Works matching DE "X-ray reflectometry"

Results: 105

Reference samples for the spatial characteristics of nanostructures based on amorphous multilayer coatings.

Published in:

Measurement Techniques, 2013, v. 56, n. 6, p. 605, doi. 10.1007/s11018-013-0252-8

By:

Baturin, A.;
Bormashov, V.;
Ermakova, M.;
Morozova, E.;
Morozov, S.;
Korostylev, E.;
Zarubin, S.;
Markeev, A.;
Todua, P.

Publication type:

Article

The Influence of the Power Supply of a Magnetron Sputtering System on the Properties of the Deposited TiO2 Films.

Published in:

Inorganic Materials, 2018, v. 54, n. 15, p. 1491, doi. 10.1134/S0020168518150025

By:

Abramov, N. F.;
Bezrukov, A. V.;
Vol'pyan, O. D.;
Obod, Yu. A.

Publication type:

Article

Prototype of 2D PSD for slow neutrons based on RPC with 10B4C film.

Published in:

Instruments & Experimental Techniques, 2024, v. 67, n. 6, p. 1080, doi. 10.1134/S0020441224702063

By:

Petrova, M. O.;
Bogdzel', A. A.;
Bodnarchuk, V. I.;
Daulbaev, O.;
Milkov, V. M.;
Kurilkin, A. K.;
Bulatov, K. V.;
Dmitriev, A. V.;
Babkin, V. A.;
Avdeev, M. M.;
Litvinenko, E. I.

Publication type:

Article

Confinement effects on glass transition temperature, transition breadth, and linear expansivity: An ultraslow X-ray reflectivity study on supported ultrathin polystyrene films.

Published in:

European Physical Journal E -- Soft Matter, 2013, v. 36, n. 6, p. 1, doi. 10.1140/epje/i2013-13066-3

By:

Yang, Chunming;
Onitsuka, Rena;
Takahashi, Isao

Publication type:

Article

Surface-induced breakout crystallization in cylinder-forming P(I-b-EO) diblock copolymer thin films.

Published in:

European Physical Journal E -- Soft Matter, 2011, v. 34, n. 1, p. 1, doi. 10.1140/epje/i2011-11007-x

By:

Papadakis, C.;
Darko, C.;
Di, Z.;
Troll, K.;
Metwalli, E.;
Timmann, A.;
Reiter, G.;
Förster, S.

Publication type:

Article

Enhancement of the hydrophobicity and oleophobicity of a polyurethane coating using a fluorine‐free polyfarnesene‐based polyol.

Published in:

Journal of Applied Polymer Science, 2024, v. 141, n. 9, p. 1, doi. 10.1002/app.55010

By:

Shiraki, Yoshihiko

Publication type:

Article

Photoluminescence and Transmission Electron Microscopy Methods for Characterization of Super-Multiperiod A3B5 Quantum Well Structures.

Published in:

Semiconductors, 2019, v. 53, n. 14, p. 1914, doi. 10.1134/S1063782619140094

By:

Goray, L. I.;
Pirogov, E. V.;
Nikitina, E. V.;
Ubyivovk, E. V.;
Gerchikov, L. G.;
Ipatov, A. N.;
Dashkov, A. S.;
Sobolev, M. S.;
Ilkiv, I. V.;
Bouravlev, A. D.

Publication type:

Article

Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy.

Published in:

Semiconductors, 2019, v. 53, n. 14, p. 1910, doi. 10.1134/S1063782619140082

By:

Goray, L. I.;
Pirogov, E. V.;
Sobolev, M. S.;
Ilkiv, I. V.;
Dashkov, A. S.;
Vainer, Yu. A.;
Svechnikov, M. V.;
Yunin, P. A.;
Chkhalo, N. I.;
Bouravlev, A. D.

Publication type:

Article

Reflectometry of X-ray Whispering Gallery Waves Propagating along Liquid Meniscuses.

