Works matching DE "RAMAN effect"
1
- Sensors (14248220), 2025, v. 25, n. 13, p. 4159, doi. 10.3390/s25134159
- Kiohara, Paulo;
- Souza, Romildo H.;
- Quintard, Véronique;
- Guegan, Mikael;
- Ghisa, Laura;
- Pérennou, André;
- Coutinho, Olympio L.
- Article
2
- Particle & Particle Systems Characterization, 2025, v. 42, n. 5, p. 1, doi. 10.1002/ppsc.202400211
- Zhu, Zhaoxi;
- Wang, Xiaolu;
- Li, Dan;
- Ou, Changgongyao;
- Liu, Ruochen;
- Lin, Taifeng;
- Guo, Fu
- Article
3
- Polimery, 2008, v. 53, n. 7/8, p. 571, doi. 10.14314/polimery.2008.571
- STOBIŃSKI, LESZEK;
- POLACZEK, ELŻBIETA;
- RĘBILAS, KRZYSZTOF;
- MAZURKIEWICZ, JÓZEF;
- WRZALIK, ROMAN;
- LIN, HONG-MING;
- TOMASIK, PIOTR
- Article
4
- Polimery, 2007, v. 52, n. 7/8, p. 571
- Wiśniewski, Marcin;
- Sionkowska, Alina;
- Kaczmarek, Halina;
- Lazare, Sylvain;
- Tokarev, Vladimir
- Article
5
- Journal of Energetic Materials, 2005, v. 23, n. 3, p. 169, doi. 10.1080/07370650591001844
- Wong, Chak-pan;
- Miller, PhilipJ.
- Article
6
- International Journal of Nanoscience, 2012, v. 11, n. 2, p. 1250022-1, doi. 10.1142/S0219581X12500226
- KHENE, SAMSON;
- NYOKONG, TEBELLO
- Article
7
- International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 105, doi. 10.1142/S0219581X11007570
- DUBEY, R. L.;
- DUBEY, S. K.;
- YADAV, A. D.;
- KANJILAL, D.
- Article
8
- International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 49, doi. 10.1142/S0219581X11007661
- SINGH, DILIP K.;
- IYER, PARAMESWAR K.;
- GIRI, P. K.
- Article
9
- International Journal of Nanoscience, 2010, v. 9, n. 6, p. 605, doi. 10.1142/S0219581X10007344
- Article
10
- International Journal of Nanoscience, 2010, v. 9, n. 4, p. 277, doi. 10.1142/S0219581X10006806
- GAO, P. Q.;
- ZHANG, Q.;
- YUAN, S. N.;
- PENG, N.;
- HE, D. Y.
- Article
11
- International Journal of Nanoscience, 2006, v. 5, n. 4/5, p. 585, doi. 10.1142/S0219581X06004838
- THANGADURAI, P.;
- RAMASAMY, S.;
- KESAVAMOORTHY, R.
- Article
12
- International Journal of Nanoscience, 2006, v. 5, n. 2/3, p. 351, doi. 10.1142/S0219581X06004462
- YOUNG SOO KANG;
- DONG RI ZHANG
- Article
13
- International Journal of Nanoscience, 2003, v. 2, n. 6, p. 479, doi. 10.1142/S0219581X03001589
- Kaibyshev, V.H.;
- Travnikov, V.V.
- Article
14
- International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 363, doi. 10.1142/S0219581X03001401
- Lin, C.H.;
- Chen, B.;
- Chia, C.T.;
- Cheng, H.H.
