Works matching Refraction (Optics)
1
- Symmetry (20738994), 2024, v. 16, n. 11, p. 1548, doi. 10.3390/sym16111548
- Article
2
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 168, doi. 10.1002/j.2168-0159.2014.tb00046.x
- Xu, Daming;
- Chen, Yuan;
- Liu, Yifan;
- Wu, Shin‐Tson;
- Cheng, Yu‐Wen;
- Cheng, Wei‐Yuan;
- Shiu, Jyh‐Wen;
- Liou, Shih‐Hsien;
- Cheng, Kung‐Lung;
- Chen, Janglin
- Article
3
- Caderno Brasileiro de Ensino de Física, 2024, v. 46, p. 1, doi. 10.1590/1806-9126-RBEF-2024-0241
- Cardoso, G. S.;
- Sigaud, L.;
- Penello, G. M.;
- Moreira, W.;
- Maslova, K.;
- de Jesus, V. L. B.
- Article
4
- Canadian Journal of Physics, 2004, v. 82, n. 3, p. 177, doi. 10.1139/p03-123
- Article
5
- Science & Technology in Ocular Health & Vision / Ciencia y Tecnología para la Salud Visual y Ocular, 2023, v. 21, n. 1, p. 32, doi. 10.19052/sv.vol21.iss1.4
- García-Lozada, Diana;
- Rudas-Valero, José;
- Acosta-Martínez, Reinaldo;
- Sánchez-Espinosa, Jenny Maritza;
- Mendivelso-Suárez, Alejandra;
- Morales-Solano, Lady Johana
- Article
6
- Clinical Endocrinology, 2015, v. 83, n. 6, p. 843, doi. 10.1111/cen.12794
- Wikiera, Beata;
- Mulak, Malgorzata;
- Koltowska‐Haggstrom, Maria;
- Noczynska, Anna
- Article
7
- Journal of Sensors, 2015, v. 2015, p. 1, doi. 10.1155/2015/729507
- Zhang, Zhijun;
- Zhang, Shiwei
- Article
8
- Journal of Supercomputing, 2024, v. 80, n. 8, p. 10746, doi. 10.1007/s11227-023-05790-3
- Kundu, Rohit;
- Chattopadhyay, Soumitri;
- Nag, Sayan;
- Navarro, Mario A.;
- Oliva, Diego
- Article
9
- Contemporary Physics, 2015, v. 56, n. 1, p. 2, doi. 10.1080/00107514.2015.971625
- Article
10
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 2, p. 235, doi. 10.15407/spqeo20.02.235
- Article
11
- Military Engineer / Hadmérnök, 2012, v. 7, n. 4, p. 109
- Article
12
- American Orthoptic Journal, 2005, v. 55, p. 158, doi. 10.3368/aoj.55.1.158
- Article
13
- Transactions of the American Philosophical Society, 2018, v. 107, n. 1, p. 1
- Article
14
- Education Sciences, 2023, v. 13, n. 5, p. 467, doi. 10.3390/educsci13050467
- Fyttas, George;
- Komis, Vassilis;
- Kaliampos, George;
- Ravanis, Konstantinos
- Article
15
- Journal of Modern Optics, 2005, v. 52, n. 13, p. 1871, doi. 10.1080/09500340500141706
- Article
16
- Asia-Pacific Forum on Science Learning & Teaching, 2017, v. 18, n. 1, p. 1
- Article
18
- Nano Convergence, 2017, v. 4, n. 1, p. 1, doi. 10.1186/s40580-017-0129-7
- Tanaka, Takuo;
- Ishikawa, Atsushi
- Article
19
- Applied Physics B: Lasers & Optics, 1997, v. 65, n. 4/5, p. 499, doi. 10.1007/s003400050303
- Papazoglou, D.G.;
- Apostolidis, A.G.;
- Vanidhis, E.D.
- Article
20
- Acta Ophthalmologica (1755375X), 2016, v. 94, n. 7, p. 712, doi. 10.1111/aos.13085
- Raffa, Lina H.;
- Dahlgren, Jovanna;
- Hellström, Ann;
- Andersson Grönlund, Marita
- Article
21
- JCMS: Journal of Cinema & Media Studies, 2025, v. 64, n. 3, p. 168, doi. 10.1353/cj.2025.a960494
- Article
22
- Computer Animation & Virtual Worlds, 2007, v. 18, n. 4/5, p. 539, doi. 10.1002/cav.213
- Changbo Wang;
- Zhangye Wang;
- Qunsheng Peng
- Article
23
- 2013
- Cumurcu, Birgul Elbozan;
- Cumurcu, Tongabay;
- Keser, Sinem;
- Gunduz, Abuzer;
- Kartalci, Sukru
- Abstract
24
- CEE: Chemical Engineering Education, 2010, v. 44, n. 2, p. 134
- COUTINHO, CECIL A.;
- MANKIDY, BIJITH D.;
- GUPTA, VINAY K.
- Article
25
- Surface Engineering, 2009, v. 25, n. 3, p. 257, doi. 10.1179/026708408X329498
- Yao, J. K.;
- Huang, H. L.;
- Ma, J. Y.;
- Jin, Y. X.;
- Zhao, Y. A.;
- Shao, J. D.;
- He, H. B.;
- Yi, K.;
- Fan, Z. X.;
- Zhang, F.;
- Wu, Z. Y.
