Works matching Rutherford backscattering spectrometry
Results: 563
Profiling measurements of metal ion distribution in thin polymer inclusion membranes by Rutherford backscattering spectrometry.
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- Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2014, v. 169, n. 5, p. 388, doi. 10.1080/10420150.2013.865621
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- Article
Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry.
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- Technical Physics Letters, 2019, v. 45, n. 6, p. 609, doi. 10.1134/S1063785019060191
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- Article
Microstructure and Rutherford Backscattering Spectrometry of Hard/Lubricant Mo-Ti-Al-N Multilayered Coatings Prepared by Multi-Arc Ion Plating at Low Substrate Rotation.
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- Coatings (2079-6412), 2020, v. 10, n. 2, p. 101, doi. 10.3390/coatings10020101
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- Article
Interpretation of electron Rutherford backscattering spectrometry for hydrogen quantification.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 10/11, p. 812, doi. 10.1002/sia.5486
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- Article
Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in GaS single crystals irradiated with 140-keV H ions.
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- Semiconductors, 2015, v. 49, n. 5, p. 586, doi. 10.1134/S1063782615050073
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- Article
Corrosion behaviour of oxide film formed on carbon steel in high temperature alkaline water in the presence of zinc and magnesium ions.
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- Corrosion Engineering, Science & Technology, 2023, v. 58, n. 5, p. 492, doi. 10.1080/1478422X.2023.2212456
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- Article
Ti diffusion in feldspar.
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- American Mineralogist, 2020, v. 105, n. 7, p. 1040, doi. 10.2138/am-2020-7272
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- Article
Ion Beam Mixing of Sb/Glass Studied by Rutherford Backscattering Spectrometry.
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- Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), 2012, v. 37, n. 1, p. 201, doi. 10.1007/s13369-011-0166-1
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- Article
The Influence of AlN Intermediate Layer on the Structural and Chemical Properties of SiC Thin Films Produced by High-Power Impulse Magnetron Sputtering.
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- Micromachines, 2019, v. 10, n. 3, p. 202, doi. 10.3390/mi10030202
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- Article
Rutherford Backscattering Spectrometry Analysis of Self-Formed Ti-Rich Interface Layer Growth in Cu(Ti)/Low- k Samples.
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- Journal of Electronic Materials, 2009, v. 38, n. 9, p. 1913, doi. 10.1007/s11664-009-0843-y
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- Article
EFFECT OF DEPOSITION PARAMETERS ON THE COMPOSITIONAL AND OPTICAL PROPERTIES OF Cu<sub>2</sub>SnS<sub>3</sub> THIN FILMS PREPARED BY CHEMICAL BATH DEPOSITION.
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- Chalcogenide Letters, 2019, v. 16, n. 12, p. 577
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- Article
Diffusion Behavior of Iodine in the Micro/Nano-Porous Graphite for Nuclear Reactor at High Temperature.
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- C, 2023, v. 9, n. 3, p. 81, doi. 10.3390/c9030081
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- Article
Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2024, v. 18, n. 6, p. 1374, doi. 10.1134/S1027451024701271
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- Article
Depth Profiling of Layered Si−O−Al Thin Films with Secondary Ion Mass Spectrometry and Rutherford Backscattering Spectrometry.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 2, p. 300, doi. 10.1134/S102745101902023X
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- Article
Determining the chronological sequence of inks deposited with different writing and printing tools using ion beam analysis.
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- Journal of Forensic Sciences, 2021, v. 66, n. 4, p. 1401, doi. 10.1111/1556-4029.14705
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- Article
Experimental study and thermal spike modeling of sputtering in SiO<sub>2</sub> thin films under MeV Au<sup>q+</sup> heavy ion irradiation.
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- Surface & Interface Analysis: SIA, 2021, v. 53, n. 9, p. 737, doi. 10.1002/sia.6973
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- Article
Au and Pt Diffusion in Electrodeposited Amorphous Sb<sub>2</sub>Te<sub>3</sub> Thin Films.
