Works matching DE "OPTICAL interferometers"
1
- Journal of High Energy Physics, 2025, v. 2025, n. 4, p. 1, doi. 10.1007/JHEP04(2025)164
- D'Agnolo, Raffaele Tito;
- Ellis, Sebastian A. R.
- Article
2
- Materials (1996-1944), 2025, v. 18, n. 9, p. 2060, doi. 10.3390/ma18092060
- Reizer, Rafal;
- Dzierwa, Andrzej;
- Żelasko, Wieslaw;
- Pawlus, Zuzanna
- Article
3
- Surface Engineering, 2023, v. 39, n. 3, p. 361, doi. 10.1080/02670844.2023.2223452
- Li, Zongtang;
- Qi, Zhichao;
- Zhang, Tianyi;
- Wang, Zhankui;
- Su, Jianxiu
- Article
4
- Surface Engineering, 2021, v. 37, n. 8, p. 982, doi. 10.1080/02670844.2020.1848008
- Han, Bin;
- Lin, Jiayi;
- Han, Xiaoran;
- Wang, Hui;
- Cui, Weihua
- Article
5
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1288, doi. 10.1007/s10854-016-5657-0
- Özen, Soner;
- Korkmaz, Şadan;
- Şenay, Volkan;
- Pat, Suat
- Article
6
- Astrophysics & Space Science, 2003, v. 286, n. 1/2, p. vii, doi. 10.1023/A:1026120806351
- Garcia, Paulo J.V.;
- Glindemann, Andreas;
- Henning, Thomas;
- Malbet, Fabien
- Article
7
- International Journal of Advanced Manufacturing Technology, 2024, v. 131, n. 5/6, p. 2311, doi. 10.1007/s00170-023-11494-y
- Xue, Mingpu;
- Xiao, Wen;
- Zhang, Tianyi;
- Wang, Zhankui;
- Su, Jianxiu
- Article
8
- International Journal of Advanced Manufacturing Technology, 2022, v. 120, n. 11/12, p. 7985, doi. 10.1007/s00170-022-09305-x
- Lian, Guofu;
- Liu, Zhaozhen;
- Zhang, Yang;
- Que, Linzhi;
- Chen, Changrong;
- Yue, Kun
- Article
9
- International Journal of Advanced Manufacturing Technology, 2021, v. 117, n. 3/4, p. 845, doi. 10.1007/s00170-021-07780-2
- Wang, Rongxuan;
- Law, Andrew C.;
- Garcia, David;
- Yang, Shuo;
- Kong, Zhenyu
- Article
10
- International Journal of Advanced Manufacturing Technology, 2021, v. 115, n. 9/10, p. 3251, doi. 10.1007/s00170-021-07403-w
- Xing, Tianji;
- Zhao, Xuesen;
- Cui, Zhipeng;
- Tan, Rongkai;
- Sun, Tao
- Article
11
- International Journal of Advanced Manufacturing Technology, 2020, v. 111, n. 9/10, p. 2637, doi. 10.1007/s00170-020-06267-w
- Liu, Zhanbin;
- Li, Jianyong;
- Nie, Meng;
- Liu, Yueming
- Article
12
- International Journal of Advanced Manufacturing Technology, 2020, v. 106, n. 7/8, p. 2703, doi. 10.1007/s00170-019-04870-0
- Zhai, Weidong;
- Li, Yanle;
- Cheng, Zinan;
- Sun, Lingling;
- Li, Fangyi;
- Li, Jianfeng
- Article
13
- International Journal of Advanced Manufacturing Technology, 2019, v. 103, n. 1-4, p. 585, doi. 10.1007/s00170-019-03600-w
- Lyu, B. H.;
- He, Q. K.;
- Chen, S. H.;
- Shao, Q.;
- Chen, Y.;
- Geng, Z. Y.
- Article
14
- Journal of Prosthodontics (John Wiley & Sons, Inc.), 2021, v. 30, n. 8, p. 711, doi. 10.1111/jopr.13303
- Dederichs, Marco;
- Fahmy, Mina D.;
- An, Hongseok;
- Guentsch, Arndt;
- Viebranz, Stephanie;
- Kuepper, Harald
- Article
15
- Journal of Prosthodontics (John Wiley & Sons, Inc.), 2019, v. 28, n. 1, p. e89, doi. 10.1111/jopr.12763
- Zoidis, Panagiotis;
- Polychronakis, Nikolaos;
- Polyzois, Gregory;
- Lagouvardos, Panagiotis;
- Ngo, Hien Chi
- Article
16
- Astronomy & Astrophysics / Astronomie et Astrophysique, 2023, v. 672, p. 1, doi. 10.1051/0004-6361/202245364
- Lanthermann, C.;
- Le Bouquin, J.-B.;
- Sana, H.;
- Mérand, A.;
- Monnier, J. D.;
- Perraut, K.;
- Frost, A. J.;
- Mahy, L.;
- Gosset, E.;
- De Becker, M.;
- Kraus, S.;
- Anugu, N.;
- Davies, C. L.;
- Ennis, J.;
- Gardner, T.;
- Labdon, A.;
- Setterholm, B.;
- ten Brummelaar, T.;
- Schaefer, G. H.