Published in:

Semiconductors, 2018, v. 52, n. 16, p. 2049, doi. 10.1134/S1063782618160091

By:

Goray, L. I.;
Asadchikov, V. E.;
Roshchin, B. S.;
Volkov, Yu. O.;
Tikhonov, A. M.

Publication type:

Article

Study of multilayered SiGe semiconductor structures by X-ray diffractometry, grazing-incidence X-ray reflectometry, and secondary-ion mass spectrometry.

Published in:

Semiconductors, 2013, v. 47, n. 12, p. 1556, doi. 10.1134/S1063782613120221

By:

Yunin, P. A.;
Drozdov, Yu. N.;
Drozdov, M. N.;
Korolev, S. A.;
Lobanov, D. N.

Publication type:

Article

Influence of Radiation Exposure on the Magnetic Properties of Ferromagnetic/IrMn Films with Exchange Bias.

Published in:

Technical Physics, 2024, v. 69, n. 7, p. 2014, doi. 10.1134/S1063784224070235

By:

Krivulin, D. O.;
Pashenkin, I. Yu.;
Gorev, R. V.;
Yunin, P. A.;
Sapozhnikov, M. V.;
Grunin, A. V.;
Zakharova, S. A.;
Leontiev, V. N.

Publication type:

Article

Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1822, doi. 10.1134/S1063784220110134

By:

Goray, L. I.;
Pirogov, E. V.;
Sobolev, M. S.;
Polyakov, N. K.;
Dashkov, A. S.;
Svechnikov, M. V.;
Bouravleuv, A. D.

Publication type:

Article

Reference‐Free Combined X‐Ray Reflectometry−Grazing Incidence X‐Ray Fluorescence at the French Synchrotron SOLEIL.

Published in:

Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 9, p. 1, doi. 10.1002/pssa.202100423

By:

Ménesguen, Yves;
Lépy, Marie-Christine

Publication type:

Article

Gap-Free Tuning of Second and Third Harmonic Generation in Mechanochemically Synthesized Nanocrystalline LiNb 1− x Ta x O 3 (0 ≤ x ≤ 1) Studied with Nonlinear Diffuse Femtosecond-Pulse Reflectometry.

Published in:

Nanomaterials (2079-4991), 2024, v. 14, n. 3, p. 317, doi. 10.3390/nano14030317

By:

Klenen, Jan;
Sauerwein, Felix;
Vittadello, Laura;
Kömpe, Karsten;
Hreb, Vasyl;
Sydorchuk, Volodymyr;
Yakhnevych, Uliana;
Sugak, Dmytro;
Vasylechko, Leonid;
Imlau, Mirco

Publication type:

Article

Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues.

Published in:

Nanomaterials (2079-4991), 2024, v. 14, n. 3, p. 269, doi. 10.3390/nano14030269

By:

Paci, Barbara;
Righi Riva, Flavia;
Generosi, Amanda;
Guaragno, Marco;
Mangiacapre, Emanuela;
Brutti, Sergio;
Wagner, Michael;
Distler, Andreas;
Egelhaaf, Hans-Joachim

Publication type:

Article

Surface Degradation of Thin-Layer Al/MgF 2 Mirrors under Exposure to Powerful VUV Radiation.

Published in:

Nanomaterials (2079-4991), 2023, v. 13, n. 21, p. 2819, doi. 10.3390/nano13212819

By:

Skriabin, Andrei;
Telekh, Victor;
Pavlov, Aleksei;
Pasynkova, Daria;
Podlosinskaya, Anastasiya;
Novikov, Pavel;
Zhupanov, Valery;
Chesnokov, Dmitry;
Senkov, Viacheslav;
Turyanskiy, Alexander

Publication type:

Article

Synthesis and Characterization of Cu 2 ZnSnS 4 Thin Films Obtained by Combined Magnetron Sputtering and Pulsed Laser Deposition.

