Works matching DE "THICKNESS measurement"
1
- Life (2075-1729), 2025, v. 15, n. 5, p. 822, doi. 10.3390/life15050822
- Pirri, Carmelo;
- Pirri, Nina;
- Guidolin, Diego;
- De Rose, Enrico;
- Macchi, Veronica;
- Porzionato, Andrea;
- De Caro, Raffaele;
- Stecco, Carla
- Article
2
- Indian Journal of Ophthalmology, 2025, v. 73, n. 6, p. 900, doi. 10.4103/IJO.IJO_2300_24
- Yadav, Tanya;
- Panigrahi, Pradeep Kumar;
- Pattnaik, Lolly;
- Sahoo, Lulup Kumar
- Article
3
- Advanced Energy Materials, 2025, v. 15, n. 20, p. 1, doi. 10.1002/aenm.202405028
- Perju, Audrey;
- Zhang, Danzhen;
- Wang, Ruocun John;
- Taberna, Pierre‐Louis;
- Gogotsi, Yury;
- Simon, Patrice
- Article
4
- Soft Materials, 2014, v. 12, p. S14, doi. 10.1080/1539445X.2014.930046
- Micciulla, Samantha;
- Sánchez, Pedro A.;
- Smiatek, Jens;
- Qiao, Baofu;
- Sega, Marcello;
- Laschewsky, André;
- Holm, Christian;
- von Klitzing, Regine
- Article
5
- Soft Materials, 2006, v. 4, n. 2-4, p. 287, doi. 10.1080/15394450701310251
- Bakumov, Vadym;
- Schwarz, Marcus;
- Kroke, Edwin
- Article
6
- Polar Research, 2017, v. 36, n. 1, p. N.PAG, doi. 10.1080/17518369.2017.1411140
- Selyuzhenok, Valeria;
- Mahoney, Andrew;
- Krumpen, Thomas;
- Castellani, Giulia;
- Gerdes, Rüdiger
- Article
7
- 2020
- Ozdemir, Ibrahim;
- Çevik, Serdar
- journal article
8
- South African Journal of Geology, 2015, v. 118, n. 3, p. 311, doi. 10.2113/gssajg.118.3.311
- BORDY, E. M.;
- ERIKSSON, P.
- Article
9
- South African Journal of Geology, 2015, v. 118, n. 3, p. 225, doi. 10.2113/gssajg.118.3.225
- SCHEIBER-ENSLIN, S. E.;
- EBBING, J.;
- WEBB, S. J.
- Article
10
- Journal of Assisted Reproduction & Genetics, 2019, v. 36, n. 11, p. 2217, doi. 10.1007/s10815-019-01576-w
- Ranisavljevic, Noemie;
- Raad, Jade;
- Anahory, Tal;
- Grynberg, Michaël;
- Sonigo, Charlotte
- Article
11
- Journal of Assisted Reproduction & Genetics, 2011, v. 28, n. 11, p. 1135, doi. 10.1007/s10815-011-9640-7
- Youm, Hyun;
- Choi, Young;
- Han, Hyuck
- Article
12
- Aeronautical Journal, 2013, v. 117, n. 1193, p. 687, doi. 10.1017/S000192400000837X
- Atli-Veltin, B.;
- Gandhi, F.
- Article
13
- Aeronautical Journal, 2007, v. 111, n. 1126, p. 777, doi. 10.1017/S0001924000001895
- Bhargava, A.;
- Shivakumar, K. N.
- Article
14
- Surface Engineering, 2018, v. 34, n. 2, p. 146, doi. 10.1080/02670844.2016.1237080
- Miao, B.;
- Li, J. C.;
- Liu, H.;
- Wei, W.;
- Hu, J.
- Article
15
- Surface Engineering, 2018, v. 34, n. 2, p. 158, doi. 10.1080/02670844.2016.1274097
- Sehgal, T.;
- Semwal, A.;
- Maity, G.;
- Patel, Shiv P.
