Works matching DE "TIME-of-flight measurements"
1
- Sensors (14248220), 2025, v. 25, n. 9, p. 2923, doi. 10.3390/s25092923
- Chen, Riguang;
- Chen, Ping;
- Li, Kuinian;
- Liu, Hulin
- Article
2
- Chemistry - A European Journal, 2023, v. 29, n. 27, p. 1, doi. 10.1002/chem.202300227
- S., Vanishree Bhat;
- Vadivel, Marichandran;
- Singh, Dharmendra Pratap;
- Raghunathan, V. A.;
- Roy, Arun;
- Kumar, Sandeep
- Article
3
- Advanced Functional Materials, 2016, v. 26, n. 21, p. 3720, doi. 10.1002/adfm.201504722
- Campbell, Alasdair J.;
- Rawcliffe, Ruth;
- Guite, Alexander;
- Faria, Jorge Costa Dantas;
- Mukherjee, Abhimanyu;
- McLachlan, Martyn A.;
- Shkunov, Maxim;
- Bradley, Donal D. C.
- Article
4
- Instrumentation Science & Technology, 2017, v. 45, n. 5, p. 541, doi. 10.1080/10739149.2016.1278229
- Du, Rong;
- Tian, Haolai;
- Zuo, Taisen;
- Tang, Ming;
- Yan, Lili;
- Zhang, Junrong
- Article
5
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2018, v. 16, n. 7, p. 619, doi. 10.2322/tastj.16.619
- Kentaro UNO;
- Louis-Jerome BURTZ;
- HULCELLE, Marc;
- YOSHIDA, Kazuya
- Article
6
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2014, v. 12, n. ists 29, p. 25
- Hiroshi HOSOKAWA;
- Osamu YAMADA;
- Haruki KOBAYASHI;
- Hideyuki HORISAWA
- Article
7
- Nondestructive Testing & Evaluation, 2018, v. 33, n. 4, p. 393, doi. 10.1080/10589759.2018.1495204
- Abbasi, Kavoos;
- Alobaidi, Wissam M.
- Article
8
- Nondestructive Testing & Evaluation, 2017, v. 32, n. 1, p. 1, doi. 10.1080/10589759.2015.1130828
- Park, Byeongjin;
- Sohn, Hoon;
- Malinowski, Pawel;
- Ostachowicz, Wieslaw
- Article
9
- Plasma Physics Reports, 2020, v. 46, n. 1, p. 20, doi. 10.1134/S1063780X20010092
- Gurchenko, A. D.;
- Gusakov, E. Z.;
- Altukhov, A. B.;
- Esipov, L. A.
- Article
10
- Plasma Physics Reports, 2012, v. 38, n. 7, p. 579, doi. 10.1134/S1063780X12070033
- Ilyas, B.;
- Dogar, A.;
- Ullah, S.;
- Nadeem, A.;
- Qayyum, A.
- Article
11
- Photonics, 2023, v. 10, n. 3, p. 304, doi. 10.3390/photonics10030304
- Kondo, Takashi;
- Hayakawa, Junichiro;
- Iguchi, Daisuke;
- Sakita, Tomoaki;
- Higuchi, Takafumi;
- Takeyama, Kei;
- Ohno, Seiji;
- Murata, Michiaki;
- Usami, Hiroyuki
- Article
12
- International Archives of the Photogrammetry, Remote Sensing & Spatial Information Sciences, 2016, v. 41, n. B5, p. 469, doi. 10.5194/isprsarchives-XLI-B5-469-2016
- Heinkelé, C.;
- Labbé, M.;
- Muzet, V.;
- Charbonnier, P.
- Article
13
- Optical Engineering, 2015, v. 54, n. 11, p. 1, doi. 10.1117/1.OE.54.11.114102
- Pengfei Du;
- Dongxian Geng;
- Wei Wang;
- Mali Gong
- Article
14
- Scientific Reports, 2023, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-41937-1
- Asakawa, Kanta;
- Tanabe, Naoki;
- Kawauchi, Taizo;
- Fukutani, Katsuyuki;
- Hatakeyama, Atsushi
- Article
15
- Nuclear Physics & Atomic Energy, 2016, v. 17, n. 2, p. 122, doi. 10.15407/jnpae2016.02.122
- Kadenko, I. M.;
- Plujko, V. A.;
- Bondar, B. M.;
- Gorbachenko, O. M.;
- Leshchenko, B. Yu.;
- Solodovnyk, K. M.
- Article
16
- International Journal of Modern Physics: Conference Series, 2020, v. 50, p. N.PAG, doi. 10.1142/S2010194520600149
- Zeynalov, Shakir;
- Sidorova, Olga
- Article
17
- International Journal of Modern Physics: Conference Series, 2020, v. 50, p. N.PAG, doi. 10.1142/S2010194520600083
- Yurevich, V. I.;
- Sedykh, S. A.;
- Sergeev, S. V.;
- Bogoslovski, D. N.;
- Rogov, V. Yu.;
- Tikhomirov, V. V.;
- Lashmanov, N. A.
