Works matching IS 10010505 AND DT 2021 AND VI 51 AND IP 6


Results: 25
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    UIS reliability mechanism of cascode GaN HEMT.

    Published in:
    Journal of Southeast University / Dongnan Daxue Xuebao, 2021, v. 51, n. 6, p. 1103, doi. 10.3969/j.issn.1001-0505.2021.06.024
    By:
    • Qian Le;
    • Li Sheng;
    • Zhang Chi;
    • Liu Siyang;
    • Sun Weifeng
    Publication type:
    Article
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