Works matching Ion beams
Results: 5000
Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition.
- Published in:
- Advanced Materials Interfaces, 2022, v. 9, n. 28, p. 1, doi. 10.1002/admi.202200696
- By:
- Publication type:
- Article
Application the Ion Beam Sputtering Deposition Technique for the Development of Spin-Wave Structures on Ferroelectric Substrates.
- Published in:
- Ceramics (2571-6131), 2023, v. 6, n. 3, p. 1415, doi. 10.3390/ceramics6030087
- By:
- Publication type:
- Article
3-D SRIM Simulation of Focused Ion Beam Sputtering with an Application-Oriented Incident Beam Model.
- Published in:
- Applied Sciences (2076-3417), 2019, v. 9, n. 23, p. 5133, doi. 10.3390/app9235133
- By:
- Publication type:
- Article
Achievement of Long-Focus Ion Beams on the High Voltage Test Bench for Heavy Ion Beam Probe Diagnostics on the T-15MD Tokamak.
- Published in:
- Physics of Atomic Nuclei, 2024, v. 87, n. 9, p. 1373, doi. 10.1134/S1063778824090436
- By:
- Publication type:
- Article
Photonic crystals in lithium niobate by combining focussed ion beam writing and ion-beam enhanced etching.
- Published in:
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 10, p. 2421, doi. 10.1002/pssa.201431328
- By:
- Publication type:
- Article
Modification of Keggin anion structure with ion beams—A new spectroscopic insights into the effects of keV‐ and MeV‐ion beam irradiation on 12‐tungstophosphoric acid.
- Published in:
- Journal of Raman Spectroscopy, 2022, v. 53, n. 11, p. 1974, doi. 10.1002/jrs.6423
- By:
- Publication type:
- Article
Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022).
- Published in:
- Advanced Materials Interfaces, 2022, v. 9, n. 28, p. 1, doi. 10.1002/admi.202270155
- By:
- Publication type:
- Article
Combined figuring technology for high-precision optical surfaces using a deterministic ion beam material adding and removal method.
- Published in:
- Optical Engineering, 2013, v. 52, n. 1, p. 010503-1, doi. 10.1117/1.OE.52.1.010503
- By:
- Publication type:
- Article
Corrective capability analysis and machining error control in ion beam figuring of high-precision optical mirrors.
- Published in:
- Optical Engineering, 2012, v. 51, n. 3, p. 033402-1, doi. 10.1117/1.OE.51.3.033402
- By:
- Publication type:
- Article
Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam.
- Published in:
- Nanoscale Research Letters, 2010, v. 5, n. 7, p. 1182, doi. 10.1007/s11671-010-9623-0
- By:
- Publication type:
- Article
Evolution of Rutherford's ion beam science to applied research activities at GNS Science.
- Published in:
- Journal of the Royal Society of New Zealand, 2021, v. 51, n. 3/4, p. 574, doi. 10.1080/03036758.2021.1897021
- By:
- Publication type:
- Article
Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions.
- Published in:
- Micromachines, 2019, v. 10, n. 12, p. 799, doi. 10.3390/mi10120799
- By:
- Publication type:
- Article
Direct‐Writing of 2D Diodes by Focused Ion Beams (Adv. Funct. Mater. 34/2021).
- Published in:
- Advanced Functional Materials, 2021, v. 31, n. 34, p. 1, doi. 10.1002/adfm.202170248
- By:
- Publication type:
- Article
Direct‐Writing of 2D Diodes by Focused Ion Beams.
- Published in:
- Advanced Functional Materials, 2021, v. 31, n. 34, p. 1, doi. 10.1002/adfm.202102708
- By:
- Publication type:
- Article
A Comparative Study of Gallium-, Xenon-, and Helium-Focused Ion Beams for the Milling of GaN.
- Published in:
- Nanomaterials (2079-4991), 2023, v. 13, n. 21, p. 2898, doi. 10.3390/nano13212898
- By:
- Publication type:
- Article
Detection of ZrO<sub>2</sub> Nanoparticles in Lung Tissue Sections by Time-of-Flight Secondary Ion Mass Spectrometry and Ion Beam Microscopy.
- Published in:
- Nanomaterials (2079-4991), 2018, v. 8, n. 1, p. 44, doi. 10.3390/nano8010044
- By:
- Publication type:
- Article
Nanoporous Structure Formation on the Surface of InSb by Ion Beam Irradiation.