- Article
15
- International Journal of Nanoscience, 2003, v. 2, n. 1/2, p. 31, doi. 10.1142/S0219581X0300105X
- Ohmukai, Masato;
- Taniguchi, Masaki;
- Tsutsumi, Yasuo
- Article
16
- Annalen der Physik, 2022, v. 534, n. 5, p. 1, doi. 10.1002/andp.202100479
- Zhang, Xiang;
- Li, Haozhe;
- Wang, Zhiteng;
- Chen, Changshui;
- Zhang, Lifu
- Article
17
- Journal of Thermal Analysis & Calorimetry, 2004, v. 78, n. 1, p. 125, doi. 10.1023/B:JTAN.0000042160.82063.c4
- Madhurambal, G.;
- Mojumdar, S. C.;
- Hariharan, S.;
- Ramasamy, F.
- Article
18
- Journal of Thermal Analysis & Calorimetry, 2004, v. 76, n. 3, p. 719, doi. 10.1023/B:JTAN.0000032256.44386.54
- Mikuli, E.;
- Grad, B.;
- Zaremba, K.;
- Wróbel, S.
- Article
19
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 326, doi. 10.1007/s10854-009-9914-3
- Shenghuang Lin;
- Zhiming Chen;
- Bo Liu;
- Lianbi Li;
- Xianfeng Feng
- Article
20
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 410, doi. 10.1007/s10854-009-9934-z
- Article
21
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1095, doi. 10.1007/s10854-008-9833-8
- Mikla, V. I.;
- Mikla, V. V.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 609, doi. 10.1007/s10854-008-9773-3
- Cui, Fangming;
- Wang, Lei;
- Xi, Zhenqiang;
- Sun, Yun;
- Yang, Deren
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 170, doi. 10.1007/s10854-007-9499-7
- Fotsing-Djouwe, Isabelle Christiane;
- Gagné, Mathieu;
- Laurin, Jean-Jacques;
- Kashyap, Raman
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 425, doi. 10.1007/s10854-008-9661-x
- Ibáñez, J.;
- Alarcón-Lladó, E.;
- Cuscó, R.;
- Artús, L.;
- Fowler, D.;
- Patanè, A.;
- Uesugi, K.;
- Suemune, I.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 48, doi. 10.1007/s10854-007-9434-y
- Walters, W. David;
- Knights, Andy P.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 226, doi. 10.1007/s10854-007-9550-8
- Bulakh, B.;
- Korsunska, N.;
- Khomenkova, L.;
- Stara, T.;
- Venger, Ye.;
- Kryshtab, T.;
- Kryvko, A.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 294, doi. 10.1007/s10854-007-9514-z
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 51, doi. 10.1007/s10854-007-9557-1
- Irmer, G.;
- Brumme, T.;
- Herms, M.;
- Wernicke, T.;
- Kneissl, M.;
- Weyers, M.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 692, doi. 10.1007/s10854-007-9381-7
- Strelchuk, V. V.;
- Mazur, Yu. I.;
- Wang, Zh. M.;
- Schmidbauer, M.;
- Kolomys, O. F.;
- Valakh, M. Ya.;
- Manasreh, M. O.;
- Salamo, G. J.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 584, doi. 10.1007/s10854-007-9393-3
- Ardelean, Ioan;
- Cora, Simona
- Article
31
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 369, doi. 10.1007/s10854-007-9345-y
- Article
32
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 305, doi. 10.1007/s10854-007-9339-9
- O'Reilly, L.;
- Bennett, N. S.;
- McNally, P. J.;
- Sealy, B. J.;
- Cowern, N. E. B.;
- Lankinen, A.;
- Tuomi, T. O.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 367, doi. 10.1007/s10854-007-9238-0
- Maeda, K.;
- Sakai, T.;
- Sakai, K.;
- Ikari, T.;
- Munzar, M.;
- Tonchev, D.;
- Kasap, S. O.;
- Lucovsky, G.
