque, A. B. M.;
- Shim, Jongmin;
- Aref, Amjad
- Article
46
- Fiber & Integrated Optics, 2020, v. 39, n. 2, p. 70, doi. 10.1080/01468030.2020.1749733
- Song, Shijie;
- Chew, Suen Xin;
- Li, Liwei;
- Yi, Xiaoke;
- Nguyen, Linh;
- Minasian, Robert
- Article
47
- Fiber & Integrated Optics, 2012, v. 31, n. 3, p. 178, doi. 10.1080/01468030.2012.658959
- Olyaee, Saeed;
- Taghipour, Fahimeh
- Article
48
- International Journal of Microwave & Optical Technology, 2023, v. 18, n. 6, p. 575
- AIT BENALI, Lahcen;
- TRIBAK, Abdelwahed;
- TERHZAZ, Jaouad;
- Ibanez, Tomas Fernandez
- Article
49
- Remote Sensing, 2025, v. 17, n. 6, p. 1107, doi. 10.3390/rs17061107
- Mao, Lifeng;
- Wang, Xuben;
- Chi, Yuelong;
- Pang, Su;
- Wang, Xiangpeng;
- Huang, Qilin
- Article
50
- Remote Sensing, 2025, v. 17, n. 6, p. 1050, doi. 10.3390/rs17061050
- Takekura, Shunya;
- Miyamoto, Hideaki;
- Kobayashi, Makito
- Article