Works matching DE "SEMICONDUCTOR switches"
1
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15339, doi. 10.1007/s10854-019-01907-8
- Tian, Liqiang;
- Zhang, Lin;
- Li, Enbang;
- Ji, Weili;
- Horvat, Josip;
- Cao, J. C.;
- Shi, We;
- Zhang, Chao
- Article
2
- Measurement Techniques, 2024, v. 67, n. 9, p. 653, doi. 10.1007/s11018-025-02385-7
- Sakharov, Konstantin Yu.;
- Turkin, Vladimir A.;
- Mikheev, Oleg V.;
- Sukhov, Alexander V.
- Article
3
- Automation & Remote Control, 2017, v. 78, n. 12, p. 2232, doi. 10.1134/S0005117917120116
- Article
4
- Advanced Electronic Materials, 2022, v. 8, n. 12, p. 1, doi. 10.1002/aelm.202200850
- Guo, Anan;
- Bai, Hui;
- Liang, Qi;
- Feng, Liping;
- Su, Xianli;
- Van Tendeloo, Gustaaf;
- Wu, Jinsong
- Article
5
- Advanced Electronic Materials, 2022, v. 8, n. 8, p. 1, doi. 10.1002/aelm.202101161
- Farronato, Matteo;
- Melegari, Margherita;
- Ricci, Saverio;
- Hashemkhani, Shahin;
- Bricalli, Alessandro;
- Ielmini, Daniele
- Article
6
- Advanced Electronic Materials, 2020, v. 6, n. 2, p. N.PAG, doi. 10.1002/aelm.201900958
- Casa Branca, Nuno;
- Deuermeier, Jonas;
- Martins, Jorge;
- Carlos, Emanuel;
- Pereira, Maria;
- Martins, Rodrigo;
- Fortunato, Elvira;
- Kiazadeh, Asal
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600404
- Kim, Hae Jin;
- Yoon, Kyung Jean;
- Park, Tae Hyung;
- Kim, Han Joon;
- Kwon, Young Jae;
- Shao, Xing Long;
- Kwon, Dae Eun;
- Kim, Yu Min;
- Hwang, Cheol Seong
- Article
8
- Technical Physics Letters, 2023, v. 49, p. S116, doi. 10.1134/S1063785023900522
- Rozhkov, A. V.;
- Ivanov, M. S.;
- Rodin, P. B.
- Article
9
- Stochastic Models, 2017, v. 33, n. 3, p. 430, doi. 10.1080/15326349.2017.1312446
- Perel, Efrat;
- Yechiali, Uri
- Article
10
- Electric Power Components & Systems, 2008, v. 36, n. 12, p. 1253, doi. 10.1080/15325000802258059
- AGHDAM, M. G. HOSSEINI;
- FATHI, S. H.;
- GHAREHPETIAN, G. B.
- Article
11
- Electric Power Components & Systems, 2008, v. 36, n. 4, p. 409, doi. 10.1080/15325000701658532
- Jurado, F.;
- Ortega, M.;
- Cano, A.
- Article
12
- Electric Power Components & Systems, 2006, v. 34, n. 11, p. 1177, doi. 10.1080/15325000600698415
- Al-Majali, Hussein D.;
- Al-Dhalaan, Sulaiman M.
- Article
13
- Electric Power Components & Systems, 2002, v. 30, n. 2, p. 167, doi. 10.1080/153250002753427842
- Chan, T. K.;
- Morcos, M. M.