- Article
16
- Surface Engineering, 2016, v. 32, n. 3, p. 178, doi. 10.1179/1743294415Y.0000000028
- Liu, J.;
- Xu, B.;
- Wang, H.;
- Cui, X.;
- Zhu, L.;
- Jin, G.
- Article
17
- Surface Engineering, 2015, v. 31, n. 2, p. 85, doi. 10.1179/1743294414Y.0000000254
- Wasy, A.;
- Balakrishnan, G.;
- Lee, S.;
- Kim, J.-K.;
- Kim, T. G.;
- Song, J. I.
- Article
18
- Surface Engineering, 2014, v. 30, n. 6, p. 451, doi. 10.1179/1743294413Y.0000000164
- Koivuluoto, Heli;
- Vuoristo, Petri
- Article
19
- Surface Engineering, 2014, v. 30, n. 2, p. 142, doi. 10.1179/1743294413Y.0000000218
- Shin, H-G.;
- Jeon, S.;
- Choi, Y.;
- Song, J-K.;
- Lee, H.
- Article
20
- Surface Engineering, 2014, v. 30, n. 2, p. 109, doi. 10.1179/1743294413Y.0000000223
- Saraloğlu Güler, E.;
- Karakaya, İshak;
- Konca, Erkan
- Article
21
- Surface Engineering, 2014, v. 30, n. 2, p. 102, doi. 10.1179/1743294413Y.0000000225
- Khan, R. H. U.;
- Yerokhin, A. L.;
- Li, X.;
- Dong, H.;
- Matthews, A.
- Article
22
- Surface Engineering, 2013, v. 29, n. 8, p. 584, doi. 10.1179/1743294413Y.0000000167
- Ghosh, D;
- Shukla, A K;
- Mitra, S K
- Article
23
- Surface Engineering, 2013, v. 29, n. 4, p. 287, doi. 10.1179/1743294412Y.0000000091
- Mandal, P;
- Beake, B D;
- Paul, S
- Article
24
- Surface Engineering, 2013, v. 29, n. 4, p. 276, doi. 10.1179/1743294412Y.0000000103
- Liu, Y;
- Yu, X;
- Ma, L;
- Wang, C B;
- Hua, M
- Article
25
- Surface Engineering, 2012, v. 28, n. 9, p. 705, doi. 10.1179/1743294412Y.0000000030
- Liu, H X;
- Wang, K;
- Zhang, C;
- Li, P;
- Gao, Y Y;
- Hu, Y;
- Wang, X
- Article
26
- Surface Engineering, 2012, v. 28, n. 9, p. 667, doi. 10.1179/1743294412Y.0000000048
- Hedayati, K;
- Nabiyouni, G;
- Jafari, G R
- Article
27
- Surface Engineering, 2012, v. 28, n. 5, p. 313, doi. 10.1179/1743294411Y.0000000079
- Fernandes, F A P;
- Heck, S C;
- Picon, C A;
- Totten, G E;
- Casteletti, L C
- Article
28
- Surface Engineering, 2012, v. 28, n. 4, p. 237, doi. 10.1179/1743294411Y.0000000016
- Santana, Y Y;
- La Barbera-Sosa, J G;
- Bencomo, A;
- Lesage, J;
- Chicot, D;
- Bemporad, E;
- Puchi-Cabrera, E S;
- Staia, M H
- Article
29
- Surface Engineering, 2012, v. 28, n. 1, p. 44, doi. 10.1179/1743294411Y.0000000035
- Kumar Bulasara, V;
- Mahesh Babu, Ch S N;
- Uppaluri, R
- Article
30
- Surface Engineering, 2011, v. 27, n. 10, p. 775, doi. 10.1179/174329408X326335
- Mohan, S;
- Saravanan, G;
- Renganathan, N G
- Article
31
- Surface Engineering, 2011, v. 27, n. 9, p. 690, doi. 10.1179/1743294410Y.0000000019
- Protsenko, V S;
- Gordiienko, V O;
- Danilov, F I;
- Kwon, S C;
- Kim, M;
- Lee, J Y
- Article
32
- Surface Engineering, 2011, v. 27, n. 8, p. 634, doi. 10.1179/1743294411Y.0000000010
- Article
33
- Surface Engineering, 2011, v. 27, n. 8, p. 616, doi. 10.1179/026708410X12786785573436
- Chen, C W;
- Chen, D Y;
- Hsu, C Y;
- Chang, Y H;
