Works matching DE "CAPACITANCE measurement"
1
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 6412, doi. 10.1007/s11664-024-11309-0
- Saghrouni, Hayet;
- Beji, Lotfi
- Article
2
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 5820, doi. 10.1007/s11664-024-11137-2
- Bel, Steven;
- Lobre, Clément;
- Petit, Sarah;
- Veillerot, Marc;
- Badano, Giacomo
- Article
3
- Journal of Electronic Materials, 2024, v. 53, n. 9, p. 5606, doi. 10.1007/s11664-024-11213-7
- Bengi, S.;
- Çetinkaya, H. G.;
- Altındal, Ş.;
- Zeyrek, S.
- Article
4
- Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2798, doi. 10.1007/s11664-024-10966-5
- Spencer, Joseph A.;
- Jacobs, Alan G.;
- Hobart, Karl D.;
- Koehler, Andrew D.;
- Anderson, Travis J.;
- Zhang, Yuhao;
- Tadjer, Marko J.
- Article
5
- Chemistry - A European Journal, 2021, v. 27, n. 68, p. 17145, doi. 10.1002/chem.202102829
- Füngerlings, Achim;
- Koul, Adarsh;
- Dreyer, Maik;
- Rabe, Anna;
- Morales, Dulce M.;
- Schuhmann, Wolfgang;
- Behrens, Malte;
- Pentcheva, Rossitza
- Article
6
- Angewandte Chemie, 2014, v. 126, n. 47, p. 13003, doi. 10.1002/ange.201407836
- Gao, Shan;
- Sun, Yongfu;
- Lei, Fengcai;
- Liang, Liang;
- Liu, Jiawei;
- Bi, Wentuan;
- Pan, Bicai;
- Xie, Yi
- Article
7
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15371, doi. 10.1007/s10854-019-01913-w
- Gullu, H. H.;
- Bayraklı Sürücü, Ö.;
- Terlemezoglu, M.;
- Yildiz, D. E.;
- Parlak, M.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 12, p. 11164, doi. 10.1007/s10854-019-01459-x
- Pozos, Heberto Gómez;
- Maldonado, Arturo;
- Izpura, J. I.;
- Muñoz, Elías
- Article
9
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 10992, doi. 10.1007/s10854-017-6881-y
- Ban, C.;
- Zhu, S.;
- Hou, J.;
- Wang, F.;
- Wang, J.;
- Jia, Z.;
- Zhao, J.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1315, doi. 10.1007/s10854-016-5662-3
- Baraz, Nalan;
- Yücedağ, İbrahim;
- Azizian-Kalandaragh, Yashar;
- Altındal, Şemsettin
- Article
11
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12527, doi. 10.1007/s10854-016-5783-8
- Article
12
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 747, doi. 10.1007/s10854-014-2459-0
- Jiang, Lili;
- Lu, Xiong;
- Xu, Jielong;
- Chen, Yingqi;
- Wan, Guojiang;
- Ding, Yonghui
- Article
13
- Journal of Solid State Electrochemistry, 2020, v. 24, n. 11/12, p. 2953, doi. 10.1007/s10008-020-04704-0
- Zaffora, Andrea;
- Di Franco, Francesco;
- Di Quarto, Francesco;
- Santamaria, Monica
- Article
14
- Journal of Solid State Electrochemistry, 2020, v. 24, n. 2, p. 329, doi. 10.1007/s10008-019-04470-8
- Boumaza, S.;
- Brahimi, R.;
- Boudjellal, L.;
- Belhadi, A.;
- Trari, M.
- Article
15
- Journal of Solid State Electrochemistry, 2017, v. 21, n. 4, p. 939, doi. 10.1007/s10008-016-3443-9
- Ranganatha, S.;
- Munichandraiah, N.
- Article
16
- Journal of Solid State Electrochemistry, 2014, v. 18, n. 12, p. 3339, doi. 10.1007/s10008-014-2627-4
- Snook, Graeme;
- McGregor, Katherine;
- Urban, Andrew
- Article
17
- Journal of Solid State Electrochemistry, 2013, v. 17, n. 5, p. 1455, doi. 10.1007/s10008-013-2017-3
- Ertaş, F.;
- Kaş, Recep;
- Ünal, Uğur;
- Birer, Özgür
- Article
18
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 2, p. 86, doi. 10.1134/S1061830915020047
- Goldshtein, A.;
- Vavilova, G.;
- Belyankov, V.
