Works matching Rutherford Backscattering Spectroscopy
Results: 323
Determination of the Oxygen Concentration in GDP Thin Films Using Rutherford Backscattering Spectroscopy.
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- Fusion Science & Technology, 2021, v. 77, n. 6, p. 446, doi. 10.1080/15361055.2021.1927624
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Solid–liquid interface analysis with in‐situ Rutherford backscattering and electrochemical impedance spectroscopy.
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- Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 1111, doi. 10.1002/sia.6835
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Study of silicon implanted with zinc and oxygen ions via Rutherford backscattering spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2014, v. 8, n. 4, p. 794, doi. 10.1134/S1027451014040302
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Investigation of the long-range effect of light irradiation by means of Rutherford backscattering/ion channeling spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 2, p. 239, doi. 10.1134/S1027451009020128
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Rutherford backscattering spectroscopy and structural analysis of DC reactive magnetron sputtered titanium nitride thin films on glass substrates.
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- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 335, doi. 10.1007/s10854-015-3759-8
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X-Ray Photoelectron and Rutherford Backscattering Spectroscopy of Silicon Hyperdoped with Selenium.
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- Journal of Applied Spectroscopy, 2024, v. 91, n. 3, p. 586, doi. 10.1007/s10812-024-01758-0
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Investigation of HfO2 Thin Films on Si by X-ray Photoelectron Spectroscopy, Rutherford Backscattering, Grazing Incidence X-ray Diffraction and Variable Angle Spectroscopic Ellipsometry.
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- Crystals (2073-4352), 2018, v. 8, n. 6, p. 248, doi. 10.3390/cryst8060248
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A Comparison of Rutherford Backscattering Spectroscopy and X-Ray Diffraction to Determine the Composition of Thick InGaN Epilayers.
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- Physica Status Solidi (B), 2001, v. 228, n. 1, p. 41, doi. 10.1002/1521-3951(200111)228:1<41::AID-PSSB41>3.0.CO;2-N
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Barrier-type anodic films on aluminium in aqueous borate solutions: 2-Film compositions by Rutherford backscattering spectroscopy and nuclear reaction methods.
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- Surface & Interface Analysis: SIA, 1983, v. 5, n. 6, p. 252, doi. 10.1002/sia.740050606
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Investigation of the interaction of Greek dolomitic marble with metal aqueous solutions using rutherford backscattering and X-ray photoelectron spectroscopy.
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- Journal of Radioanalytical & Nuclear Chemistry, 2007, v. 272, n. 2, p. 339, doi. 10.1007/s10967-007-0526-1
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- Article
Rutherford Backscattering Spectroscopy Study of the Kinetics of Oxidation of (Mg, Fe)<sub>2</sub>SiO<sub>4</sub>.
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- Journal of the American Ceramic Society, 1988, v. 71, n. 7, p. 540, doi. 10.1111/j.1151-2916.1988.tb05917.x
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- Article
Kinetics of the Growth of Spinel on Alumina Using Rutherford Backscattering Spectroscopy.
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- Journal of the American Ceramic Society, 1987, v. 70, n. 7, p. C-149, doi. 10.1111/j.1151-2916.1987.tb05691.x
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Accuracy of energy dispersive x-ray composition analysis of YBCO films on yttrium-containing substrates as compared to Rutherford backscattering spectroscopy.
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- Journal of Materials Science, 2000, v. 35, n. 2, p. 443, doi. 10.1023/A:1004723519096
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- Article
Chemical Analysis with High Spatial Resolution by Rutherford Backscattering and Raman Confocal Spectroscopies: Surface Hierarchically Structured Glasses.
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- Journal of the American Ceramic Society, 2013, v. 96, n. 6, p. 1783, doi. 10.1111/jace.12397
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Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon.
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- Semiconductors, 2019, v. 53, n. 8, p. 1011, doi. 10.1134/S1063782619080062
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Surface and interface roughness estimations by X-ray reflectivity and RBS measurements.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1208, doi. 10.1002/sia.5644
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- Article
Fe-Mg diffusion in spinel: New experimental data and a point defect model.
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- American Mineralogist, 2015, v. 100, n. 10, p. 2112, doi. 10.2138/am-2015-5109
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- Article
Bipolar Switching Behavior of ZnO Thin Films Deposited by Metalorganic Chemical Vapor Deposition at Various Growth Temperatures.
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- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4175, doi. 10.1007/s11664-015-3935-x
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Solid State Reaction and Operational Stability of Ruthenium Schottky Contact-on-6H-SiC Under Argon Annealing.
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- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3265, doi. 10.1007/s11664-015-3873-7
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Ag-ZnO Nanocomposite Thin Film by RF-Sputtering: An Electrical and Structural Study.
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- Macromolecular Symposia, 2017, v. 376, n. 1, p. n/a, doi. 10.1002/masy.201600197
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Determination of the density of silicon-nitride thin films by ion-beam analytical techniques (RBS, PIXE, STIM).
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- Journal of Radioanalytical & Nuclear Chemistry, 2016, v. 307, n. 1, p. 341, doi. 10.1007/s10967-015-4102-9
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Nuclear physics experiments with a medical cyclotron.
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- International Journal of Modern Physics: Conference Series, 2020, v. 50, p. N.PAG, doi. 10.1142/S2010194520600058
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Study of Memristors Based on Silicon-Oxide Films Implanted with Zinc.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2022, v. 16, n. 3, p. 402, doi. 10.1134/S1027451022030314
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Ion-beam-induced Modifications of Nanocrystalline ZnO thin Films Grown by Atomic Layer Deposition.
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- Indian Journal of Engineering & Materials Sciences, 2023, v. 30, n. 3, p. 437, doi. 10.56042/ijems.v30i3.3792
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Effect of Zr and W Doping on Microstructures, Transition Temperature and Solar Transmittance Modulation of Thermochromic W/Zr Co-Doped VO<sub>2</sub> Thin Films.