Published in:

Nanomaterials (2079-4991), 2021, v. 11, n. 9, p. 2403, doi. 10.3390/nano11092403

By:

Zaki, Mohamed-Yassine;
Sava, Florinel;
Buruiana, Angel-Theodor;
Simandan, Iosif-Daniel;
Becherescu, Nicu;
Galca, Aurelian-Catalin;
Mihai, Claudia;
Velea, Alin

Publication type:

Article

INVESTIGATION OF INTERFACIAL STRUCTURES OF NANO-SCALE TiN/AlN MULTILAYER BY NEUTRON AND X-RAY REFLECTOMETRY.

Published in:

Digest Journal of Nanomaterials & Biostructures (DJNB), 2018, v. 13, n. 2, p. 325

By:

DU, X. M.;
ZHENG, K. F.;
LIU, R. D.;
CHEN, D. F.;
LIU, Y. T.;
PETRENKO, V. I.;
ZHANG, G.;
HUANG, C. Q.;
GAPON, I. V.

Publication type:

Article

NEUTRON AND X-RAY REFLECTOMETRY FOR THE INVESTIGATION OF NANO-SCALE HARD MULTILAYERS.

Published in:

Digest Journal of Nanomaterials & Biostructures (DJNB), 2017, v. 12, n. 2, p. 265

By:

DU, X. M.;
ZHENG, K. F.;
WANG, Y.;
LI, X. X.;
WANG, M. P.;
ZHANG, G.;
WU, E. D.

Publication type:

Article

Influence of Temperature on the Conformational Guided Physical Properties of Ultrathin Films of PLLA.

Published in:

Defence Science Journal, 2014, v. 64, n. 3, p. 309, doi. 10.14429/dsj.64.7329

By:

Pandit, Pallavi;
Banerjee, Mandira;
Mukherjee, G. S.;
Parikh, Rakesh;
Deshpanday, U. P.;
Gupta, Ajay

Publication type:

Article

Pt and Pd Nanoparticle Crystallization in the Sol-Gel-Derived Thin SiO 2 Films.

Published in:

Physchem, 2023, v. 3, n. 2, p. 259, doi. 10.3390/physchem3020018

By:

Gubanova, Nadezhda;
Matveev, Vasilii;
Grebenshchikova, Elena;
Kirilenko, Demid;
Sazonova, Yana;
Shilova, Olga

Publication type:

Article

Influence of the RF magnetron sputtering power on the optical and electrical properties of AZO films.

Published in:

Physical Sciences & Technology, 2023, v. 10, n. 3/4, p. 28, doi. 10.26577/phst.2023.v10.i2.03

By:

Nussupov, K. Kh.;
Beisenkhanov, N. B.;
Kusainova, A. Zh.;
Zhirkov, I. V.;
Shynybaev, D. S.;
Sultanov, A. T.

Publication type:

Article

Stable 2D Conductive Ga/Ga(OxHy) Multilayers with Controlled Nanoscale Thickness Prepared from Gallium Droplets with Oxide Skin.

Published in:

Advanced Materials Interfaces, 2018, v. 5, n. 16, p. 1, doi. 10.1002/admi.201800323

By:

Runde, Sebastian;
Ahrens, Heiko;
Lawrenz, Frank;
Sebastian, Amal;
Block, Stephan;
Helm, Christiane A.

Publication type:

Article

High-Precision Characterization of Super-Multiperiod AlGaAs/GaAs Superlattices Using X-Ray Reflectometry on a Synchrotron Source.

Published in:

Technical Physics Letters, 2021, v. 47, n. 10, p. 757, doi. 10.1134/S1063785021080071

By:

Goray, L. I.;
Pirogov, E. V.;
Svechnikov, M. V.;
Sobolev, M. S.;
Polyakov, N. K.;
Gerchikov, L. G.;
Nikitina, E. V.;
Dashkov, A. S.;
Borisov, M. M.;
Yakunin, S. N.;
Bouravleuv, A. D.

Publication type:

Article

Dose Dependence of Nanocrystal Formation in Helium-Implanted Silicon Layers.

