Works matching DE "P-N junctions (Semiconductors)"
1
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 8217, doi. 10.1007/s10854-015-3484-3
- Zhao, Xiaodong;
- Ji, Huiming;
- Jia, Qianqian;
- Wang, Mingjing
- Article
2
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2384, doi. 10.1007/s10854-015-2695-y
- Mohan Kumar, G.;
- Madhan Kumar, A.;
- Ilanchezhiyan, P.;
- Kang, T.
- Article
3
- Measurement Techniques, 2017, v. 60, n. 1, p. 46, doi. 10.1007/s11018-017-1157-8
- Smirnov, V.;
- Sergeev, V.;
- Gavrikov, A.
- Article
4
- NPJ 2D Materials & Applications, 2025, v. 9, n. 1, p. 1, doi. 10.1038/s41699-025-00541-9
- Low, Mei Xian;
- Ahmed, Taimur;
- Saini, Saurabh K.;
- Panahandeh-Fard, Majid;
- Mendes, Joao O.;
- Chesman, Anthony S. R.;
- Xu, Chenglong;
- Van Embden, Joel;
- Wang, Lan;
- Kumar, Mahesh;
- Sriram, Sharath;
- Bhaskaran, Madhu;
- Walia, Sumeet
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800237
- Wang, Xin;
- Wu, Yao;
- Li, Guanwen;
- Wu, Jun;
- Zhang, XiaoBing;
- Li, Qing;
- Wang, Baoping;
- Chen, Jing;
- Lei, Wei
- Article
6
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 10, p. 781, doi. 10.1002/pssr.201307253
- Article
7
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 10, p. 894, doi. 10.1002/pssr.201307139
- Article
8
- Advances in Condensed Matter Physics, 2014, p. 1, doi. 10.1155/2014/639259
- Sastry, S. Sreehari;
- Kumar, L. Tanuj;
- Vishwam, T.;
- Murthy, V. R. K.;
- Lakshminaryana, S.;
- Tiong, Ha Sie
- Article
9
- Modern Physics Letters B, 2016, v. 30, n. 26, p. -1, doi. 10.1142/S0217984916503371
- Deng, Min;
- Wang, Yong-Jian;
- Gang, Yu;
- Chen, Jian-Fei
- Article
10
- AAPPS Bulletin, 2014, v. 24, n. 6, p. 11
- Article
11
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 769, doi. 10.1007/s10836-017-5694-5
- Yi, Tengyue;
- Liu, Yi;
- Yang, Yintang
- Article
12
- Metallurgist, 2012, v. 56, n. 3/4, p. 303, doi. 10.1007/s11015-012-9575-y
- Murashev, V.;
- Korolchenko, A.;
- Legotin, S.
- Article
13
- NPJ Flexible Electronics, 2020, v. 4, n. 1, p. 1, doi. 10.1038/s41528-020-0064-2
- Qu, Dawei;
- Huang, Xuan;
- Li, Xin;
- Wang, Hanfu;
- Chen, Guangming
- Article
14
- Instruments & Experimental Techniques, 2023, v. 66, n. 1, p. 36, doi. 10.1134/S0020441223010141
- Gorbunov, A. V.;
- Karmanov, D. E.
- Article
15
- Indian Journal of Pure & Applied Physics, 2021, v. 59, n. 4, p. 335
- Chaudhri, Aadarsh Kumar;
- Joshi, B. C.;
- Devi, Vanita;
- Singh, Mahipal
- Article
16
- Advances in Materials Science & Engineering, 2018, p. 1, doi. 10.1155/2018/8797031
- Atabaev, I. G.;
- Juraev, Kh. N.
- Article
17
- Semiconductors, 2018, v. 52, n. 16, p. 2128, doi. 10.1134/S1063782618160327
- Sobolev, M. S.;
- Lazarenko, A. A.;
- Mizerov, A. M.;
- Nikitina, E. V.;
- Pirogov, E. V.;
- Timoshnev, S. N.;
- Bouravleuv, A. D.
