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- Title
Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8.
- Authors
Guo, F Z; Muro, T; Matsushita, T; Wakita, T; Ohashi, H; Senba, Y; Kinoshita, T; Kobayashi, K; Saitoh, Y; Koshikawa, T; Yasue, T; Oura, M; Takeuchi, T; Shin, S
- Abstract
Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14 x 14 microm(2) on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.
- Publication
The Review of scientific instruments, 2007, Vol 78, Issue 6, p066107
- ISSN
0034-6748
- Publication type
Journal Article
- DOI
10.1063/1.2748387