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Title

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts.

Authors

Aguiar, Vitor A. P.; Alberton, Saulo G.; Pereira, Matheus S.

Abstract

Radiation effects on electronic devices represent a major concern in applications for harsh environments, such as aerospace and nuclear facilities. This article presents a review of fundamental aspects of radiation effects on semiconductors, with a primary focus on Single-Event Effects. It discusses charge collection models, destructive effects, applications in detectors, and impacts on digital devices, drawing from recent research findings.

Subjects

DIGITAL electronics; POWER electronics; SEMICONDUCTOR devices; DIGITAL technology; ELECTRONIC equipment

Publication

Chips, 2025, Vol 4, Issue 1, p12

ISSN

2674-0729

Publication type

Academic Journal

DOI

10.3390/chips4010012

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