- Article
19
- Measurement Techniques, 2023, v. 66, n. 9, p. 690, doi. 10.1007/s11018-024-02282-5
- Grishin, M. V.;
- Leonov, A. V;
- Kucobin, A. A.
- Article
20
- Measurement Techniques, 2023, v. 66, n. 7, p. 508, doi. 10.1007/s11018-023-02252-3
- Pecherskaya, E. A.;
- Karpanin, O. V.;
- Tuzova, D. E.;
- Nelyutskov, M. A.;
- Antipenko, V. V.
- Article
21
- Measurement Techniques, 2018, v. 60, n. 10, p. 998, doi. 10.1007/s11018-018-1307-7
- Balakin, S. V.;
- Serbinov, D. L.
- Article
22
- Measurement Techniques, 2015, v. 58, n. 9, p. 975, doi. 10.1007/s11018-015-0828-6
- Article
23
- Measurement Techniques, 2015, v. 58, n. 7, p. 811, doi. 10.1007/s11018-015-0799-7
- Article
24
- Measurement Techniques, 2014, v. 57, n. 2, p. 213, doi. 10.1007/s11018-014-0433-0
- Article
25
- Measurement Techniques, 2013, v. 56, n. 9, p. 1054, doi. 10.1007/s11018-013-0329-4
- Surdu, M.;
- Lameko, A.;
- Semenycheva, L.;
- Abrosimov, E.;
- Mamonov, A.
- Article
26
- Bioengineering (Basel), 2022, v. 9, n. 4, p. 128, doi. 10.3390/bioengineering9040128
- Rittershaus, Emily S. C.;
- Rehmann, Matthew S.;
- Xu, Jianlin;
- He, Qin;
- Hill, Charles;
- Swanberg, Jeffrey;
- Borys, Michael C.;
- Li, Zheng-Jian;
- Khetan, Anurag
- Article
27
- International Journal of Energy Research, 2020, v. 44, n. 13, p. 10695, doi. 10.1002/er.5713
- Mostafa, Nasser Y.;
- Qhtani, Mohsen M.;
- Alotaibi, Saad H.;
- Zaki, Zaki I.;
- Alharthi, Sarah;
- Cieslik, Mateusz;
- Gornicka, Karolina;
- Ryl, Jacek;
- Boukherroub, Rabah;
- Amin, Mohammed A.
- Article
28
- International Journal of Energy Research, 2020, v. 44, n. 4, p. 2833, doi. 10.1002/er.5099
- Kim, Hoyoung;
- Park, Hyanjoo;
- Oh, Seonhwa;
- Kim, Soo‐Kil
- Article
29
- Mugla Journal of Science & Technology, 2024, v. 10, n. 2, p. 13, doi. 10.22531/muglajsci.1517897
- Article
30
- Advanced Electronic Materials, 2021, v. 7, n. 4, p. 1, doi. 10.1002/aelm.202001173
- Nissa, Josefin;
- Janson, Per;
- Berggren, Magnus;
- Simon, Daniel T.