- Article
18
- Semiconductors, 2018, v. 52, n. 8, p. 1077, doi. 10.1134/S1063782618080225
- Vasileva, G. Yu.;
- Vasilyev, Yu. B.;
- Novikov, S. N.;
- Danilov, S. N.;
- Ganichev, S. D.
- Article
19
- Semiconductors, 2017, v. 51, n. 9, p. 1208, doi. 10.1134/S1063782617090123
- Article
20
- Semiconductors, 2017, v. 51, n. 9, p. 1214, doi. 10.1134/S1063782617090135
- Article
21
- Semiconductors, 2017, v. 51, n. 7, p. 883, doi. 10.1134/S1063782617070296
- Ordin, S.;
- Zhilyaev, Yu.;
- Zelenin, V.;
- Panteleev, V.
- Article
22
- Semiconductors, 2017, v. 51, n. 2, p. 189, doi. 10.1134/S1063782617020038
- Avakyants, L.;
- Aslanyan, A.;
- Bokov, P.;
- Polozhentsev, K.;
- Chervyakov, A.
- Article
23
- Semiconductors, 2016, v. 50, n. 10, p. 1352, doi. 10.1134/S1063782616100171
- Article
24
- Semiconductors, 2016, v. 50, n. 9, p. 1216, doi. 10.1134/S1063782616090256
- Vikulin, I.;
- Korobitsyn, B.;
- Kriskiv, S.
- Article
25
- Semiconductors, 2016, v. 50, n. 8, p. 1097, doi. 10.1134/S106378261608008X
- Babichev, A.;
- Zhang, H.;
- Guan, N.;
- Egorov, A.;
- Julien, F.;
- Messanvi, A.;
- Durand, C.;
- Eymery, J.;
- Tchernycheva, M.
- Article
26
- Semiconductors, 2016, v. 50, n. 6, p. 751, doi. 10.1134/S1063782616060130
- Lastovskii, S.;
- Markevich, V.;
- Yakushevich, H.;
- Murin, L.;
- Krylov, V.
- Article
27
- Semiconductors, 2016, v. 50, n. 6, p. 761, doi. 10.1134/S106378261606021X
- Sachenko, A.;
- Belyaev, A.;
- Konakova, R.
- Article
28
- Semiconductors, 2016, v. 50, n. 4, p. 462, doi. 10.1134/S1063782616040175
- Article
29
- Semiconductors, 2015, v. 49, n. 12, p. 1571, doi. 10.1134/S1063782615120180
- Samartsev, I.;
- Aleshkin, V.;
- Dikareva, N.;
- Dubinov, A.;
- Zvonkov, B.;
- Kolpakov, D.;
- Nekorkin, S.
- Article
30
- Semiconductors, 2015, v. 49, n. 9, p. 1222, doi. 10.1134/S1063782615090171
- Kuzmin, R.;
- Bagraev, N.;
- Klyachkin, L.;
- Malyarenko, A.
- Article
31
- Semiconductors, 2015, v. 49, n. 6, p. 819, doi. 10.1134/S1063782615060111
- Gulyamov, G.;
- Gulyamov, A.
- Article
32
- Semiconductors, 2014, v. 48, n. 10, p. 1359, doi. 10.1134/S1063782614100066
- Brunkov, P.;
- Il'inskaya, N.;
- Karandashev, S.;
- Latnikova, N.;
- Lavrov, A.;
- Matveev, B.;
- Petrov, A.;
- Remennyi, M.;
- Sevostyanov, E.;
- Stus, N.
- Article
33
- Semiconductors, 2014, v. 48, n. 7, p. 935, doi. 10.1134/S1063782614070185
- Article
34
- Semiconductors, 2014, v. 48, n. 2, p. 156, doi. 10.1134/S1063782614020146
- Kalinina, E.;
- Chuchvaga, N.;
- Bogdanova, E.;
- Strel'chuk, A.;
- Shustov, D.;
- Zamoryanskaya, M.;
- Skuratov, V.
