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- Title
Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes.
- Authors
Shiojiri, M; Saijo, H
- Abstract
The first part of this paper is devoted to physics, to explain high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and to interpret why HAADF-STEM imaging is incoherent, instructing a strict definition of interference and coherence of electron waves. Next, we present our recent investigations of InGaN/GaN multiple quantum wells and AlGaN/GaN strained-layer superlattice claddings in GaN-based violet laser diodes, which have been performed by HAADF-STEM and high-resolution field-emission gun scanning electron microscopy.
- Publication
Journal of microscopy, 2006, Vol 223, Issue Pt 3, p172
- ISSN
0022-2720
- Publication type
Journal Article
- DOI
10.1111/j.1365-2818.2006.01613.x