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- Physica Status Solidi (B), 2021, v. 258, n. 9, p. 1, doi. 10.1002/pssb.202000428
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- Article
Optical Response of Epitaxial ZnO Films Grown by Atomic Layer Deposition and Coimplanted with Dy and Yb.
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- Physica Status Solidi (B), 2020, v. 257, n. 8, p. 1, doi. 10.1002/pssb.201900513
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- Article
Crystal Lattice Damage and Recovery of Rare-Earth Implanted Wide Bandgap Oxides.
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- Advances in Science & Technology Research Journal, 2022, v. 16, n. 5, p. 147, doi. 10.12913/22998624/153942
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- Article
Elemental Analysis of Coffee with Ion Beam Analytical Techniques.
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- Foods, 2025, v. 14, n. 4, p. 585, doi. 10.3390/foods14040585
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- Article
Enhanced Luminescence of Yb 3+ Ions Implanted to ZnO through the Selection of Optimal Implantation and Annealing Conditions.
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- Materials (1996-1944), 2023, v. 16, n. 5, p. 1756, doi. 10.3390/ma16051756
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- Article
Flux-dependent Epitaxial Recrystallization of Amorphized Si(111) Layers Due to Oblique Argon Ion Sputtering.
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- Integrated Ferroelectrics, 2020, v. 205, n. 1, p. 146, doi. 10.1080/10584587.2019.1675010
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- Article
Anisotropy of radiation-induced defects in Yb-implanted β-Ga<sub>2</sub>O<sub>3</sub>.
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- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-75187-6
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- Article
Damage accumulation and structural modification in a‐ and c‐plane GaN implanted with 400‐keV and 5‐MeV Au<sup>+</sup> ions.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1099, doi. 10.1002/sia.6403
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- Article
Enhanced Antibacterial Properties of Titanium Surfaces through Diversified Ion Plating with Silver Atom Deposition.
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- Journal of Functional Biomaterials, 2024, v. 15, n. 6, p. 164, doi. 10.3390/jfb15060164
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- Article
Near-infrared waveguide formation and RBS/channeling spectrometry analysis for damage in calcium barium niobate crystals via ion implantation.
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- Applied Physics B: Lasers & Optics, 2015, v. 121, n. 2, p. 135, doi. 10.1007/s00340-015-6210-1
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- Article
Al and Si diffusion in rutile.
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- American Mineralogist, 2019, v. 104, n. 11, p. 1638, doi. 10.2138/am-2019-7030
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- Article
A Combined Ion Implantation/Nanosecond Laser Irradiation Approach towards Si Nanostructures Doping.
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- Journal of Nanotechnology, 2012, p. 1, doi. 10.1155/2012/635705
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- Article
Hydrogen Charging Effects in Pd/Ti/TiO<sub>2</sub>/Ti Thin Films Deposited on Si(111) Studied by Ion Beam AnalysisMethods.
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- Advances in Materials Science & Engineering, 2012, p. 1, doi. 10.1155/2012/269603
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- Article
Compositional and Structural Modifications by Ion Beam in Graphene Oxide for Radiation Detection Studies.
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- International Journal of Molecular Sciences, 2022, v. 23, n. 20, p. 12563, doi. 10.3390/ijms232012563
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- Article
Ionization-induced annealing in silicon upon dual-beam irradiation.
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- Journal of Materials Science, 2020, v. 55, n. 14, p. 5938, doi. 10.1007/s10853-020-04399-8
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- Article
Structural and composition analysis of Apex™ and Foturan™ photodefinable glasses.
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- Journal of Materials Science, 2013, v. 48, n. 15, p. 5316, doi. 10.1007/s10853-013-7326-5
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- Article
Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe Tomography.
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- Microscopy & Microanalysis, 2024, v. 30, n. 1, p. 49, doi. 10.1093/micmic/ozad144
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- Article
ANGULAR DISTRIBUTION OF TUNGSTEN MATERIAL AND ION FLUX DURING NANOSECOND PULSED LASER DEPOSITION.
