Works matching DE "ELECTRIC network analyzers"
1
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1168, doi. 10.1007/s10854-016-5642-7
- Zhao, Shuang;
- Zheng, Ji;
- Shi, Biao;
- He, Lihua;
- Liu, Zhongyi
- Article
2
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12701, doi. 10.1007/s10854-016-5404-6
- Ozturk, Turgut;
- Uluer, İhsan;
- Ünal, İlhami
- Article
3
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4963, doi. 10.1007/s10854-015-3008-1
- Wang, Yang;
- Zuo, Ruzhong;
- Zhang, Jian;
- Qi, Shishun;
- Zhang, Tianwen
- Article
4
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 1127, doi. 10.1007/s10854-013-1699-8
- Unnimaya, A.;
- Suresh, E.;
- Dhanya, J.;
- Ratheesh, R.
- Article
5
- Measurement Techniques, 2016, v. 59, n. 7, p. 765, doi. 10.1007/s11018-016-1044-8
- Savin, A.;
- Guba, V.;
- Bykova, O.
- Article
6
- Electric Power Components & Systems, 2006, v. 34, n. 2, p. 191, doi. 10.1080/15325000500244708
- SELVAN, M. P.;
- SWARUP, K. S.
- Article
7
- Australian Journal of Electrical & Electronic Engineering, 2016, v. 13, n. 3, p. 195, doi. 10.1080/1448837X.2017.1321870
- Alshabo, Ahmed;
- Stirling, David;
- Ros, Montserrat;
- Vial, Peter James;
- Wysocki, Beata Joanna;
- Wysocki, Tadeusz Antoni;
- Sasso, Nicholas Dal
- Article
8
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 8
- Article
9
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 24
- Article
10
- EE: Evaluation Engineering, 2011, v. 50, n. 1, p. 8
- Article
12
- EE: Evaluation Engineering, 2009, v. 48, n. 4, p. 18
- Article
14
- EE: Evaluation Engineering, 2006, v. 45, n. 11, p. 12
- Article
15
- EE: Evaluation Engineering, 2006, v. 45, n. 10, p. 20
- Article
18
- Perl Review, 2005, v. 1, n. 2, p. 16
- Article
19
- Revista de Ingeniería, 2009, n. 30, p. 49, doi. 10.16924/revinge.30.6
- Zapata, Carlos J.;
- Ríos, Mario;
- Gómez, Oscar
- Article
20
- Optical & Quantum Electronics, 2018, v. 50, n. 1, p. 1, doi. 10.1007/s11082-017-1283-1
- Huang, Huamao;
- Xie, Xin;
- Wen, Rulian;
- Chen, Zeliang;
- Wang, Chao;
- Wang, Hong
- Article
21
- International Journal of RF & Microwave Computer-Aided Engineering, 2003, v. 13, n. 1, p. 74, doi. 10.1002/mmce.10064
- Pannala, Sreemala;
- Swaminathan, Madhavan
- Article
22
- International Journal of RF & Microwave Computer-Aided Engineering, 2002, v. 12, n. 1, p. 3, doi. 10.1002/mmce.10014
- Jargon, Jeffrey A.;
- Gupta, K. C.;
- DeGroot, Donald C.
- Article
23
- International Journal of RF & Microwave Computer-Aided Engineering, 2001, v. 11, n. 1, p. 33, doi. 10.1002/1099-047X(200101)11:1<33::AID-MMCE4>3.0.CO;2-C
- Jargon, J. A.;
- Gupta, K. C.
- Article
24
- International Journal of RF & Microwave Computer-Aided Engineering, 2000, v. 10, n. 5, p. 319, doi. 10.1002/1099-047X(200009)10:5<319::AID-MMCE7>3.0.CO;2-5
- Jargon, Jeffrey A.;
- Gupta, K. C.;
- DeGroot, Donald C.
- Article
25
- Eastern-European Journal of Enterprise Technologies, 2013, v. 4, n. 9, p. 8
- Article
26
- Journal of Microwaves, Optoelectronics & Electromagnetic Applications, 2015, v. 14, n. 1, p. AoP40, doi. 10.1590/2179-10742015v14i1425
- Alkhoder, Assal;
- Abboud, Fariz
- Article
27
- International Journal of Performability Engineering, 2010, v. 6, n. 1, p. 63
- Article
29
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 10
- Article
30
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 6
- Article
34
- EE: Evaluation Engineering, 2017, v. 56, n. 8, p. 24
- Article
38
- EE: Evaluation Engineering, 2014, v. 53, n. 6, p. 32
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 2, p. 369, doi. 10.1007/s11664-013-2867-6
- Yang, Jie;
- Jiao, Xiangquan;
- Zhang, Rui;
- Zhong, Hui;
- Shi, Yu;
- Du, Bo
- Article
40
- Computer Systems Science & Engineering, 2016, v. 31, n. 4, p. 303
- Angius, Alessio;
- Horváth, András;
- Halawani, Sami M.;
- Barukab, Omar;
- Ahmad, Ab Rahman;
- Balbo, Gianfranco
- Article
41
- Computational Economics, 2018, v. 51, n. 3, p. 571, doi. 10.1007/s10614-016-9624-x
- Halkos, George E.;
- Tsilika, Kyriaki D.
- Article
42
- Microwave & Optical Technology Letters, 2004, v. 40, n. 6, p. 444, doi. 10.1002/mop.20001
- Chahine, S. Abou;
- Huyart, B.
- Article
43
- Microwave & Optical Technology Letters, 2000, v. 24, n. 1, p. 63, doi. 10.1002/(SICI)1098-2760(20000105)24:1<63::AID-MOP18>3.0.CO;2-2
- Boulejfen, N.;
- Kouki, A. B.;
- Ghannouchi, F. M.
- Article
44
- Microwave & Optical Technology Letters, 1995, v. 9, n. 5, p. 266, doi. 10.1002/mop.4650090512
- Yeo, S. P.;
- Cheng, M.;
- Bannister, D. J.;
- Ide, J. P.
- Article
45
- Microwave & Optical Technology Letters, 1995, v. 8, n. 2, p. 84, doi. 10.1002/mop.4650080209
- Abou Chahine, S.;
- Huyart, B.;
- Bergeault, E.;
- Jallet, L.
- Article
46
- Microwave & Optical Technology Letters, 1993, v. 6, n. 2, p. 104, doi. 10.1002/mop.4650060206
- Mathew, K. T.;
- Raveendranath, U.
- Article
47
- Microwave & Optical Technology Letters, 1991, v. 4, n. 9, p. 376, doi. 10.1002/mop.4650040913
- Cao Jiang;
- Sun Jia;
- Qishao Zhang
- Article
48
- Defence Technology, 2018, v. 14, n. 5, p. 477, doi. 10.1016/j.dt.2018.07.010
- Xu-dong Cai;
- Xiao-jun Jiang;
- Wei Xie;
- Jing-yang Mu;
- De-fei Yin
- Article
49
- Journal of Measurement Science & Instrumentation, 2013, v. 4, n. 4, p. 317, doi. 10.3969/j.issn.1674-8042.2013.04.003
- Article
50
- Concurrency & Computation: Practice & Experience, 2006, v. 18, n. 15, p. 1975, doi. 10.1002/cpe.1040
- Feng, Xizhou;
- Ge, Rong;
- Cameron, Kirk W.
- Article