- Article
31
- Advanced Electronic Materials, 2020, v. 6, n. 2, p. N.PAG, doi. 10.1002/aelm.201901005
- Wang, Zhongyang;
- Li, Hongyu;
- Hu, Huiying;
- Fan, Yuqi;
- Fan, Runhua;
- Li, Baowen;
- Zhang, Jiaoxia;
- Liu, Hu;
- Fan, Jincheng;
- Hou, Hua;
- Dang, Feng;
- Kou, Zongkui;
- Guo, Zhanhu
- Article
32
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700317
- Park, Hong‐ki;
- Choi, Jaewu
- Article
33
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600322
- Hou, Linrui;
- Bao, Ruiqi;
- Rehan, Muhammad;
- Tong, Liuniu;
- Pang, Gang;
- Zhang, Xiaogang;
- Yuan, Changzhou
- Article
34
- Plants (2223-7747), 2020, v. 9, n. 1, p. 1, doi. 10.3390/plants9010035
- Erel, Ran;
- Le, Thuc T.;
- Eshel, Amram;
- Cohen, Shabtai;
- Offenbach, Rivka;
- Strijker, Tobias;
- Shtein, Ilana
- Article
35
- 2012
- Kwak, Seung-Yeon;
- Kim, Na Ree;
- Bae, Byeong-Soo
- Other
36
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1318, doi. 10.1002/j.2168-0159.2012.tb06045.x
- Arai, Takahiro;
- Nakaya, Yuta;
- Fukai, Yuki;
- Igarashi, Takuya;
- Sano, Yuji
- Article
37
- Carpathian Journal of Food Science & Technology, 2019, v. 11, n. 3, p. 86, doi. 10.34302/crpjfst/2019.11.3.8
- Islam, Shahidul;
- Hasan, Mehrub;
- Khan, Ainul Anam Shahjamal;
- Bakar, Muhammad Abu
- Article
38
- Physica Status Solidi - Rapid Research Letters, 2019, v. 13, n. 11, p. N.PAG, doi. 10.1002/pssr.201900381
- Rodriguez, Alvaro;
- Verhagen, Tim;
- Kalbac, Martin;
- Vejpravova, Jana;
- Frank, Otakar
- Article
39
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 12, p. 1011, doi. 10.1002/pssr.201409435
- Oganisian, KarEN;
- Strek, Wieslaw
- Article
40
- Acta Technica Corviniensis - Bulletin of Engineering, 2015, v. 8, n. 1, p. 27
- JANURA, Richard;
- JURČÍK, Jozef;
- GUTTEN, Miroslav;
- KORENČIAK, Daniel
- Article
41
- International Agrophysics, 2020, v. 34, n. 2, p. 173, doi. 10.31545/intagr/117622
- Středa, Tomáš;
- Haberle, Jan;
- Klimešová, Jana;
- Klimek-Kopyra, Agnieszka;
- Středová, Hana;
- Bodner, Gernot;
- Chloupek, Oldřich
- Article
42
- Advances in Condensed Matter Physics, 2012, p. 1, doi. 10.1155/2012/176053
- Rodrigues, A. D.;
- Chiquito, A. J.;
- Zanelatto, G.;
- Milekhin, A. G.;
- Nikiforov, A. I.;
- Ulyanov, V. V.;
- Pchelyakov, O. P.;
- Zahn, D. R. T.;
- Galzerani, J. C.
- Article
43
- Modern Physics Letters B, 2017, v. 31, n. 32, p. -1, doi. 10.1142/S021798491750302X
- Yin, Liang;
- Qin, Yao;
- Liu, Xiao-Wei
- Article
44
- Journal of Superconductivity & Novel Magnetism, 2018, v. 31, n. 3, p. 715, doi. 10.1007/s10948-017-4318-8
- Galaktionov, Artem V.;
- Golubev, Dmitry S.;
- Zaikin, Andrei D.
- Article
45
- Resonance: Journal of Science Education, 2014, v. 19, n. 4, p. 376, doi. 10.1007/s12045-014-0042-x
- Raghavendra, M.;
- Venkataraman, V.
- Article
46
- Chemistry - A European Journal, 2018, v. 24, n. 29, p. 7312, doi. 10.1002/chem.201705555
- Han, Yi;
- Lai, Zhengzhe;
- Wang, Zifan;
- Yu, Minghao;
- Tong, Yexiang;
- Lu, Xihong
- Article
47
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 769, doi. 10.1007/s10836-017-5694-5
- Yi, Tengyue;
- Liu, Yi;
- Yang, Yintang
- Article
48
- Journal of Electronic Testing, 2016, v. 32, n. 3, p. 393, doi. 10.1007/s10836-016-5584-2
- Zhu, Dongdi;
- Mo, Jiongjiong;
- Xu, Shiyi;
- Shang, Yongheng;
- Wang, Zhiyu;
- Huang, Zhengliang;
- Yu, Faxin
- Article
49
- Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2019, v. 114, p. 144, doi. 10.1016/j.fbp.2018.12.002
- Botella, Carolina;
- Hernandez, Jesus Ernesto;
- Webb, Colin
- Article
50
- Instrumentation Science & Technology, 2015, v. 43, n. 6, p. 633, doi. 10.1080/10739149.2015.1038561
- Kovács, Noémi;
- Ujvári, Mária;
- Láng, Győző G.;
- Broekmann, Peter;
- Vesztergom, Soma
- Article