- Article
14
- AIMS Energy, 2021, v. 9, n. 5, p. 991, doi. 10.3934/energy.2021045
- YAQOBI, Mohammad Aman;
- Hidehito Matayoshi;
- Prabaharan, Natarajan;
- Hiroshi Takahashi;
- Hemeida, Ashraf M.;
- Senjyu Tomonobu
- Article
15
- Photonics, 2025, v. 12, n. 2, p. 152, doi. 10.3390/photonics12020152
- Zong, Jiawei;
- Shi, Yating;
- Qian, Guang;
- Wang, Jinpeng;
- Wei, Zelu;
- Kong, Yuechan;
- Zhang, Jingwen;
- Chen, Tangsheng
- Article
16
- Archives for Technical Sciences / Arhiv za Tehnicke Nauke, 2021, n. 24, p. 9, doi. 10.7251/afts.2021.1324.009B
- Vladimir, Babenko;
- Alexandr, Danilov;
- Dmitrii, Vasenin;
- Valery, Krysanov
- Article
17
- Al-Rafadain Engineering Journal, 2011, v. 19, n. 1, p. 1
- Article
18
- Progress in Electromagnetics Research M, 2014, v. 38, p. 123, doi. 10.2528/pierm14073002
- Bansal, Deepak;
- Kumar, Amit;
- Kumar, Prem;
- Kaur, Maninder;
- Rangra, Kamaljit
- Article
19
- Australian Journal of Electrical & Electronic Engineering, 2022, v. 19, n. 2, p. 149, doi. 10.1080/1448837X.2021.2023073
- Zeghoudi, A.;
- Bendaoud, A.;
- Slimani, H.;
- Benazza, B.;
- Bennouna, D.
- Article
20
- EE: Evaluation Engineering, 2009, v. 48, n. 4, p. 44
- Article
21
- EE: Evaluation Engineering, 2009, v. 48, n. 4, p. 26
- Article
23
- ComputerWorld Hong Kong, 2008, v. 25, n. 9, p. 26
- Article
24
- ComputerWorld Hong Kong, 2008, v. 25, n. 2, p. 25
- Article
25
- ComputerWorld Hong Kong, 2007, v. 24, n. 10, p. 34
- Article
26
- ComputerWorld Hong Kong, 2007, v. 24, n. 10, p. 27
- Article
27
- IET Electric Power Applications (Wiley-Blackwell), 2024, v. 18, n. 2, p. 160, doi. 10.1049/elp2.12376
- Verkroost, Lynn;
- Vande Ghinste, Alexander;
- da Rocha, Lorrana Faria;
- De Kooning, Jeroen D. M.;
- De Belie, Frederik;
- Sergeant, Peter;
- Olsen, Pål Keim;
- Vansompel, Hendrik
- Article
28
- Journal Européen des Systèmes Automatisés, 2020, v. 53, n. 2, p. 249, doi. 10.18280/jesa.530212
- Shaik, Gouse Basha;
- Mani, Venkatesan;
- Mopidevi, Subbarao
- Article
29
- Mathematical Modelling of Engineering Problems, 2021, v. 8, n. 5, p. 769, doi. 10.18280/mmep.080512
- Bhoopal, Neerudi;
- Rao, Dokku Sivanaga Malleswara;
- Narukullapati, Bharath Kumar;
- Kasireddy, Idamakanti;
- Kumar, Devineni Gireesh
- Article
30
- Photonics, 2023, v. 10, n. 2, p. 156, doi. 10.3390/photonics10020156
- Wu, Meilin;
- Shi, Wei;
- Ma, Cheng;
- Chen, Zhiyuan;
- Liu, Hui
- Article
31
- Photonics, 2021, v. 8, n. 9, p. 385, doi. 10.3390/photonics8090385
- Ma, Cheng;
- Wu, Meilin;
- Wang, Wennan;
- Jia, Yaqiong;
- Shi, Wei
- Article
32
- Instruments & Experimental Techniques, 2024, v. 67, n. 5, p. 929, doi. 10.1134/S0020441224701562
- Korotkov, S. V.;
- Zhmodikov, A. L.;
- Korotkov, D. A.
- Article
33
- Instruments & Experimental Techniques, 2021, v. 64, n. 4, p. 529, doi. 10.1134/S0020441221040138
- Arzev, A. G.;
- Galakhov, I. V.;
- Ganin, L. S.;
- Grishanin, A. V.;
- Eliseev, V. V.;
- Kartaev, V. N.;
- Kozhenkov, E. V.;
- Krekov, A. V.;
- Martynenko, V. A.;
- Muskatn'ev, V. G.;
- Naumov, D. A.;
- Nemaev, D. Yu.;
- Osin, V. A.;
- Sviridov, V. V.;
- Frolov, O. V.;
- Khapugin, A. A.