- Article
34
- Cellulose, 2024, v. 31, n. 12, p. 7467, doi. 10.1007/s10570-024-06066-6
- Chen, Ruoyang;
- Qu, Yixiao;
- Ma, Zhengyuan;
- Wang, Jun;
- He, Hui
- Article
35
- Microscopy & Microanalysis, 2013, v. 19, n. 2, p. 327, doi. 10.1017/S1431927612014225
- Soares, Luís Eduardo Silva;
- Nahórny, Sídnei;
- Martin, Airton Abrahão
- Article
36
- 2012
- Schmidt, U.;
- Dieing, T.;
- Weishaupt, K.;
- Liu, W.;
- Yang, J.
- Abstract
37
- 2012
- Mochalin, V.;
- Gogotsi, Y.;
- Osswald, S.
- Abstract
38
- 2012
- Casuccio, G.;
- Bunker, K.;
- Kennedy, S.;
- Sparrow, M.;
- Pacolay, B.;
- Ioannidis, P.;
- Foulke, R.
- Abstract
40
- Measurement Techniques, 2020, v. 63, n. 6, p. 443, doi. 10.1007/s11018-020-01807-y
- Kolmogorov, O. V.;
- Prokhorov, D. V.;
- Donchenko, S. S.;
- Chemesova, E. V.
- Article
41
- Measurement Techniques, 2012, v. 55, n. 6, p. 731, doi. 10.1007/s11018-012-0029-5
- Maksimov, G.;
- Braze, N.;
- Yusipovich, A.;
- Parshina, E.;
- Rodnenkov, O.;
- Rubin, A.;
- Levin, G.;
- Bykov, V.
- Article
42
- Marine Biology, 2006, v. 149, n. 2, p. 241, doi. 10.1007/s00227-005-0219-7
- Wiegemann, Maja;
- Kowalik, Thomas;
- Hartwig, Andreas
- Article
43
- Drug Development & Industrial Pharmacy, 2010, v. 36, n. 2, p. 234, doi. 10.3109/03639040903225109
- Müller, Joshua;
- Knop, Klaus;
- Thies, Jochen;
- Uerpmann, Carsten;
- Kleinebudde, Peter
- Article
44
- Ferroelectrics, 2009, v. 390, n. 1, p. 3, doi. 10.1080/00150190902993309
- MIGNONI, S.;
- FONTANA, M. D.;
- BOURSON, P.;
- CIAMPOLILLO, M. V.;
- BAZZAN, M.;
- ARGIOLAS, N.;
- SADA, C.
- Article
45
- Ferroelectrics, 2009, v. 381, n. 1, p. 160, doi. 10.1080/00150190902873162
- FUKUNAGA, M.;
- TAKESADA, M.;
- ONODERA, A.
- Article
46
- Ferroelectrics, 2009, v. 379, n. 1, p. 43, doi. 10.1080/00150190902848065
- Malinovsky, V. K.;
- Pugachev, A. M.;
- Surovtsev, N. V.
- Article
47
- Ferroelectrics, 2009, v. 379, n. 1, p. 55, doi. 10.1080/00150190902848149
- Sakai, Akira;
- Hiroki, Takayuki;
- Abe, Hiroki
- Article
48
- Ferroelectrics, 2009, v. 378, n. 1, p. 84, doi. 10.1080/00150190902845160
- Iwata, Makoto;
- Hasegawa, Yusuke;
- Aoyagi, Rintaro;
- Maeda, Masaki;
- Wakiya, Naoki;
- Suzuki, Hisao;
- Ishibashi, Yoshihiro
- Article
49
- Ferroelectrics, 2008, v. 376, n. 1, p. 74, doi. 10.1080/00150190802440856
- Iwata, Makoto;
- Hasegawa, Yusuke;
- Aoyagi, Rintaro;
- Maeda, Masaki;
- Wakiya, Naoki;
- Suzuki, Hisao;
- Ishibashi, Yoshihiro
- Article
50
- Ferroelectrics, 2008, v. 373, n. 1, p. 26, doi. 10.1080/00150190802408598
- Fontana, M. D.;
- Hammoum, R.;
- Bourson, P.;
- Margueron, S.;
- Shur, V. Ya.
- Article