- Article
17
- Electroplating & Finishing, 2022, v. 41, n. 15, p. 1095, doi. 10.19289/j.1004-227x.2022.15.009
- ZHAN Zhongwei;
- LIU Jia;
- LI Haiyang;
- SUN Zhihua
- Article
18
- Strain, 2007, v. 43, n. 4, p. 289, doi. 10.1111/j.1475-1305.2007.00355.x
- Article
19
- Integrated Ferroelectrics, 2020, v. 208, n. 1, p. 55, doi. 10.1080/10584587.2020.1728715
- Liu, Lili;
- Ren, Yanqin;
- Wang, Min;
- Zou, Meng
- Article
20
- Photonics, 2025, v. 12, n. 3, p. 206, doi. 10.3390/photonics12030206
- Naeem, Muddasir;
- Imran, Tayyab
- Article
21
- Photonics, 2024, v. 11, n. 9, p. 782, doi. 10.3390/photonics11090782
- Jing, Qingli;
- Wang, Jiajian;
- Lei, Jianglong;
- Wang, Qi;
- Chen, Jialing;
- Liu, Jun;
- Zhao, Minglin;
- Dou, Jiantai;
- Wang, Yuanxiang;
- Hu, Youyou
- Article
22
- Photonics, 2024, v. 11, n. 8, p. 712, doi. 10.3390/photonics11080712
- Chesnokova, Maria;
- Nurmukhametov, Danil;
- Ponomarev, Roman;
- Agliullin, Timur;
- Kuznetsov, Artem;
- Sakhabutdinov, Airat;
- Morozov, Oleg;
- Makarov, Roman
- Article
23
- Photonics, 2024, v. 11, n. 5, p. 453, doi. 10.3390/photonics11050453
- Huang, Yi-Kai;
- Chen, Cheng-Huan
- Article
24
- Photonics, 2023, v. 10, n. 12, p. 1342, doi. 10.3390/photonics10121342
- Ma, Heli;
- Liu, Cangli;
- Chen, Long;
- Tang, Longhuang;
- Tao, Tianjiong;
- Wu, Jian;
- Liu, Shenggang;
- Jia, Xing;
- Li, Chengjun;
- Wang, Xiang;
- Weng, Jidong
- Article
25
- Photonics, 2023, v. 10, n. 7, p. 771, doi. 10.3390/photonics10070771
- Belousov, Dmitrij A.;
- Kuts, Roman I.;
- Okotrub, Konstantin A.;
- Korolkov, Victor P.
- Article
26
- Photonics, 2023, v. 10, n. 7, p. 749, doi. 10.3390/photonics10070749
- Yu, Juan;
- Wu, Yinhua;
- Nie, Liang;
- Zuo, Xiaojie
- Article
27
- Photonics, 2023, v. 10, n. 7, p. 739, doi. 10.3390/photonics10070739
- Fan, Zhiyuan;
- Zuo, Xuan;
- Qian, Hang;
- Li, Jie
- Article
28
- Photonics, 2023, v. 10, n. 3, p. 284, doi. 10.3390/photonics10030284
- Cao, Rongtao;
- Wu, Jingyu;
- Yang, Yang;
- Wang, Mohan;
- Li, Yuqi;
- Chen, Kevin P.
- Article
29
- Photonics, 2021, v. 8, n. 8, p. 291, doi. 10.3390/photonics8080291
- Zhou, Likun;
- Liu, Pan;
- Jin, Guang-Ri
- Article
30
- Photonics, 2021, v. 8, n. 7, p. 245, doi. 10.3390/photonics8070245
- Norgia, Michele;
- Pesatori, Alessandro
- Article
31
- Galaxies (2075-4434), 2025, v. 13, n. 2, p. 18, doi. 10.3390/galaxies13020018
- Cifaldi, Maria;
- Taranto, Claudia;
- Aiello, Lorenzo;
- Lumaca, Diana
- Article
32
- Galaxies (2075-4434), 2021, v. 9, n. 1, p. 9, doi. 10.3390/galaxies9010009
- Iwaguchi, Shoki;
- Ishikawa, Tomohiro;
- Ando, Masaki;
- Michimura, Yuta;
- Komori, Kentaro;
- Nagano, Koji;
- Akutsu, Tomotada;
- Musha, Mitsuru;
- Yamada, Rika;
- Watanabe, Izumi;
- Naito, Takeo;
- Morimoto, Taigen;
- Kawamura, Seiji
- Article
33
- ISPRS Annals of Photogrammetry, Remote Sensing & Spatial Information Sciences, 2023, v. 10, n. M/1, p. 79, doi. 10.5194/isprs-annals-X-M-1-2023-79-2023
- Eskandari, R.;
- Scaioni, M.
