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- Title
Shear force control for a terahertz near field microscope.
- Authors
Buersgens, F; Acuna, G; Lang, C H; Potrebic, S I; Manus, S; Kersting, R
- Abstract
We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.
- Publication
The Review of scientific instruments, 2007, Vol 78, Issue 11, p113701
- ISSN
0034-6748
- Publication type
Journal Article
- DOI
10.1063/1.2804077