Works matching DE "KIRKENDALL effect"
1
- Metals (2075-4701), 2025, v. 15, n. 5, p. 533, doi. 10.3390/met15050533
- Xu, Jiahao;
- Gong, Xinyue;
- Zhao, Wanxiang;
- Sun, Chao;
- Shan, Guibin;
- Liu, Huan;
- Song, Dan
- Article
2
- Coatings (2079-6412), 2025, v. 15, n. 5, p. 532, doi. 10.3390/coatings15050532
- Luo, Zhen;
- Wang, Xingqi;
- Liu, Yuyang;
- Wang, Xingming
- Article
3
- Revista Cubana de Física, 2010, v. 27, n. 2B, p. 224
- Lukin, M. O'Reilly;
- Iribarren, A.
- Article
4
- Journal of Electronic Materials, 2025, v. 54, n. 2, p. 1029, doi. 10.1007/s11664-024-11619-3
- Yang, Qiuhe;
- Hu, Zhenchun;
- Yang, An;
- Yuan, Y. F.
- Article
5
- Journal of Electronic Materials, 2024, v. 53, n. 12, p. 7858, doi. 10.1007/s11664-024-11482-2
- Weng, Guoqiang;
- Sun, Quan;
- Yang, Boxin;
- Chen, Jianneng;
- Lu, Yebo
- Article
6
- Surface Engineering, 2021, v. 37, n. 10, p. 1223, doi. 10.1080/02670844.2021.1873899
- Zeng, Chunyan;
- Wang, Yong;
- Gao, Chen;
- Liu, Yi
- Article
7
- Surface Engineering, 2011, v. 27, n. 4, p. 259, doi. 10.1179/174329409X439069
- Hosseini, S R;
- Ashrafizadeh, F;
- Kermanpur, A
- Article
8
- Surface Engineering, 2011, v. 27, n. 4, p. 253, doi. 10.1179/174329409X446359
- Wang, Y;
- Guo, H-B;
- Peng, L-Q;
- Gong, S-K
- Article
9
- Chemistry - A European Journal, 2020, v. 26, n. 70, p. 16599, doi. 10.1002/chem.202003180
- Poitiers, Nadine E.;
- Huch, Volker;
- Zimmer, Michael;
- Scheschkewitz, David
- Article
10
- Angewandte Chemie, 2016, v. 128, n. 26, p. 7553, doi. 10.1002/ange.201602653
- Xiao, Wei;
- Zhou, Jing;
- Yu, Le;
- Wang, Dihua;
- Lou, Xiong Wen (David)
- Article
11
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13757, doi. 10.1007/s10854-019-01758-3
- El-Daly, A. A.;
- Zohdy, K. M.;
- Abdo, M. A.;
- Eid, N. A. M.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 12840, doi. 10.1007/s10854-019-01729-8
- Du, Yahong;
- Wen, Ming;
- Ji, Hongjun;
- Li, Mingyu;
- Liu, Zhi-Quan
- Article
13
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 12860, doi. 10.1007/s10854-019-01601-9
- Du, Cheng-Jie;
- Li, Xin;
- Mei, Yun-Hui;
- Lu, Guo-Quan
- Article
14
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12639, doi. 10.1007/s10854-019-01627-z
- Wang, Xiyu;
- Li, Deyu;
- Li, Ning;
- Wang, Rui
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 10, p. 9410, doi. 10.1007/s10854-019-01271-7
- Zhang, Xudong;
- Hu, Xiaowu;
- Jiang, Xiongxin;
- Li, Qinglin;
- Zhou, Liuru
- Article
16
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 7, p. 7065, doi. 10.1007/s10854-019-01023-7
- Khatun, Julekha;
- Adak, Mrinal K.;
- Dhak, Prasanta;
- Ghorai, Uttam K.;
- Dhak, Debasis
- Article
17
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 4, p. 3511, doi. 10.1007/s10854-018-00628-8
- Mao, Hanying;
- Huang, Yuelong;
- Ma, Zhu;
- Jin, Lifen;
- Tian, Liuwen;
- Li, Yuepeng;
- Yu, Hua;
- Peng, Changtao
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13577, doi. 10.1007/s10854-018-9485-2
- Khan, Ayaz Arif;
- Fayaz, Muhammad Umer;
- Khan, Muhammad Nasir;
- Iqbal, Mazhar;
- Majeed, Asif;
- Bilkees, Rehana;
- Mukhtar, Surayya;
- Javed, Muhammad
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 10, p. 8287, doi. 10.1007/s10854-018-8837-2
- Cai, Chongyang;
- An, Rong;
- Wang, Chunqing;
- Tian, Yanhong;
- Ji, Xiaoliang
- Article
20
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 22, p. 17014, doi. 10.1007/s10854-017-7624-9
- Baheti, Varun;
- Kumar, Praveen;
- Paul, Aloke
- Article
21
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16148, doi. 10.1007/s10854-017-7515-0
- Kite, S.;
- Chate, P.;
- Garadkar, K.;
- Sathe, D.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 12839, doi. 10.1007/s10854-017-7111-3
- Zalaoglu, Y.;
- Akkurt, B.;
- Oz, M.;
- Yildirim, G.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 13229, doi. 10.1007/s10854-017-7158-1
- Shi, Yu;
- Pu, Yongping;
- Cui, Yongfei;
- Luo, Yanjie
- Article
24
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1186, doi. 10.1007/s10854-016-5645-4
- Pradhan, S.;
- Das, S.;
- Bhuyan, S.;
- Behera, C.;
- P Choudhary, R.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 13022, doi. 10.1007/s10854-016-5443-z
- Li, W.;
- Jin, H.;
- Yue, W.;
- Tan, M.;
- Zhang, X.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6265, doi. 10.1007/s10854-016-4558-6