- Hou, K H
- Article
34
- Surface Engineering, 2011, v. 27, n. 8, p. 587, doi. 10.1179/026708410X12683118611220
- Niu, L;
- Xu, Y;
- Wu, H;
- Wang, W
- Article
35
- Surface Engineering, 2011, v. 27, n. 8, p. 595, doi. 10.1179/026708410X12786785573157
- Fares, M L;
- Talhi, A;
- Chaoui, K;
- Touhami, M Z
- Article
36
- Surface Engineering, 2011, v. 27, n. 8, p. 609, doi. 10.1179/1743294411Y.0000000034
- Article
37
- Surface Engineering, 2011, v. 27, n. 7, p. 491, doi. 10.1179/026708410X12786785573355
- Warcholinski, B;
- Gilewicz, A
- Article
38
- Surface Engineering, 2011, v. 27, n. 6, p. 470, doi. 10.1179/1743294411Y.0000000023
- Yilbas, B S;
- Akhtar, S S;
- Karatas, C
- Article
39
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15761, doi. 10.1007/s10854-018-9240-8
- Uribe-Vargas, Hector;
- Molina-Reyes, Joel;
- Romero-Morán, Alejandra;
- Ortega, Eduardo;
- Ponce, Arturo
- Article
40
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15693, doi. 10.1007/s10854-018-9174-1
- Thanikaikarasan, Sethuramachandran;
- Perumal, Rajagembu;
- Mahalingam, Thaiyan
- Article
41
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16239, doi. 10.1007/s10854-017-7527-9
- Bai, Yuhang;
- Li, Chen;
- Wu, Di
- Article
42
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 19, p. 14763, doi. 10.1007/s10854-017-7345-0
- Gupta, Swati;
- Gaikwad, Anil;
- Mahajan, Ashok
- Article
43
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5603, doi. 10.1007/s10854-016-6228-0
- Lu, Mengxue;
- Shi, Chengwu;
- Ma, Chengfeng;
- Li, Nannan;
- Li, Long;
- Xiao, Guannan
- Article
44
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3254, doi. 10.1007/s10854-016-5916-0
- Ojo, A.;
- Salim, H.;
- Olusola, O.;
- Madugu, M.;
- Dharmadasa, I.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12891, doi. 10.1007/s10854-016-5425-1
- Sahdan, M.;
- Malek, M.;
- Alias, M.;
- Kamaruddin, S.;
- Norhidayah, C.;
- Sarip, N.;
- Nafarizal, N.;
- Rusop, M.
- Article
46
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9107, doi. 10.1007/s10854-016-4945-z
- Ge, Mengxing;
- Liu, Zhidong;
- Shen, Lida;
- Ding, Hao;
- Chen, Haoran;
- Tian, Zongjun
- Article
47
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9891, doi. 10.1007/s10854-016-5058-4
- Nair, Induja;
- Varma, Manoj;
- Sebastian, Mailadil
- Article
48
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 4062, doi. 10.1007/s10854-015-4264-9
- Sruthi, S.;
- Adarsh, A.;
- Veronica, Asmita;
- Saideep, Muskeri;
- Dutta, Soma
- Article
49
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7873, doi. 10.1007/s10854-015-3438-9
- Sun, Xigui;
- Gao, Kewei;
- Pang, Xiaolu;
- Yang, Huisheng;
- Volinsky, Alex
- Article
50
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2411, doi. 10.1007/s10854-015-2699-7
- Tekgül, Atakan;
- Alper, Mursel;
- Kockar, Hakan;
- Haciismailoglu, Murside
- Article