- Article
35
- Semiconductors, 2013, v. 47, n. 12, p. 1652, doi. 10.1134/S1063782613120105
- Kalinovsky, V. S.;
- Levin, R. V.;
- Pushniy, B. V.;
- Mizerov, M. N.;
- Rumyantsev, V. D.;
- Andreev, V. M.
- Article
36
- Semiconductors, 2013, v. 47, n. 11, p. 1523, doi. 10.1134/S1063782613110171
- Parkhomenko, Ya.;
- Ivanov, E.;
- Moiseev, K.
- Article
37
- Semiconductors, 2013, v. 47, n. 4, p. 543, doi. 10.1134/S1063782613040209
- Article
38
- Semiconductors, 2013, v. 47, n. 3, p. 406, doi. 10.1134/S1063782613030159
- Lanz, B.;
- Vainshtein, S.;
- Lantratov, V.;
- Kalyuzhnyy, N.;
- Mintairov, S.;
- Kostamovaara, J.
- Article
39
- Semiconductors, 2012, v. 46, n. 8, p. 1012, doi. 10.1134/S1063782612080040
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 999, doi. 10.1007/s11664-014-3605-4
- Li, Y.;
- Feng, L.;
- Xing, Q.;
- Wang, X.
- Article
41
- Journal of Electronic Materials, 2013, v. 42, n. 7, p. 2297, doi. 10.1007/s11664-012-2399-5
- Becker, André;
- Chavez, Ruben;
- Petermann, Nils;
- Schierning, Gabi;
- Schmechel, Roland
- Article
42
- Technical Physics, 2018, v. 63, n. 12, p. 1824, doi. 10.1134/S1063784218120204
- Article
43
- Technical Physics, 2016, v. 61, n. 11, p. 1694, doi. 10.1134/S106378421611027X
- Tregulov, V.;
- Stepanov, V.;
- Litvinov, V.;
- Ermachikhin, A.
- Article
44
- Technical Physics, 2016, v. 61, n. 7, p. 1053, doi. 10.1134/S1063784216070148
- Gorbatsevich, A.;
- Danilin, A.;
- Korneev, V.;
- Magomedbekov, E.;
- Molin, A.
- Article
45
- Technical Physics, 2014, v. 59, n. 9, p. 1413, doi. 10.1134/S1063784214090254
- Article
46
- Technical Physics, 2014, v. 59, n. 2, p. 224, doi. 10.1134/S1063784214020145
- Len'shin, A.;
- Kashkarov, V.;
- Seredin, P.;
- Agapov, B.;
- Minakov, D.;
- Tsipenyuk, V.;
- Domashevskaya, E.
- Article
47
- Technical Physics, 2013, v. 58, n. 3, p. 340, doi. 10.1134/S1063784213030122
- Article
48
- Physica Status Solidi. A: Applications & Materials Science, 2023, v. 220, n. 24, p. 1, doi. 10.1002/pssa.202300243
- Koshiba, Yasuko;
- Sugimoto, Iori;
- Horike, Shohei;
- Fukushima, Tatsuya;
- Ishida, Kenji
- Article
49
- Applied Physics A: Materials Science & Processing, 2018, v. 124, n. 9, p. 1, doi. 10.1007/s00339-018-2018-2
- Tripathi, Ball Mukund Mani;
- Das, Shyama Prasad
- Article
50
- Applied Physics A: Materials Science & Processing, 2018, v. 124, n. 3, p. 1, doi. 10.1007/s00339-018-1656-8
- Sameshima, Toshiyuki;
- Yasuta, Keisuke;
- Hasumi, Masahiko;
- Nagao, Tomokazu;
- Inouchi, Yutaka
- Article