- Article
34
- Optical Engineering, 2017, v. 56, n. 1, p. 1, doi. 10.1117/1.OE.56.1.017101
- Kyohei Okubo;
- Ken Uchiyamada;
- Kiyoshi Asakawa;
- Hiroaki Suzuki
- Article
35
- Optical Engineering, 2016, v. 55, n. 9, p. 090508-1, doi. 10.1117/1.OE.55.9.090508
- Xiaoling Tan;
- Youfu Geng;
- Xuejin Li
- Article
36
- Optical Engineering, 2016, v. 55, n. 4, p. 043107-1, doi. 10.1117/1.OE.55.4.043107
- Clark III, James H.;
- Penado, F. Ernesto
- Article
37
- Optical Engineering, 2016, v. 55, n. 2, p. 1, doi. 10.1117/1.OE.55.2.024101
- Joenathan, Charles;
- Bernal, Ashley;
- Youn Woonghee;
- Bunch, Robert M.;
- Hakoda, Christopher
- Article
38
- Optical Engineering, 2016, v. 55, n. 1, p. 1, doi. 10.1117/1.OE.55.1.014103
- Montonen, Risto;
- Kassamakov, Ivan;
- Hæggström, Edward;
- Österberg, Kenneth
- Article
39
- Optical Engineering, 2015, v. 54, n. 4, p. 1, doi. 10.1117/1.OE.54.4.044105
- Chunhui Xu;
- Yingyan Yi;
- Zhuo Shu;
- Min Li
- Article
40
- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-55671-9
- Crosta, Mariateresa;
- Lattanzi, Mario Gilberto;
- Le Poncin-Lafitte, Christophe;
- Gai, Mario;
- Zhaoxiang, Qi;
- Vecchiato, Alberto
- Article
41
- Scientific Reports, 2024, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-51134-9
- Bang, Nguyen Huy;
- Van Doai, Le
- Article
42
- China Foundry, 2018, v. 15, n. 1, p. 23, doi. 10.1007/s41230-018-7066-x
- Ya-meng Wei;
- Ke-hui Hu;
- Zhi-gang Lu
- Article
43
- European Physical Journal C -- Particles & Fields, 2013, v. 73, n. 10, p. 1, doi. 10.1140/epjc/s10052-013-2590-8
- Vetrano, Flavio;
- Viceré, Andrea
- Article
44
- Nature Communications, 2023, v. 14, n. 1, p. 1, doi. 10.1038/s41467-023-38413-9
- Somhorst, F. H. B.;
- van der Meer, R.;
- Correa Anguita, M.;
- Schadow, R.;
- Snijders, H. J.;
- de Goede, M.;
- Kassenberg, B.;
- Venderbosch, P.;
- Taballione, C.;
- Epping, J. P.;
- van den Vlekkert, H. H.;
- Timmerhuis, J.;
- Bulmer, J. F. F.;
- Lugani, J.;
- Walmsley, I. A.;
- Pinkse, P. W. H.;
- Eisert, J.;
- Walk, N.;
- Renema, J. J.
- Article
45
- Management & Production Engineering Review (MPER), 2014, v. 5, n. 2, p. 27, doi. 10.2478/mper-2014-0014
- Niemczewska-Wójcik, Magdalena;
- Mathia, Thomas;
- Wójcik, Artur
- Article
46
- International Journal of Optics, 2012, p. 1, doi. 10.1155/2012/689612
- Singh, Brijesh Kumar;
- Singh, G.;
- Senthilkumaran, P.;
- Mehta, D. S.
- Article
47
- International Journal of Optics, 2012, p. 1, doi. 10.1155/2012/408067
- Langangen, Ø.;
- Vaskinn, A.;
- Skagerstam, B.-S.
- Article
48
- International Journal of Optics, 2012, p. 1, doi. 10.1155/2012/130517
- Masi, Marco;
- Mancinelli, Mattia;
- Bettotti, Paolo;
- Pavesi, Lorenzo
- Article
49
- Insight: Non-Destructive Testing & Condition Monitoring, 2010, v. 52, n. 3, p. 130, doi. 10.1784/insi.2010.52.3.130
- Blouin, A.;
- Néron, C.;
- Campagne, B.;
- Monchalin, J.-P.
- Article
50
- Insight: Non-Destructive Testing & Condition Monitoring, 2009, v. 51, n. 5, p. 240, doi. 10.1784/insi.2009.51.5.240
- Article