Works matching DE "TRANSISTORS"


Results: 4813
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    Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs.

    Published in:
    Electronics (2079-9292), 2025, v. 14, n. 11, p. 2288, doi. 10.3390/electronics14112288
    By:
    • Alberton, Saulo G.;
    • Aguiar, Vitor A. P.;
    • Added, Nemitala;
    • Vilas-Bôas, Alexis C.;
    • Guazzelli, Marcilei A.;
    • Wyss, Jeffery;
    • Silvestrin, Luca;
    • Mattiazzo, Serena;
    • Pereira, Matheus S.;
    • Finco, Saulo;
    • Paccagnella, Alessandro;
    • Medina, Nilberto H.
    Publication type:
    Article
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    IBM's vertical transistor.

    Published in:
    Solid State Technology, 2000, v. 43, n. 2, p. 18
    By:
    • Burggraaf, Pieter "Pete"
    Publication type:
    Article
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    SIA forecast dinner.

    Published in:
    Solid State Technology, 1998, v. 41, n. 2, p. 20
    By:
    • E.K.
    Publication type:
    Article
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    The big screen [chip testing].

    Published in:
    Electronics Systems & Software, 2006, v. 4, n. 4, p. 6, doi. 10.1049/ess:20060401
    By:
    • Edwards, C.
    Publication type:
    Article
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    News.

    Published in:
    Electronics Systems & Software, 2006, v. 4, n. 1, p. 4, doi. 10.1049/ess:20060109
    Publication type:
    Article
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    Silicon on the rack.

    Published in:
    Electronics Systems & Software, 2006, v. 4, n. 2, p. 40, doi. 10.1049/ess:20060207
    By:
    • Edwards, Chris
    Publication type:
    Article
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    The RACE to find what's next.

    Published in:
    Electronics Systems & Software, 2005, v. 3, n. 6, p. 42, doi. 10.1049/ess:20050607
    By:
    • Collins, Luke
    Publication type:
    Article
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    Taking corners at SPEED.

    Published in:
    Electronics Systems & Software, 2005, v. 3, n. 6, p. 26
    By:
    • Rubero, Jason;
    • Thurgood, Jonathan
    Publication type:
    Article
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