- Published in:
- Nanomaterials (2079-4991), 2017, v. 7, n. 8, p. 204, doi. 10.3390/nano7080204
- By:
- Publication type:
- Article
Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB).
- Published in:
- Microchimica Acta, 2004, v. 145, n. 1-4, p. 187, doi. 10.1007/s00604-003-0151-9
- By:
- Publication type:
- Article
Effect of Focused Ion Beam Irradiation on Superconducting Nanowires.
- Published in:
- Journal of Superconductivity & Novel Magnetism, 2022, v. 35, n. 3, p. 657, doi. 10.1007/s10948-021-06098-0
- By:
- Publication type:
- Article
On the Effect of Etching with a Focused Ga<sup>+</sup> Ion Beam in the Energy Range 12–30 keV on the Luminescent Properties of the Al<sub>0.18</sub>Ga<sub>0.82</sub>As/GaAs/Al<sub>0.18</sub>Ga<sub>0.82</sub>As Heterostructure.
- Published in:
- Semiconductors, 2023, v. 57, n. 6, p. 316, doi. 10.1134/S1063782623080171
- By:
- Publication type:
- Article
Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate.
- Published in:
- Semiconductors, 2023, v. 57, n. 1, p. 58, doi. 10.1134/S1063782623010086
- By:
- Publication type:
- Article
Simulation of Silicon Carbide Sputtering by a Focused Gallium Ion Beam.
- Published in:
- Semiconductors, 2022, v. 56, n. 13, p. 487, doi. 10.1134/S1063782622130085
- By:
- Publication type:
- Article
Effect of Annealing on Luminescence of InGaN/GaN Structures Etched by a Focused Ion Beam.
- Published in:
- Semiconductors, 2019, v. 53, n. 16, p. 2121, doi. 10.1134/S106378261912025X
- By:
- Publication type:
- Article
Formation of High-Power Pulsed Titanium Ion Beams of Submillisecond Duration from Vacuum Arc Plasma.
- Published in:
- Russian Physics Journal, 2023, v. 65, n. 11, p. 1940, doi. 10.1007/s11182-023-02854-y
- By:
- Publication type:
- Article
Local Structural Modifications in Metallic Micropillars Induced by Plasma Focused Ion Beam Processing.
- Published in:
- Materials (1996-1944), 2023, v. 16, n. 22, p. 7220, doi. 10.3390/ma16227220
- By:
- Publication type:
- Article
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi 2 Se 3 Thin Films.
- Published in:
- Materials (1996-1944), 2023, v. 16, n. 6, p. 2244, doi. 10.3390/ma16062244
- By:
- Publication type:
- Article
Comparative Sample Preparation Using Focused Ion Beam and Ultramicrotomy of Human Dental Enamel and Dentine for Multimicroscopic Imaging at Micro- and Nanoscale.
- Published in:
- Materials (1996-1944), 2022, v. 15, n. 9, p. 3084, doi. 10.3390/ma15093084
- By:
- Publication type:
- Article
Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM.
- Published in:
- Materials (1996-1944), 2021, v. 14, n. 11, p. 3034, doi. 10.3390/ma14113034
- By:
- Publication type:
- Article
Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis.
- Published in:
- Bulletin of the Korean Chemical Society, 2019, v. 40, n. 9, p. 877, doi. 10.1002/bkcs.11840
- By:
- Publication type:
- Article
Direct Insights on Flax Fiber Structure by Focused Ion Beam Microscopy.
- Published in:
- Microscopy & Microanalysis, 2010, v. 16, n. 2, p. 175, doi. 10.1017/S1431927609991292
- By:
- Publication type:
- Article
Transport of a Low-Energy Ion Beam with Ballistic Focusing.
- Published in:
- Plasma Physics Reports, 2021, v. 47, n. 8, p. 840, doi. 10.1134/S1063780X21080079
- By:
- Publication type:
- Article
Space Charge Lenses for Intensive Ion Beams Formation.
- Published in:
- Acta Physica Polonica: A, 2019, v. 135, n. 4, p. 841, doi. 10.12693/APhysPolA.135.841
- By:
- Publication type:
- Article
Limiting Damage to 2D Materials during Focused Ion Beam Processing.
- Published in:
- Physica Status Solidi (B), 2020, v. 257, n. 12, p. 1, doi. 10.1002/pssb.202000318
- By:
- Publication type:
- Article
Mutant induction in gametophytes of Undaria pinnatifida (Phaeophyceae) by heavy ion beam irradiation.