- Article
18
- European Physical Journal C -- Particles & Fields, 2012, v. 72, n. 11, p. 1, doi. 10.1140/epjc/s10052-012-2191-y
- Article
19
- European Physical Journal C -- Particles & Fields, 2010, v. 68, n. 3/4, p. 601, doi. 10.1140/epjc/s10052-010-1370-y
- Akindinov, A.;
- Alici, A.;
- Antonioli, P.;
- Arcelli, S.;
- Basile, M.;
- Bellini, F.;
- Caffarri, D.;
- Cara Romeo, G.;
- Cifarelli, L.;
- Cindolo, F.;
- Caro, A.;
- Gruttola, D.;
- Pasquale, S.;
- Doroud, K.;
- Fusco Girard, M.;
- Guerzoni, B.;
- Hatzifotiadou, D.;
- Jung, W.;
- Kim, D.;
- Kim, J.
- Article
20
- Nature Communications, 2024, v. 15, n. 1, p. 1, doi. 10.1038/s41467-024-46515-1
- Luo, Tianchuang;
- Ilyas, Batyr;
- Hoegen, A. von;
- Lee, Youjin;
- Park, Jaena;
- Park, Je-Geun;
- Gedik, Nuh
- Article
21
- Footwear Science, 2011, v. 3, p. S98, doi. 10.1080/19424280.2011.575862
- Liu, Shuysn;
- Cui, Yan;
- Sanchez, Stephane;
- Stricker, Didier
- Article
22
- Journal of Applied Crystallography, 2016, v. 49, n. 5, p. 1674, doi. 10.1107/S1600576716012668
- Frandsen, Henrik L.;
- Theil Kuhn, Luise;
- Makowska, Małgorzata G.;
- Strobl, Markus;
- Lauridsen, Erik M.;
- Kabra, Saurabh;
- Kockelmann, Winfried;
- Tremsin, Anton
- Article
23
- Journal of Applied Crystallography, 2016, v. 49, n. 5, p. 1579, doi. 10.1107/S160057671601164X
- Onuki, Yusuke;
- Hoshikawa, Akinori;
- Ishigaki, Toru;
- Sato, Shigeo;
- Xu, Pingguang;
- Saito, Yoichi;
- Todoroki, Hidekazu;
- Hayashi, Makoto
- Article
24
- Journal of Applied Crystallography, 2016, v. 49, n. 1, p. 120, doi. 10.1107/S1600576715022943
- Ohhara, Takashi;
- Kiyanagi, Ryoji;
- Oikawa, Kenichi;
- Kaneko, Koji;
- Kawasaki, Takuro;
- Tamura, Itaru;
- Nakao, Akiko;
- Hanashima, Takayasu;
- Munakata, Koji;
- Moyoshi, Taketo;
- Kuroda, Tetsuya;
- Kimura, Hiroyuki;
- Sakakura, Terutoshi;
- Lee, Chang-Hee;
- Takahashi, Miwako;
- Ohshima, Ken-ichi;
- Kiyotani, Tamiko;
- Noda, Yukio;
- Arai, Masatoshi
- Article
25
- Journal of Applied Crystallography, 2015, v. 48, n. 6, p. 1627, doi. 10.1107/S1600576715016520
- Jacobs, Philipp;
- Houben, Andreas;
- Schweika, Werner;
- Tchougréeff, Andrei L.;
- Dronskowski, Richard
- Article
26
- Journal of Applied Crystallography, 2015, v. 48, n. 4, p. 1242, doi. 10.1107/S1600576715012273
- Abbas, Sohrab;
- Désert, Sylvain;
- Brûlet, Annie;
- Thevenot, Vincent;
- Permingeat, Patrice;
- Lavie, Pascal;
- Jestin, Jacques
- Article
27
- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 92, doi. 10.1107/S1600576714025916
- Sales, Morten;
- Plomp, Jeroen;
- Habicht, Klaus;
- Strobl, Markus
- Article
28
- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 220, doi. 10.1107/S1600576714027848
- Adlmann, F. A.;
- Gutfreund, P.;
- Ankner, J. F.;
- Browning, J. F.;
- Parizzi, A.;
- Vacaliuc, B.;
- Halbert, C. E.;
- Rich, J. P.;
- Dennison, A. J. C.;
- Wolff, M.
- Article
29
- Journal of Applied Crystallography, 2014, v. 47, n. 5, p. 1520, doi. 10.1107/S1600576714015830
- Keppler, Ruth;
- Ullemeyer, Klaus;
- Behrmann, Jan H.;
- Stipp, Michael
- Article
30
- Journal of Applied Crystallography, 2014, v. 47, n. 4, p. 1337, doi. 10.1107/S1600576714012710
- Malamud, Florencia;
- Santisteban, Javier R.;
- Vicente Alvarez, Miguel Angel;
- Bolmaro, Raúl;
- Kelleher, Joe;
- Kabra, Saurabh;
- Kockelmann, Winfried
- Article
31
- Journal of Applied Crystallography, 2014, v. 47, n. 4, p. 1228, doi. 10.1107/S1600576714010991
- Müller-Buschbaum, Peter;
- Kaune, Gunar;
- Haese-Seiller, Martin;
- Moulin, Jean-Francois
- Article
32
- Journal of Applied Crystallography, 2014, v. 47, n. 3, p. 974, doi. 10.1107/S1600576714006657
- Bull, Craig L.;
- Johnson, Michael W.;
- Hamidov, Hayrullo;
- Kazuki Komatsu;
- Guthrie, Malcolm;
- Gutmann, Matthias J.;
- Loveday, John S.;
- Nelmes, Richard J.