- Article
26
- Marine Geophysical Research, 2013, v. 34, n. 1, p. 17, doi. 10.1007/s11001-012-9164-2
- Yang, Fanlin;
- Li, Jiabiao;
- Han, Litao;
- Liu, Zhimin
- Article
27
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 3, p. 739, doi. 10.1007/s10854-011-0481-z
- Mathew, S.;
- Saran, Amit;
- Joseph, Santhi;
- Bhardwaj, Bishwajeet;
- Punj, Deep;
- Radhakrishnan, P.;
- Nampoori, V.;
- Vallabhan, C.;
- Bellare, Jayesh
- Article
28
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 170, doi. 10.1007/s10854-007-9499-7
- Fotsing-Djouwe, Isabelle Christiane;
- Gagné, Mathieu;
- Laurin, Jean-Jacques;
- Kashyap, Raman
- Article
29
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 153, doi. 10.1007/s10854-007-9496-x
- Abdel-Rahman, Ehab;
- Shaarawi, Amr
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 584, doi. 10.1007/s10854-007-9393-3
- Ardelean, Ioan;
- Cora, Simona
- Article
31
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 327, doi. 10.1007/s10854-007-9212-x
- Nemova, Galina;
- Kashyap, Raman
- Article
32
- Journal of Mathematical Biology, 2014, v. 68, n. 5, p. 1249, doi. 10.1007/s00285-013-0670-x
- Meijer, Hil;
- Coombes, Stephen
- Article
33
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 4, p. 198, doi. 10.1134/S1061830915040051
- Korkh, Yu.;
- Perov, D.;
- Rinkevich, A.
- Article
34
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 9, p. 515, doi. 10.1134/S1061830914090022
- Article
35
- Measurement Techniques, 2023, v. 66, n. 8, p. 593, doi. 10.1007/s11018-023-02272-z
- Vasilyuk, Nikolay N.;
- Nefedov, Grigorii A.;
- Sidorova, Ekaterina A.;
- Shagimuratova, Natalya O.
- Article
36
- Measurement Techniques, 2023, v. 66, n. 3, p. 168, doi. 10.1007/s11018-023-02206-9
- Yurin, A. I.;
- Vishnyakov, G. N.;
- Minaev, V. L.
- Article
37
- Measurement Techniques, 2018, v. 61, n. 6, p. 604, doi. 10.1007/s11018-018-1471-9
- Pavlov, I. N.;
- Raskovskaya, I. L.;
- Yurkevichyus, S. P.
- Article
38
- Measurement Techniques, 2017, v. 59, n. 10, p. 1084, doi. 10.1007/s11018-017-1096-4
- Raskovskaya, I.;
- Rinkevichyus, B.;
- Tolkachev, A.
- Article
39
- Measurement Techniques, 2011, v. 54, n. 1, p. 31, doi. 10.1007/s11018-011-9681-4
- Article
40
- Measurement Techniques, 2009, v. 52, n. 6, p. 636, doi. 10.1007/s11018-009-9320-5
- Article
41
- Measurement Techniques, 2009, v. 52, n. 4, p. 368, doi. 10.1007/s11018-009-9287-2
- V. Nguyen;
- I. Raskovskaya;
- B. Rinkevichius
- Article
42
- Measurement Techniques, 2008, v. 51, n. 7, p. 740, doi. 10.1007/s11018-008-9110-5
- K. Lapitskii;
- I. Raskovskaya;
- B. Rinkevichyus
- Article
43
- Measurement Techniques, 2008, v. 51, n. 3, p. 317, doi. 10.1007/s11018-008-9028-y
- Article
44
- Measurement Techniques, 2007, v. 50, n. 4, p. 384, doi. 10.1007/s11018-007-0079-2
- Article
45
- Measurement Techniques, 2007, v. 50, n. 1, p. 44, doi. 10.1007/s11018-007-0020-8
- Article
46
- Astrophysics, 2011, v. 54, n. 3, p. 371, doi. 10.1007/s10511-011-9186-5
- Article
47
- Inorganic Materials, 2015, v. 51, n. 8, p. 811, doi. 10.1134/S002016851508018X
- Stepanov, B.;
- Shenina, M.;
- Antonov, I.;
- Churbanov, M.
- Article
48
- Inorganic Materials, 2008, v. 44, n. 12, p. 1372, doi. 10.1134/S0020168508120200
- Zhukova, L.;
- Primerov, N.;
- Korsakov, A.;
- Chazov, A.
- Article
49
- Journal of Cosmetic & Laser Therapy, 2017, v. 19, n. 4, p. 199, doi. 10.1080/14764172.2017.1288261
- Chen, Kee-Hsin;
- Tam, Ka-Wai;
- Chen, I-fan;
- Huang, Shihping Kevin;
- Tzeng, Pei-Chuan;
- Wang, Hsian-Jenn;
- Chen, Chiehfeng (Cliff)
- Article
50
- i-Manager's Journal on Image Processing, 2021, v. 8, n. 2, p. 9, doi. 10.26634/jip.8.2.18323
- REDDY, M. VASUDEVA;
- RAMASHRI, T.
- Article