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- Title
Wafer-scale patterning of reduced graphene oxide electrodes by transfer-and-reverse stamping for high performance OFETs.
- Authors
Lee, Joong Suk; Kim, Nam Hee; Kang, Moon Sung; Yu, Hojeong; Lee, Dong Ryoul; Oh, Joon Hak; Chang, Suk Tai; Cho, Jeong Ho
- Abstract
A wafer-scale patterning method for solution-processed graphene electrodes, named the transfer-and-reverse stamping method, is universally applicable for fabricating source/drain electrodes of n- and p-type organic field-effect transistors with excellent performance. The patterning method begins with transferring a highly uniform reduced graphene oxide thin film, which is pre-prepared on a glass substrate, onto hydrophobic silanized (rigid/flexible) substrates. Patterns of the as-prepared reduced graphene oxide films are then formed by modulating the surface energy of the films and selectively delaminating the films using an oxygen-plasma-treated elastomeric stamp with patterns. Reduced graphene oxide patterns with various sizes and shapes can be readily formed onto an entire wafer. Also, they can serve as the source/drain electrodes for benchmark n- and p-type organic field-effect transistors with enhanced performance, compared to those using conventional metal electrodes. These results demonstrate the general utility of this technique. Furthermore, this simple, inexpensive, and scalable electrode-patterning-technique leads to assembling organic complementary circuits onto a flexible substrate successfully.
- Publication
Small (Weinheim an der Bergstrasse, Germany), 2013, Vol 9, Issue 16, p2817
- ISSN
1613-6829
- Publication type
Journal Article
- DOI
10.1002/smll.201300538