FAILURE ANALYSIS TURNS ANOTHER CHAPTER, AGAIN.
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- Electronic Device Failure Analysis, 2023, v. 25, n. 4, p. 2
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- Article
Works matching AU Cole, Jr., Edward I.
Results: 4
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2
A TRIBUTE TO LARRY WAGNER.
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- Electronic Device Failure Analysis, 2019, v. 21, n. 1, p. 2
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- Article
3
Understanding the Effects of Local Structures on TIVA Profiles Using Thermal Modeling and Simulation.
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- Electronic Device Failure Analysis, 2010, v. 12, n. 3, p. 10, doi. 10.31399/asm.edfa.2010-3.p010
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- Article
4
What's Been Happening with the IVAs?
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- Electronic Device Failure Analysis, 2010, v. 12, n. 3, p. 4, doi. 10.31399/asm.edfa.2010-3.p004
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- Publication type:
- Article