Works matching DE "SEMICONDUCTOR analysis"
1
- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 9-10, p. 990, doi. 10.1007/s00170-005-2585-1
- Mathirajan, M.;
- Sivakumar, A. I.
- Article
2
- Technical Physics Letters, 2006, v. 32, n. 11, p. 913, doi. 10.1134/S1063785006110010
- Bordovskiĭ, G. A.;
- Castro, R. A.;
- Terukov, E. I.
- Article
3
- Materials Research Letters, 2018, v. 6, n. 8, p. 432, doi. 10.1080/21663831.2018.1477848
- Vattikuti, S. V. Prabhakar;
- Nagajyothi, P. C.;
- Anil Kumar Reddy, Police;
- Kotesh Kumar, Mandari;
- Shim, Jaesool;
- Byon, Chan
- Article
4
- Bulletin of the Chemical Society of Ethiopia, 2017, v. 31, n. 3, p. 435, doi. 10.4314/bcse.v31i3.7
- Ding-Wa Zhang;
- Yin-Feng Wang;
- Wen-Tong Chen
- Article
5
- Canadian Journal of Physics, 2015, v. 93, n. 12, p. 1638, doi. 10.1139/cjp-2015-0403
- Zarrinkamar, S.;
- Jahankohan, K.;
- Hassanabadi, H.
- Article
6
- Computer Systems Science & Engineering, 2017, v. 32, n. 3, p. 243
- Article
7
- Philosophical Magazine, 2006, v. 86, n. 29-31, p. 4727, doi. 10.1080/14786430600740641
- Arslan#, I.;
- Bleloch, A.;
- Stach, E. A.;
- Ogut, S.;
- Browning, N. D.
- Article
8
- Russian Physics Journal, 2019, v. 61, n. 9, p. 1667, doi. 10.1007/s11182-018-1585-1
- Abdinov, A. Sh.;
- Babaeva, R. F.
- Article
9
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 4, p. n/a, doi. 10.1002/pssr.201308326
- Zhang, W.;
- Martin, M.;
- Brown, E. R.
- Article
10
- Advanced Energy Materials, 2014, v. 4, n. 1, p. 1, doi. 10.1002/aenm.201300611
- Sun, Yongfu;
- Sun, Zhihu;
- Gao, Shan;
- Cheng, Hao;
- Liu, Qinghua;
- Lei, Fengcai;
- Wei, Shiqiang;
- Xie, Yi
- Article
11
- DESIDOC Journal of Library & Information Technology, 2018, v. 38, n. 1, p. 5, doi. 10.14429/djlit.38.1.12307
- Makhija, Veena;
- Ahuja, Swapnil
- Article
12
- Quality & Reliability Engineering International, 1992, v. 8, n. 2, p. 93, doi. 10.1002/qre.4680080204
- Glacet, J. Y.;
- Dall'Oro, G. Guerri
- Article
13
- International Journal of Advanced Manufacturing Technology, 2018, v. 99, n. 5-8, p. 1503, doi. 10.1007/s00170-018-2414-y
- Singh, Rashmi;
- Mathirajan, M.
- Article
14
- Russian Physics Journal, 2007, v. 50, n. 4, p. 405, doi. 10.1007/s11182-007-0057-9
- Khabibullin, I. Kh.;
- Smidt, E. V.;
- Shul'gin, D. E.;
- Matukhin, V. L.
- Article
15
- Nature, 1999, v. 397, n. 6715, p. 139, doi. 10.1038/16420
- Kikkawa, J.M.;
- Awschalom, D.D.
- Article
16
- Nature, 1999, v. 397, n. 6715, p. 121, doi. 10.1038/16393
- Friend, R.H.;
- Gymer, R.W.;
- Holmes, A. B.;
- Burroughes, J. H.;
- Marks, R. N.;
- Taliani, C.;
- Bradley, D. D. C.;
- Dos Santos, D. A.;
- Brédas, J. L.;
- Lögdlund, M.;
- Salaneck, W. R.
- Article
17
- Nature, 1998, v. 392, n. 6676, p. 582, doi. 10.1038/33369
- Ho, Kai-Ming;
- Shvartsburg, Alexandre A.;
- Pan, Bicai;
- Lu, Zhong-Yi;
- Wang, Cai-Zhuang;
- Wacker, Jacob G.;
- Fye, James L.;
- Jarrold, Martin F.