- Lin, Yen-Sheng;
- Li, Ching;
- Chang, Yu-Cheng;
- Tseng, Chun-Lung;
- Shen, Ching-Hsing
- Article
27
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2242, doi. 10.1007/s10854-015-4017-9
- Liu, Huan-Huan;
- Li, Li-Ben;
- Zang, Guo-Zhong;
- Wang, Xiao-Fei;
- Zuo, Zheng-Wei
- Article
28
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7378, doi. 10.1007/s10854-015-3367-7
- Article
29
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2782, doi. 10.1007/s10854-015-2759-z
- Yu, Xiao;
- Hu, Xiaowu;
- Li, Yulong;
- Zhang, Ruhua
- Article
30
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 936, doi. 10.1007/s10854-013-1667-3
- Article
31
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 817, doi. 10.1007/s10854-013-1651-y
- Xu, L.;
- Cheng, T.;
- Wang, R.;
- Xiao, H.;
- Liu, G.;
- Yang, C.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 8, p. 2833, doi. 10.1007/s10854-013-1179-1
- Baheti, Varun;
- Ravi, Raju;
- Paul, Aloke
- Article
33
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 7, p. 2558, doi. 10.1007/s10854-013-1133-2
- Article
34
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 12, p. 2306, doi. 10.1007/s10854-012-0832-4
- Article
35
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 12, p. 1841, doi. 10.1007/s10854-011-0371-4
- Meng, Weiqing;
- Zuo, Ruzhong;
- Su, Shi;
- Wang, Xiaohui;
- Li, Longtu
- Article
36
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 9, p. 1308, doi. 10.1007/s10854-011-0305-1
- Han-Byul Kang;
- Jee-Hwan Bae;
- Jeong-Won Yoon;
- Seung-Boo Jung;
- Jongwoo Park;
- Cheol-Woong Yang
- Article
37
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 833, doi. 10.1007/s10854-010-0220-x
- Article
38
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 703, doi. 10.1007/s10854-011-0357-2
- Doosoo Kim;
- Jong-hyeon Chang;
- Jungil Park;
- Pak, James Jungo
- Article
39
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 263, doi. 10.1007/s10854-007-9192-x
- Lucovsky, G.;
- Lüning, J.;
- Fleming, L.;
- Ulrich, M. D.;
- Rowe, J. E.;
- Seo, H.;
- Lee, S.;
- Lysaght, P.;
- Bersuker, G.
- Article
40
- Geotechnical & Geological Engineering, 2024, v. 42, n. 8, p. 7935, doi. 10.1007/s10706-024-02959-2
- Alnmr, Ammar;
- Ray, Richard;
- Alzawi, Mounzer Omran
- Article
41
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2016, v. 16, n. 1, p. 301, doi. 10.1002/pamm.201610139
- Bayerschen, Eric;
- Stricker, Markus;
- Weygand, Daniel;
- Böhlke, Thomas
- Article
42
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2016, v. 16, n. 1, p. 329, doi. 10.1002/pamm.201610153
- Erdle, Hannes;
- Bayerschen, Eric;
- Böhlke, Thomas
- Article
43
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2013, v. 13, n. 1, p. 15, doi. 10.1002/pamm.201310005
- Wulfinghoff, Stephan;
- Bayerschen, Eric;
- Böhlke, Thomas
- Article
44
- Hippocampus, 2019, v. 29, n. 12, p. 1206, doi. 10.1002/hipo.23133
- Foster, Chris M.;
- Kennedy, Kristen M.;
- Hoagey, David A.;
- Rodrigue, Karen M.
- Article
45
- Chemical Engineering Research & Design: Transactions of the Institution of Chemical Engineers Part A, 2023, v. 196, p. 556, doi. 10.1016/j.cherd.2023.07.005
- Valdez-García, Genesis Derith;
- Leyva-Ramos, Roberto
- Article
46
- Chemical Engineering Research & Design: Transactions of the Institution of Chemical Engineers Part A, 2023, v. 194, p. 597, doi. 10.1016/j.cherd.2023.04.054
- Zhang, Zili;
- Wong, Jasper J.;
- Scott, Stuart A.;
- Fennell, Paul S.
- Article
47
- Chemical Engineering Research & Design: Transactions of the Institution of Chemical Engineers Part A, 2023, v. 190, p. 814, doi. 10.1016/j.cherd.2022.12.029
- Bänsch, Eberhard;
- Pflug, Lukas;
- Schikarski, Tobias
- Article
48
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 3, p. 1029, doi. 10.1007/s10008-020-04877-8
- Kosova, Nina V.;
- Podgornova, Olga A.;
- Volfkovich, Yury M.;
- Sosenkin, Valentin E.
- Article
49
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 3, p. 859, doi. 10.1007/s10008-020-04859-w
- Pisarevskaya, E. Yu.;
- Klyuev, A. L.;
- Averin, A. A.;
- Gorbunov, A. M.;
- Efimov, O. N.
- Article
50
- Journal of Solid State Electrochemistry, 2015, v. 19, n. 12, p. 3501, doi. 10.1007/s10008-015-2787-x
- Chen, Hu;
- Maurice, Vincent;
- Klein, Lorena;
- Lapeire, Linsey;
- Verbeken, Kim;
- Terryn, Herman;
- Marcus, Philippe
- Article