Published in:

Technical Physics Letters, 2018, v. 44, n. 4, p. 291, doi. 10.1134/S1063785018040077

By:

Lomov, A. A.;
Myakon’kikh, A. V.;
Chesnokov, Yu. M.;
Denisov, V. V.;
Kirichenko, A. N.;
Denisov, V. N.

Publication type:

Article

Towards a neutron and X-ray reflectometry environment for the study of solid–liquid interfaces under shear.

Published in:

Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-89189-1

By:

Armstrong, Alexander J.;
McCoy, Thomas M.;
Welbourn, Rebecca J. L.;
Barker, Robert;
Rawle, Jonathan L.;
Cattoz, Beatrice;
Dowding, Peter J.;
Routh, Alexander F.

Publication type:

Article

Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B 4 C Multilayers.

Published in:

Coatings (2079-6412), 2024, v. 14, n. 4, p. 513, doi. 10.3390/coatings14040513

By:

Chang, Chenyuan;
Wei, Zhenbo;
Jiang, Hui;
Ni, Hangjian;
Song, Wentao;
He, Jialian;
Xiang, Simeng;
Wang, Zhanshan;
Zhang, Zhe;
Zhang, Zhong

Publication type:

Article

Atomic Layer Deposition of Chlorine Containing Titanium–Zinc Oxide Nanofilms Using the Supercycle Approach.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 5, p. 960, doi. 10.3390/coatings13050960

By:

Nazarov, Denis;
Kozlova, Lada;
Rudakova, Aida;
Zemtsova, Elena;
Yudintceva, Natalia;
Ovcharenko, Elizaveta;
Koroleva, Alexandra;
Kasatkin, Igor;
Kraeva, Ludmila;
Rogacheva, Elizaveta;
Maximov, Maxim

Publication type:

Article

Protection of Cu from Oxidation by Ta Capping Layer.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 5, p. 926, doi. 10.3390/coatings13050926

By:

Zhidkov, Ivan S.;
Kukharenko, Andrey I.;
Milyaev, Mikhail A.;
Kravtsov, Evgeniy A.;
Makarova, Marina V.;
Gapontsev, Vladimir V.;
Streltsov, Sergey V.;
Cholakh, Seif O.;
Kurmaev, Ernst Z.

Publication type:

Article

Features of the Composition and Photoluminescent Properties of Porous Silicon Depending on Its Porosity Index.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 2, p. 385, doi. 10.3390/coatings13020385

By:

Lenshin, Aleksandr S.;
Peshkov, Yaroslav A.;
Barkov, Konstantin A.;
Grechkina, Margarita V.;
Lukin, Anatoliy N.;
Kannykin, Sergey V.;
Minakov, Dmitriy A.;
Chernousova, Olga V.

Publication type:

Article

Structural and Magnetic Specificities of Fe-B Thin Films Obtained by Thermionic Vacuum Arc and Magnetron Sputtering.

Published in:

Coatings (2079-6412), 2022, v. 12, n. 10, p. 1592, doi. 10.3390/coatings12101592

By:

Staicu, Cornel;
Locovei, Claudiu;
Dinu, Andrei Alexandru;
Burducea, Ion;
Dincă, Paul;
Butoi, Bogdan;
Pompilian, Oana Gloria;
Porosnicu, Corneliu;
Lungu, Cristian Petrica;
Kuncser, Victor

Publication type:

Article

Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation.

Published in:

Coatings (2079-6412), 2022, v. 12, n. 2, p. 290, doi. 10.3390/coatings12020290

By:

Telekh, Victor D.;
Pavlov, Aleksei V.;
Kirillov, Daniil V.;
Vorob'ev, Evgeny V.;
Turyanskiy, Alexander G.;
Senkov, Viacheslav M.;
Tsygankov, Petr A.;
Parada-Becerra, Freddy F.;
Vesnin, Vladimir R.;
Skriabin, Andrei S.