- Article
18
- Instruments & Experimental Techniques, 2009, v. 52, n. 1, p. 65, doi. 10.1134/S0020441209010102
- Nasibov, A.;
- Berezhnoi, K.;
- Shapkin, P.;
- Reutova, A.;
- Shunailov, S.;
- Yalandin, M.
- Article
19
- Technical Electrodynamics / Tekhnichna Elektrodynamika, 2020, n. 3, p. 69, doi. 10.15407/techned2020.03.069
- Шидловська, Н. А.;
- Захарченко, С. М.
- Article
20
- Energies (19961073), 2020, v. 13, n. 1, p. 103, doi. 10.3390/en13010103
- Article
21
- International Journal of Chemical Engineering (1687806X), 2018, p. 1, doi. 10.1155/2018/4715629
- Makarevich, K. S.;
- Zaitsev, A. V.;
- Kaminsky, O. I.;
- Kirichenko, E. A.;
- Astapov, I. A.
- Article
22
- Journal of Electronic Materials, 2009, v. 38, n. 1, p. 54, doi. 10.1007/s11664-008-0528-y
- Takaku, Yoshikazu;
- Makino, Komei;
- Watanabe, Keita;
- Ohnuma, Ikuo;
- Kainuma, Ryosuke;
- Yamada, Yasushi;
- Yagi, Yuji;
- Nakagawa, Ikuo;
- Atsumi, Takashi;
- Ishida, Kiyohito
- Article
23
- Doklady Biochemistry & Biophysics, 2010, v. 430, n. 1, p. 41, doi. 10.1134/S1607672910010126
- Zdobnova, T.;
- Dorofeev, S.;
- Tananaev, P.;
- Zlomanov, V.;
- Stremovskiy, O.;
- Lebedenko, E.;
- Balalaeva, I.;
- Deyev, S.;
- Petrov, R.
- Article
24
- Journal of Intelligent Manufacturing, 2015, v. 26, n. 5, p. 861, doi. 10.1007/s10845-013-0821-3
- Wang, Shengyao;
- Wang, Ling;
- Liu, Min;
- Xu, Ye
- Article
25
- Technical Physics, 2009, v. 54, n. 4, p. 555, doi. 10.1134/S1063784209040173
- Konshina, E. A.;
- Fedorov, M. A.;
- Rybnikova, A. E.;
- Amosova, L. P.;
- Ivanova, N. L.;
- Isaev, M. V.;
- Kostomarov, D. S.
- Article
26
- Technical Physics, 2007, v. 52, n. 1, p. 86, doi. 10.1134/S106378420701015X
- Kheifets, O.;
- Kobelev, L.;
- Melnikova, N.;
- Nugaeva, L.
- Article
27
- Archives of Metallurgy & Materials, 2015, v. 60, n. 2, p. 1051, doi. 10.1515/amm-2015-0258
- Myronchuk, G.L.;
- Zamurueva, O.V.;
- Oźga, K.;
- Szota, M.;
- El-Naggar, A.M.;
- Alzayed, N.S.;
- Piskach, L.V.;
- Parasyuk, O.V.;
- Albassam, A.A.;
- Fedorchuk, A.O.;
- Kityk, I.V.
- Article
28
- DAAAM International Scientific Book, 2013, p. 193, doi. 10.2507/daaam.scibook.2013.08
- Article
29
- Modern Physics Letters B, 2002, v. 16, n. 20, p. 747, doi. 10.1142/S021798490200424X
- Grado-Caffaro, M. A.;
- Grado-Caffaro, M.
- Article
30
- Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
- Sivel, V. G. M.;
- Van Den Brand, J.;
- Wang, W. R.;
- Mohdadi, H.;
- Tichelaar, F. D.;
- Alkemade, P. F. A.;
- Zanbergen, H. W.
- Article
31
- Microchimica Acta, 2018, v. 185, n. 12, p. 1, doi. 10.1007/s00604-018-3054-5
- Ding, Chuanmin;
- Song, Kaijing;
- Meng, Hongyun;
- Zhang, Bing;
- Zhao, Zhihuan;
- Chang, Honghong;
- Wei, Wenlong
- Article
32
- PLoS ONE, 2017, v. 12, n. 8, p. 1, doi. 10.1371/journal.pone.0181559
- McMahon, Christopher J.;
- Toomey, Joshua P.;
- Kane, Deb M.