- Published in:
- Phycological Research, 2020, v. 68, n. 1, p. 63, doi. 10.1111/pre.12397
- By:
- Publication type:
- Article
The change of the domain wall shape under the ion beam irradiation in lithium niobate.
- Published in:
- Journal of Advanced Dielectrics, 2025, v. 15, n. 2, p. 1, doi. 10.1142/S2010135X24500152
- By:
- Publication type:
- Article
Controllable Fabrication of Gallium Ion Beam on Quartz Nanogrooves.
- Published in:
- Micromachines, 2024, v. 15, n. 9, p. 1105, doi. 10.3390/mi15091105
- By:
- Publication type:
- Article
Atomic Depth Image Transfer of Large-Area Optical Quartz Materials Based on Pulsed Ion Beam.
- Published in:
- Micromachines, 2024, v. 15, n. 7, p. 914, doi. 10.3390/mi15070914
- By:
- Publication type:
- Article
Influence of the Secondary Ion Beam Source on the Laser Damage Mechanism and Stress Evolution of IBS Hafnia Layers.
- Published in:
- Applied Sciences (2076-3417), 2021, v. 11, n. 1, p. 189, doi. 10.3390/app11010189
- By:
- Publication type:
- Article
Physiological and Differential Proteomic Analysis at Seedling Stage by Induction of Heavy-Ion Beam Radiation in Wheat Seeds.
- Published in:
- Frontiers in Genetics, 2022, v. 13, p. 1, doi. 10.3389/fgene.2022.942806
- By:
- Publication type:
- Article
Designing a Solenoid for a Light Ion Beam Focusing.
- Published in:
- Physics of Atomic Nuclei, 2022, v. 85, n. 9, p. 1551, doi. 10.1134/S1063778822090174
- By:
- Publication type:
- Article
In Situ Study of Nanostructure and Electrical Resistance of Nanocluster Films Irradiated with Ion Beams.
- Published in:
- Advanced Functional Materials, 2014, v. 24, n. 39, p. 6210, doi. 10.1002/adfm.201400553
- By:
- Publication type:
- Article
Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.
- Published in:
- Microscopy & Microanalysis, 2023, v. 29, n. 5, p. 1628, doi. 10.1093/micmic/ozad078
- By:
- Publication type:
- Article
Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells.
- Published in:
- Progress in Photovoltaics, 2012, v. 20, n. 7, p. 892, doi. 10.1002/pip.1164
- By:
- Publication type:
- Article
In Situ Fabrication, Manipulation, and Mechanical Characterization of Free‐Standing Silica Thin Films Using Focused Ion Beam Scanning Electron Microscopy.
- Published in:
- Advanced Materials Interfaces, 2022, v. 9, n. 11, p. 1, doi. 10.1002/admi.202102201
- By:
- Publication type:
- Article
Ion Beam Defect Engineering on ReS<sub>2</sub>/Si Photocathode with Significantly Enhanced Hydrogen Evolution Reaction.
- Published in:
- Advanced Materials Interfaces, 2019, v. 6, n. 3, p. N.PAG, doi. 10.1002/admi.201801663
- By:
- Publication type:
- Article
Fabrication of Bevel Structures by Means of the Spatial Gradient of Ion Dose in Ar Gas Cluster Ion Beam and Its Unique Characteristics.
- Published in:
- Advanced Materials Interfaces, 2018, v. 5, n. 23, p. N.PAG, doi. 10.1002/admi.201800825
- By:
- Publication type:
- Article
Focused ion beam (FIB) prepared microtextured microneedle array capable of delivering drugs through punctured skin.
- Published in:
- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-83094-z
- By:
- Publication type:
- Article
Features of Electronic Emission from Surface of Dielectric Thin-film Materials with Ion-beam Etching.
- Published in:
- Journal of Nano- & Electronic Physics, 2014, v. 6, n. 3, p. 03031-1
- By:
- Publication type:
- Article
Nanostructures on Sapphire Surfaces Induced by Metal Impurity Assisted Ion Beam.
- Published in:
- Coatings (2079-6412), 2020, v. 10, n. 10, p. 949, doi. 10.3390/coatings10100949
- By:
- Publication type:
- Article
Friction andWear Behavior of an Ag-Mo Co-Implanted GH4169 Alloy via Ion-Beam-Assisted Bombardment.
- Published in:
- Coatings (2079-6412), 2017, v. 7, n. 11, p. 191, doi. 10.3390/coatings7110191
- By:
- Publication type:
- Article