Publication type:

Article

Surface Topography of Si/TiO 2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation.

Published in:

Coatings (2079-6412), 2021, v. 11, n. 11, p. 1350, doi. 10.3390/coatings11111350

By:

Moise, Călin Constantin;
Pantazi, Aida;
Mihai, Geanina Valentina;
Jderu, Alin;
Bercu, Mircea;
Messina, Angelo Alberto;
Enăchescu, Marius

Publication type:

Article

Plasma Enhanced Atomic Layer Deposition of Tantalum (V) Oxide.

Published in:

Coatings (2079-6412), 2021, v. 11, n. 10, p. 1206, doi. 10.3390/coatings11101206

By:

Fedorov, Pavel;
Nazarov, Denis;
Medvedev, Oleg;
Koshtyal, Yury;
Rumyantsev, Aleksander;
Tolmachev, Vladimir;
Popovich, Anatoly;
Maximov, Maxim Yu

Publication type:

Article

The Effect of the Deposition Method on the Structural and Optical Properties of ZnS Thin Films.

Published in:

Coatings (2079-6412), 2021, v. 11, n. 9, p. 1064, doi. 10.3390/coatings11091064

By:

Simandan, Iosif-Daniel;
Sava, Florinel;
Buruiana, Angel-Theodor;
Burducea, Ion;
Becherescu, Nicu;
Mihai, Claudia;
Velea, Alin;
Galca, Aurelian-Catalin

Publication type:

Article

Internal Structure and Temporal Stability of Hard X-ray Pd/B 4 C Multilayer Mirrors under Different Humidity Environments.

Published in:

Coatings (2079-6412), 2021, v. 11, n. 3, p. 262, doi. 10.3390/coatings11030262

By:

Liu, Genchang;
Huang, Qiushi;
Qi, Runze;
Ni, Hangjian;
Feng, Yufei;
Zhang, Zhong;
Wang, Zhanshan

Publication type:

Article

Assessment of Potential of the High-Voltage Anodic Plasma Source to Deposit Multilayer Structures Relevant to X-ray Mirror Applications.

Published in:

Coatings (2079-6412), 2020, v. 10, n. 6, p. 531, doi. 10.3390/coatings10060531

By:

Vlaicu, Aurel-Mihai;
Anghel, Alexandru;
Badulescu, Marius;
Surdu-Bob, Cristina

Publication type:

Article

Extracting chemical information from single-wavelength X-ray reflectivity data.

Published in:

European Physical Journal - Applied Physics, 2013, v. 62, n. 1, p. 00, doi. 10.1051/epjap/2013130120

By:

Salah, Fethi;
Harzallah, Besma;
Mérian, Thiphaine;
Debarnot, Dominique;
Poncin-Epaillard, Fabienne;
van der Lee, Arie

Publication type:

Article

Structural and Magnetoresistive Properties of Nanometric Films Based on Iron and Chromium Oxides on the Si Substrate.

Published in:

Nanoscale Research Letters, 2016, v. 11, n. 1, p. 1, doi. 10.1186/s11671-016-1684-2

By:

Smirnov, Aleksey;
Kryvyi, Serhii;
Mulenko, Sergii;
Sadovnikova, Maria;
Savkina, Rada;
Stefan, Nicolaie

Publication type:

Article

Amorphous In-Ga-Zn-O thin-film transistors prepared by magnetron sputtering using Kr and Xe instead of Ar.

Published in:

Journal of the Society for Information Display, 2013, v. 21, n. 12, p. 517, doi. 10.1002/jsid.210

By:

Goto, Tetsuya;
Sugawa, Shigetoshi;
Ohmi, Tadahiro

Publication type:

Article

Distributed Temperature Sensing through Network Analysis Frequency-Domain Reflectometry.

Published in:

Sensors (14248220), 2024, v. 24, n. 7, p. 2378, doi. 10.3390/s24072378

By:

Zahoor, Rizwan;
Vallifuoco, Raffaele;
Zeni, Luigi;
Minardo, Aldo

Publication type:

Article

Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm.