- Article
33
- Nanoscale Research Letters, 2009, v. 4, n. 4, p. 385, doi. 10.1007/s11671-008-9241-2
- Article
34
- JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2019, v. 71, n. 1, p. 246, doi. 10.1007/s11837-018-3140-5
- Kim, Si Joon;
- Mohan, Jaidah;
- Summerfelt, Scott R.;
- Kim, Jiyoung
- Article
35
- Angewandte Chemie, 2017, v. 129, n. 11, p. 3082, doi. 10.1002/ange.201612423
- An, Yang;
- Liu, Yuanyuan;
- An, Pengfei;
- Dong, Juncai;
- Xu, Benyan;
- Dai, Ying;
- Qin, Xiaoyan;
- Zhang, Xiaoyang;
- Whangbo, Myung ‐ Hwan;
- Huang, Baibiao
- Article
36
- Advanced Functional Materials, 2017, p. n/a, doi. 10.1002/adfm.201702448
- Huang, Wenjuan;
- Gan, Lin;
- Yang, Haotian;
- Zhou, Nan;
- Wang, Renyan;
- Wu, Wanhui;
- Li, Huiqiao;
- Ma, Ying;
- Zeng, Haibo;
- Zhai, Tianyou
- Article
37
- Advanced Functional Materials, 2017, v. 27, n. 9, p. n/a, doi. 10.1002/adfm.201604163
- Huang, Jia;
- Du, Juan;
- Cevher, Zehra;
- Ren, Yuhang;
- Wu, Xiaohan;
- Chu, Yingli
- Article
38
- Advanced Functional Materials, 2017, v. 27, n. 4, p. n/a, doi. 10.1002/adfm.201604286
- Qiao, Xiaolan;
- Wu, Qinghe;
- Wu, Hongzhuo;
- Zhang, Jidong;
- Li, Hongxiang
- Article
40
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 5, p. 1329, doi. 10.1002/pssa.201532680
- Micard, Gabriel;
- Hahn, Giso;
- Terheiden, Barbara
- Article
41
- Applied Physics A: Materials Science & Processing, 2014, v. 114, n. 4, p. 1347, doi. 10.1007/s00339-013-7979-6
- Sbiaa, R.;
- Piramanayagam, S.
- Article
42
- Applied Physics A: Materials Science & Processing, 2006, v. 85, n. 4, p. 457, doi. 10.1007/s00339-006-3701-2
- Article
43
- Materials Transactions, 2021, v. 62, n. 1, p. 105, doi. 10.2320/matertrans.MT-M2020257
- Article
44
- Studia Universitatis Babes-Bolyai, Chemia, 2017, v. 62, n. 1, p. 195, doi. 10.24193/subbchem.2017.1.17
- Article
45
- Digest Journal of Nanomaterials & Biostructures (DJNB), 2013, v. 8, n. 2, p. 573
- Article
46
- Asia-Pacific Management Accounting Journal, 2017, v. 12, n. 2, p. 1
- Kenichi Suzuki;
- Kohsuke Matsuoka;
- Hiromune Ishii
- Article
47
- Plasmonics, 2013, v. 8, n. 1, p. 139, doi. 10.1007/s11468-012-9441-6
- Louro, P.;
- Silva, V.;
- Vieira, M.
- Article
48
- Angewandte Chemie International Edition, 2017, v. 56, n. 13, p. 3611, doi. 10.1002/anie.201700439
- Hu, Dake;
- Xu, Guanchen;
- Xing, Lei;
- Yan, Xingxu;
- Wang, Jingyi;
- Zheng, Jingying;
- Lu, Zhixing;
- Wang, Peng;
- Pan, Xiaoqing;
- Jiao, Liying
- Article
49
- Advances in OptoElectronics, 2008, p. 1, doi. 10.1155/2008/739135
- Donev, E. U.;
- Suh, J. Y.;
- Lopez, R.;
- Feldman, L. C.;
- Haglund Jr., R. F.
- Article
50
- Electronic Device Failure Analysis, 2020, v. 22, n. 2, p. 4, doi. 10.31399/asm.edfa.2020-2.p004
- Khatkhatay, Fauzia;
- Pichumani, Pradip Sairam
- Article