- Article
33
- European Journal of Forest Research, 2012, v. 131, n. 5, p. 1449, doi. 10.1007/s10342-012-0614-9
- Emms, Grant;
- Nanayakkara, Bernadette;
- Harrington, Jonathan
- Article
34
- Insight: Non-Destructive Testing & Condition Monitoring, 2015, v. 57, n. 1, p. 25, doi. 10.1784/insi.2014.57.1.25
- McGovern, M E;
- Buttlar, W G;
- Reis, H
- Article
35
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 22, p. 1, doi. 10.1049/ell2.13020
- Wang, Yuwei;
- Sun, Peng;
- Wang, Zhi
- Article
36
- Piezoelectrics & Acoustooptics, 2022, v. 44, n. 3, p. 441, doi. 10.11977/j.issn.1004-2474.2022.03.022
- Article
37
- Physics Essays, 2019, v. 32, n. 1, p. 48, doi. 10.4006/0836-1398-32.1.48
- Article
38
- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-85533-7
- Solař, Pavel;
- Kousal, Jaroslav;
- Hanuš, Jan;
- Škorvánková, Kateřina;
- Kuzminova, Anna;
- Kylián, Ondřej
- Article
39
- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-70299-1
- Huang, Qiuliang;
- Shi, Ran;
- Muránsky, Ondrej;
- Beladi, Hossein;
- Kabra, Saurabh;
- Schimpf, Christian;
- Volkova, Olena;
- Biermann, Horst;
- Mola, Javad
- Article
40
- Journal of Construction Engineering & Management, 2013, v. 139, n. 1, p. 69, doi. 10.1061/(ASCE)CO.1943-7862.0000565
- Dai, Fei;
- Rashidi, Abbas;
- Brilakis, Ioannis;
- Vela, Patricio
- Article
41
- International Journal of Metrology & Quality Engineering, 2023, v. 14, p. 1, doi. 10.1051/ijmqe/2023011
- Mimoune, Karim;
- Guillory, Joffray;
- Plimmer, Mark
- Article
42
- Radioengineering, 2012, v. 21, n. 1, p. 533
- Filipík, Adam;
- Jan, Jirí;
- Peterlík, Igor
- Article
43
- Radioengineering, 2012, v. 21, n. 1, p. 533
- Filipík, Adam;
- Jan, Jiří;
- Peterlík, Igor
- Article
44
- Magnetic Resonance in Medical Sciences, 2024, v. 23, n. 1, p. 56, doi. 10.2463/mrms.mp.2021-0170
- Tomoki Amemiya;
- Suguru Yokosawa;
- Yo Taniguchi;
- Ryota Sato;
- Yoshihisa Soutome;
- Hisaaki Ochi;
- Toru Shirai
- Article
45
- Journal of Field Robotics, 2015, v. 32, n. 1, p. 61, doi. 10.1002/rob.21519
- Sun, Kaipeng;
- Heß, Robin;
- Xu, Zhihao;
- Schilling, Klaus
- Article
46
- Radiation Protection Dosimetry, 2023, v. 199, n. 15, p. 1894, doi. 10.1093/rpd/ncac256
- Petit, Michael;
- Chicco, Augusto Di;
- Sardet, Alix;
- Babut, Richard;
- Jacqmin, Robert;
- Stout, Brian
- Article
47
- Photogrammetric Record, 2016, v. 31, n. 156, p. 394, doi. 10.1111/phor.12167
- Lichti, Derek D.;
- Steward, Jeremy;
- Chow, Jacky C. K.;
- Matyas, John
- Article
48
- Photogrammetric Record, 2012, v. 27, n. 138, p. 155, doi. 10.1111/j.1477-9730.2012.00685.x
- Karel, Wilfried;
- Ghuffar, Sajid;
- Pfeifer, Norbert
- Article
49
- Journal of Radioanalytical & Nuclear Chemistry, 2012, v. 294, n. 1, p. 37, doi. 10.1007/s10967-011-1466-3
- Zhou, Y.;
- Zhu, X.;
- Wang, Y.;
- Mitra, S.
- Article
50
- Computer Methods in Biomechanics & Biomedical Engineering, 2012, v. 15, p. 180, doi. 10.1080/10255842.2012.713629
- Samson, W.;
- Van Hamme, A.;
- Sanchez, S.;
- Chèze, L.;
- Van Sint Jan, S.;
- Feipel, V.
- Article