- Article
34
- Instruments & Experimental Techniques, 2020, v. 63, n. 4, p. 467, doi. 10.1134/S0020441220040168
- Nosov, G. V.;
- Nosova, M. G.
- Article
35
- Instruments & Experimental Techniques, 2011, v. 54, n. 5, p. 695, doi. 10.1134/S0020441211040208
- Fridman, B.;
- Li, Baoming;
- Belyakov, V.;
- Enikeev, R.;
- Kovrizhnykh, N.;
- Kryukov, Yu.;
- Roshal', A.;
- Serebrov, R.
- Article
36
- Instruments & Experimental Techniques, 2010, v. 53, n. 6, p. 830, doi. 10.1134/S0020441210060114
- Vasil'ev, P.;
- Lyubutin, S.;
- Pedos, M.;
- Ponomarev, A.;
- Rukin, S.;
- Slovikovskii, B.;
- Timoshenkov, S.;
- Cholakh, S.
- Article
37
- Instruments & Experimental Techniques, 2009, v. 52, n. 5, p. 699, doi. 10.1134/S0020441209050108
- Korotkov, S.;
- Aristov, Yu.;
- Voronkov, V.;
- Zhmodikov, A.;
- Kozlov, A.;
- Korotkov, D.;
- Lyublinskii, A.
- Article
38
- Instruments & Experimental Techniques, 2009, v. 52, n. 5, p. 695, doi. 10.1134/S0020441209050091
- Korotkov, S.;
- Aristov, Yu.;
- Voronkov, V.;
- Zhmodikov, A.;
- Korotkov, D.;
- Lyublinskii, A.
- Article
39
- Instruments & Experimental Techniques, 2007, v. 50, n. 2, p. 224, doi. 10.1134/S0020441207020091
- Aristov, Yu.;
- Voronkov, V.;
- Grekhov, I.;
- Kozlov, A.;
- Korotkov, S.;
- Lyublinskii, A.
- Article
40
- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-02751-9
- Rusevich, L. L.;
- Tyunina, M.;
- Kotomin, E. A.;
- Nepomniashchaia, N.;
- Dejneka, A.
- Article
41
- International Journal of Electrical Engineering Education, 2019, v. 56, n. 4, p. 348, doi. 10.1177/0020720918815999
- Article
42
- International Journal of Electrical Engineering Education, 2008, v. 45, n. 4, p. 356, doi. 10.7227/IJEEE.45.4.8
- Sahoo, N. C.;
- Vejian, R.;
- Gobbi, R.
- Article
43
- EE: Evaluation Engineering, 2014, v. 53, n. 3, p. 8
- Article
44
- EE: Evaluation Engineering, 2013, v. 52, n. 3, p. 8
- Article
45
- Semiconductors, 2019, v. 53, n. 4, p. 519, doi. 10.1134/S1063782619040183
- Article
46
- Semiconductors, 2010, v. 44, n. 11, p. 1529, doi. 10.1134/S1063782610110291
- Gorbatyuk, A.;
- Grekhov, I.;
- Gusin, D.
- Article
47
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2160, doi. 10.1007/s11664-016-4357-0
- Hao, Chenglong;
- Wang, Xiaofeng;
- Yin, Yajiang;
- You, Zheng
- Article
48
- Journal of Electronic Materials, 2008, v. 37, n. 4, p. 540, doi. 10.1007/s11664-008-0389-4
- Article
49
- Journal of Electronic Materials, 2008, v. 37, n. 2, p. 157, doi. 10.1007/s11664-007-0318-y
- Kalkan, N.;
- Yildirim, S.;
- Ulutas, K. Ulutas;
- Deger, D.
- Article
50
- Journal of Materials Science: Materials in Electronics, 2024, v. 35, n. 23, p. 1, doi. 10.1007/s10854-024-13318-5
- Rehman, Naveed Ur;
- Khan, Rajwali;
- Rahman, Nasir;
- Ahmad, Iftikhar;
- Ullah, Aziz;
- Sohail, Mohammad;
- Iqbal, Shahid;
- Althubeiti, Khaled;
- Al Otaibi, Sattam;
- Juraev, Nizomiddin;
- Safeen, Akif;
- Rehman, Ziaur
- Article