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- Tanzania Journal of Engineering & Technology, 2024, v. 43, n. 1, p. 144, doi. 10.52339/tjet.v43i1.986
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Medium energy, heavy and inert ion irradiation of metallic thin films: studies of surface nano-structuring and metal burrowing.
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- Surface & Interface Analysis: SIA, 2016, v. 48, n. 9, p. 969, doi. 10.1002/sia.5999
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Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe Tomography.
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- Microscopy & Microanalysis, 2024, v. 30, n. 1, p. 49, doi. 10.1093/micmic/ozad144
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Energy-dependent surface nanopatterning of Si (100) for different projectiles: a tunable anisotropic wettability of ripple surface.
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- Applied Nanoscience, 2023, v. 13, n. 5, p. 3189, doi. 10.1007/s13204-021-01975-5
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A mechanism for water splitting and hydrogen absorbing functions of metal-oxide layered hydrogen storage materials studied by means of ion beam analysis.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 3, p. 113, doi. 10.1002/sia.5359
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Nanoelectromechanical device fabrications by 3-D nanotechnology using focused-ion beams.
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- Science & Technology of Advanced Materials, 2009, v. 10, n. 3, p. 1, doi. 10.1088/1468-6996/10/3/034501
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Carbon-backed thin tin (<sup>116</sup>Sn) isotope target fabrication by physical vapor deposition technique.
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- Journal of Radioanalytical & Nuclear Chemistry, 2020, v. 326, n. 1, p. 97, doi. 10.1007/s10967-020-07316-0
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Synthesis of SnO<sub>2</sub>/CuO/SnO<sub>2</sub> Multi-layered Structure for Photoabsorption: Compositional and Some Interfacial Structural Studies.
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- Journal of Nigerian Society of Physical Sciences, 2021, p. 74, doi. 10.46481/jnsps.2021.160
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Study of a SiO<sub>2</sub>/Si Structure Implanted with <sup>64</sup>Zn<sup>+</sup> and <sup>16</sup>O<sup>+</sup> Ions and Heat Treated in a Neutral Inert Environment.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 3, p. 382, doi. 10.1134/S1027451019030169
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Microanálisis de capas pictóricas en esculturas policromadas.
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- Nucleus, 2008, n. 44, p. 34
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Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 3, p. 252, doi. 10.15407/spqeo11.03.252
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- Article
NUMERICAL SIMULATION OF PROTON BACKSCATTERING SPECTRA IN GEANT4 TOOLKIT.
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- Lithuanian Journal of Physics, 2024, v. 64, n. 1, p. 48, doi. 10.3952/physics.2024.64.1.5
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- Article
The Influence of Ion Implantation on the Optical Parameters - Refraction and Extinction Coefficients of the Oxygen-Enriched Layers Covering GaAs Implanted with Indium Ions.
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- Acta Physica Polonica: A, 2009, v. 116, p. S.129, doi. 10.12693/APhysPolA.116.S-129
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Co‐implantation of Er and Yb ions into single‐crystalline and nano‐crystalline diamond.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1218, doi. 10.1002/sia.6407
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- Article
Time-evolution of Electrophoretically Deposited CdSe Nanocrystal Films.
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- Journal of the Tennessee Academy of Science, 2014, v. 89, n. 1, p. 36
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Interaction of Ce(dbp)<sub>3</sub> with surface of aluminium alloy 2024-T3 using macroscopic models of intermetallic phases.
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- Corrosion Engineering, Science & Technology, 2009, v. 44, n. 6, p. 416, doi. 10.1179/147842208X320333
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Preferential Location of Dopants in the Amorphous Phase of Oriented Regioregular Poly(3‐hexylthiophene‐2,5‐diyl) Films Helps Reach Charge Conductivities of 3000 S cm<sup>−1</sup>.
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- Advanced Functional Materials, 2022, v. 32, n. 30, p. 1, doi. 10.1002/adfm.202202075
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Full Control of Polarization in Ferroelectric Thin Films Using Growth Temperature to Modulate Defects.
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- Advanced Electronic Materials, 2020, v. 6, n. 12, p. 1, doi. 10.1002/aelm.202000852
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The Structure and Properties of a Hard Alloy Coating Deposited by High-Velocity Pulsed Plasma Jet onto a Copper Substrate.
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- Technical Physics Letters, 2001, v. 27, n. 9, p. 749, doi. 10.1134/1.1405248
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Atomic layer deposition of the titanium dioxide thin film from tetraethoxytitanium and water.
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- Russian Journal of General Chemistry, 2010, v. 80, n. 6, p. 1091, doi. 10.1134/S1070363210060095
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Effect of ion velocity on SHI-induced mixing in Ti/Bi system.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2016, v. 171, n. 3/4, p. 290, doi. 10.1080/10420150.2016.1179309
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Investigation of energetic ion-induced mixing in Bi/Ge system.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2014, v. 169, n. 10, p. 855, doi. 10.1080/10420150.2014.958748
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Profiling measurements of metal ion distribution in thin polymer inclusion membranes by Rutherford backscattering spectrometry.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2014, v. 169, n. 5, p. 388, doi. 10.1080/10420150.2013.865621
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Investigation of ion beam mixing threshold value in Mn/Si system using swift heavy ions.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 7/8, p. 607, doi. 10.1080/10420150.2013.798322
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On the mechanism of damage buildup in gallium nitride.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 6, p. 431, doi. 10.1080/10420150.2013.777445
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The effect of TiN nanoparticles deposition with different number of shots on SS316L by plasma focus device.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 3, p. 188, doi. 10.1080/10420150.2013.767251
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