Works matching DE "METROLOGY"


Results: 2006
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    White beam topography of 300 mm Si wafers.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 269, doi. 10.1007/s10854-007-9480-5
    By:
    • Danilewsky, A. N.;
    • Wittge, J.;
    • Rack, A. T.;
    • Weitkamp, T.;
    • Simon, R.;
    • Baumbach, T.;
    • McNally, P.
    Publication type:
    Article
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    Band offset diagnostics of advanced dielectrics.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 73, doi. 10.1007/s10854-007-9558-0
    By:
    • Edelman, Piotr;
    • Wilson, Marshall;
    • D’Amico, John;
    • Savtchouk, Alexandre;
    • Lagowski, Jacek
    Publication type:
    Article
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    Fundamental physics and absolute positioning metrology with the MAGIA lunar orbiter.

    Published in:
    Experimental Astronomy, 2011, v. 32, n. 1, p. 19, doi. 10.1007/s10686-010-9195-0
    By:
    • Dell'Agnello, Simone;
    • Lops, Caterina;
    • Monache, Giovanni;
    • Currie, Douglas;
    • Martini, Manuele;
    • Vittori, Roberto;
    • Coradini, Angioletta;
    • Dionisio, Cesare;
    • Garattini, Marco;
    • Boni, Alessandro;
    • Cantone, Claudio;
    • March, Riccardo;
    • Bellettini, Giovanni;
    • Tauraso, Roberto;
    • Maiello, Mauro;
    • Porcelli, Luca;
    • Berardi, Simone;
    • Intaglietta, Nicola
    Publication type:
    Article
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    Money Metrology.

    Published in:
    Measurement Techniques, 2021, v. 63, n. 12, p. 993, doi. 10.1007/s11018-021-01883-8
    By:
    • Krutikov, V. N.;
    • Okrepilov, V. V.
    Publication type:
    Article
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