Published in:

Experimental Techniques, 2014, v. 38, n. 1, p. 21, doi. 10.1111/j.1747-1567.2011.00773.x

By:

Solookinejad, G.;
Rozatian, A.S.H.;
Habibi, M.H.

Publication type:

Article

Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.

Published in:

Macromolecular Materials & Engineering, 2022, v. 307, n. 10, p. 1, doi. 10.1002/mame.202200296

By:

Apelt, Sabine;
Höhne, Susanne;
Mehner, Erik;
Böhm, Carolin;
Malanin, Mikhail;
Eichhorn, Klaus‐Jochen;
Jehnichen, Dieter;
Uhlmann, Petra;
Bergmann, Ute

Publication type:

Article

Reflectometry Reveals Accumulation of Surfactant Impurities at Bare Oil/Water Interfaces.

Published in:

Molecules, 2019, v. 24, n. 22, p. 4113, doi. 10.3390/molecules24224113

By:

Scoppola, Ernesto;
Micciulla, Samantha;
Kuhrts, Lucas;
Maestro, Armando;
Campbell, Richard A.;
Konovalov, Oleg V.;
Fragneto, Giovanna;
Schneck, Emanuel;
Lo Nostro, Pierandrea

Publication type:

Article

Chain-Melting Phase Transition in a Lamellar Film of Dimyristoyl-Phosphatidylserine on the Surface of a Silica Hydrosol.

Published in:

Crystallography Reports, 2024, v. 69, n. 3, p. 365, doi. 10.1134/S1063774524600509

By:

Tikhonov, A. M.;
Volkov, Yu. O.;
Nuzhdin, A. D.;
Roshchin, B. S.;
Asadchikov, V. E.

Publication type:

Article

X-ray Reflectometry of Thin Films Formed during Phase Separation of Organic Solutions of Aliphatic Polyethers in Water.

Published in:

Crystallography Reports, 2023, v. 68, n. 1, p. 104, doi. 10.1134/S1063774523010029

By:

Asadchikov, V. E.;
Volkov, Y. O.;
Roshchin, B. S.;
Nuzhdin, A. D.;
Chernavskaya, E. R.;
Tikhonov, A. M.;
Mironov, A. V.;
Mariyanac, A. O.;
Popov, V. K.

Publication type:

Article

Determination of the Parameters of Films Formed on the Liquid Subphase According to Reflectometry Data.

Published in:

Crystallography Reports, 2021, v. 66, n. 6, p. 1082, doi. 10.1134/S1063774521060031

By:

Astaf'ev, S. B.;
Yanusova, L. G.

Publication type:

Article

Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials.

Published in:

Crystallography Reports, 2021, v. 66, n. 4, p. 618, doi. 10.1134/S106377452104012X

By:

Lukina, E. A.;
Gulyaev, A. I.;
Zhuravleva, P. L.;
Zaitsev, D. V.

Publication type:

Article

Comparison of Transmission Electron Microscopy and X-Ray Reflectometry Data in the Study of the Structure of Silicon-Carbon Nanocomposite Films.

Published in:

Crystallography Reports, 2019, v. 64, n. 5, p. 793, doi. 10.1134/S1063774519050031

By:

Asadchikov, V. E.;
Volkov, Y. O.;
Dyachkova, I. G.;
Zhigalina, O. M.;
Kanevsky, V. M.;
Muslimov, A. E.;
Nuzhdin, A. D.;
Pimenov, S. M.;
Roshchin, B. S.;
Rusakov, A. A.;
Khmelenin, D. N.;
Shahbazov, S. Y.;
Shupegin, M. L.

Publication type:

Article

Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films.

Published in:

Crystallography Reports, 2018, v. 63, n. 5, p. 791, doi. 10.1134/S1063774518050036

By:

Astaf’ev, S. B.;
Yanusova, L. G.

Publication type:

Article