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- Surface Review & Letters, 2016, v. 23, n. 3, p. -1, doi. 10.1142/S0218625X16500049
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- Article
The Effect of the Degree of Fluorination on the MOCVD Growth of Cobalt Oxide Thin Films using Co(II) Acetylacetonate Complexes.
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- European Journal of Inorganic Chemistry, 2021, v. 2021, n. 41, p. 4298, doi. 10.1002/ejic.202100662
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- Article
Atmospheric aerosol analysis at the PIXE–RBS beamline in the University of Jordan Van de Graaff accelerator (JUVAC).
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- XRS: X-ray Spectrometry, 2019, v. 48, n. 3, p. 188, doi. 10.1002/xrs.3014
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- Article
An upgraded external beam PIXE setup for multielemental analysis of atmospheric aerosol samples.
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- XRS: X-ray Spectrometry, 2018, v. 47, n. 1, p. 79, doi. 10.1002/xrs.2814
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- Article
Ion implantation of the 4H SiC epitaxial layers and substrates with 2 MeV Se<sup>+</sup> and 1 MeV Al<sup>+</sup> ions.
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- XRS: X-ray Spectrometry, 2015, v. 44, n. 5, p. 371, doi. 10.1002/xrs.2642
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- Article
Patterning of COC Polymers by Middle‐Energy Ion Beams for Selective Cell Adhesion in Microfluidic Devices.
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- Advanced Materials Interfaces, 2024, v. 11, n. 18, p. 1, doi. 10.1002/admi.202301077
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- Article
Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films: Investigation of Structure and Pseudocapacitive Properties.
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- Advanced Materials Interfaces, 2021, v. 8, n. 20, p. 1, doi. 10.1002/admi.202100949
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- Article
In Situ Direct Lithium Distribution Analysis Around Interfaces in an All‐Solid‐State Rechargeable Lithium Battery by Combined Ion‐Beam Method.
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- Advanced Materials Interfaces, 2019, v. 6, n. 14, p. N.PAG, doi. 10.1002/admi.201900100
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- Article
External Beam IBA Measurements for Cultural Heritage.
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- Applied Sciences (2076-3417), 2023, v. 13, n. 5, p. 3366, doi. 10.3390/app13053366
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- Article
Single-Layered Biosynthesized Copper Oxide (CuO) Nanocoatings as Solar-Selective Absorber.
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- Applied Sciences (2076-3417), 2023, v. 13, n. 3, p. 1867, doi. 10.3390/app13031867
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- Article
RBS Channeling MATLAB Application for Automated Measurement Control and Evaluation for 6MV Tandetron Accelerator.
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- Applied Sciences (2076-3417), 2021, v. 11, n. 9, p. 3817, doi. 10.3390/app11093817
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- Article
High-energy 120 MeV Au<sup>9+</sup> ion beam-induced modifications and evaluation of craters in surface morphology of SnO<sub>2</sub> and TiO<sub>2</sub> nanocomposite thin films.
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- Applied Nanoscience, 2019, v. 9, n. 6, p. 1265, doi. 10.1007/s13204-019-01084-4
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- Article
Raman Spectroscopy of V 4 O 7 Films.
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- Coatings (2079-6412), 2022, v. 12, n. 3, p. 291, doi. 10.3390/coatings12030291
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- Article
Pulsed Laser Deposition and Laser-Induced Backward Transfer to Modify Polydimethylsiloxane.
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- Coatings (2079-6412), 2021, v. 11, n. 12, p. 1521, doi. 10.3390/coatings11121521
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- Article
Deuterium Retention and Release Behavior from Beryllium Co-Deposited Layers at Distinct Ar/D Ratio.
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- Coatings (2079-6412), 2021, v. 11, n. 12, p. 1443, doi. 10.3390/coatings11121443
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- Article
The Effect of the Deposition Method on the Structural and Optical Properties of ZnS Thin Films.
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- Coatings (2079-6412), 2021, v. 11, n. 9, p. 1064, doi. 10.3390/coatings11091064
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- Article
Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry.
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- Coatings (2079-6412), 2020, v. 10, n. 5, p. 480, doi. 10.3390/coatings10050480
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- Article