Works matching DE "SOLID state electronics"
Results: 2750
Oxide state evaluation of magnesium and calcium in thin metallic film using Auger electron spectroscopy depth profiles.
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- Corrosion Engineering, Science & Technology, 2015, v. 50, n. 8, p. 601, doi. 10.1179/1743278215Y.0000000025
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3D Branched Nanowire‐Coated Macroporous Titania Thin Films for Efficient Perovskite Solar Cells.
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- Advanced Functional Materials, 2018, v. 28, n. 46, p. N.PAG, doi. 10.1002/adfm.201804356
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Hierarchical NiMoS and NiFeS Nanosheets with Ultrahigh Energy Density for Flexible All Solid‐State Supercapacitors.
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- Advanced Functional Materials, 2018, v. 28, n. 35, p. 1, doi. 10.1002/adfm.201803287
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Merging Biology and Solid‐State Lighting: Recent Advances in Light‐Emitting Diodes Based on Biological Materials.
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- Advanced Functional Materials, 2018, v. 28, n. 24, p. 1, doi. 10.1002/adfm.201707011
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Influence of Drawing Conditions on the Ultradrawing Properties of Film Specimens of Ultrahigh Molecular Weight Polyethylene and Low Molecular Weight Polyethylene Blends.
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- Journal of Polymer Research, 2003, v. 10, n. 1, p. 55, doi. 10.1023/A:1023961216058
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Synthesis, Characterization and Reactivity Ratios of Phenylethyl Acrylate/Methacrylate Copolymers.
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- Journal of Polymer Research, 2003, v. 10, n. 1, p. 21, doi. 10.1023/A:1023938301946
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Synthesis and Optical Properties of Poly(BPDA-ODA)/Silica Hybrid Thin Films.
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- Journal of Polymer Research, 2003, v. 10, n. 1, p. 1, doi. 10.1023/A:1023994403763
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Superionic solid: composite electrolyte phase – an overview.
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- Journal of Materials Science, 1999, v. 34, n. 6, p. 1131, doi. 10.1023/A:1004598902146
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Influence of calcination and sintering temperatures on the structure of (Pb1 − xBax )ZrO3.
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- Journal of Materials Science, 1999, v. 34, n. 4, p. 691, doi. 10.1023/A:1004552308815
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Optimal estimates on free boundary propagation in thin-film flow.
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- PAMM: Proceedings in Applied Mathematics & Mechanics, 2014, v. 14, n. 1, p. 745, doi. 10.1002/pamm.201410355
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Modification of electrical conductivity by friction stir processing of aluminum alloys.
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- International Journal of Advanced Manufacturing Technology, 2011, v. 57, n. 5-8, p. 511, doi. 10.1007/s00170-011-3308-4
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Automatic defect inspection for LCDs using singular value decomposition.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 25, n. 1/2, p. 53, doi. 10.1007/s00170-003-1832-6
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A note on equi-integrability in dimension reduction problems.
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- Calculus of Variations & Partial Differential Equations, 2007, v. 29, n. 2, p. 231, doi. 10.1007/s00526-006-0065-6
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Energy asymptotics for Type II superconductors.
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- Calculus of Variations & Partial Differential Equations, 2005, v. 24, n. 3, p. 341, doi. 10.1007/s00526-005-0333-x
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Quantum droplets of electrons and holes.
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- Nature, 2014, v. 506, n. 7489, p. 471, doi. 10.1038/nature12994
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Magnetic-field-controlled reconfigurable semiconductor logic.
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- Nature, 2013, v. 494, n. 7435, p. 72, doi. 10.1038/nature11817
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Room temperature coherent control of defect spin qubits in silicon carbide.
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- Nature, 2011, v. 479, n. 7371, p. 84, doi. 10.1038/nature10562
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Solid-state detonation velocity limits.
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- Combustion, Explosion, & Shock Waves, 2007, v. 43, n. 5, p. 587, doi. 10.1007/s10573-007-0079-1
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Structure and dynamics of surfaces of thin films and water microdroplets.
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- Colloid Journal, 2010, v. 72, n. 5, p. 653, doi. 10.1134/S1061933X1005011X
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The role of interdroplet interaction in the physics of highly concentrated emulsions.
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- Colloid Journal, 2010, v. 72, n. 1, p. 74, doi. 10.1134/S1061933X10010102
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Synthesis and Evaluation of Blends Formed by Polymeric Crown Ethers and a Fullerene-Containing Primary Ammonium Salt in Organic Thin Films.
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- Fullerenes, Nanotubes & Carbon Nanostructures, 2007, v. 15, n. 5, p. 367, doi. 10.1080/15363830701512674
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Solution‐Processed Fabrication of Single‐Walled Carbon Nanotube Field Effect Transistors.
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- Fullerenes, Nanotubes & Carbon Nanostructures, 2005, v. 13, p. 485, doi. 10.1081/FST-200039467
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C 60 Intercalated Graphite: A New Form of Carbon.
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- Fullerenes, Nanotubes & Carbon Nanostructures, 2005, v. 13, p. 427, doi. 10.1081/FST-200039421
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Nanoscale Magnetic Behavior of C<sub>60</sub> Thin Films in Earth Magnetic Field under Polarization Light Influences.
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- Fullerenes, Nanotubes & Carbon Nanostructures, 2005, v. 13, n. 1, p. 53, doi. 10.1081/FST-200041948
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Physical Properties of Holmium Promoted Superconductivity in Nd-Doped YBCO HT<sub>C</sub>-Superconductors.
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- Turkish Journal of Physics, 2006, v. 29, n. 6, p. 329
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New Phases of YBaCuGeO Superconductors Identified from X-ray Diffraction and Infra-red Absorption Measurements.
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- Turkish Journal of Physics, 2005, v. 29, n. 1, p. 33
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The Normal and Inverted Meyer-Neldel Rule in the ac Conductivity.
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- Turkish Journal of Physics, 2004, v. 28, n. 2, p. 133
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Differential impedance of solid-state supercapacitor operating in a hybrid regime.
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- Technical Physics Letters, 2012, v. 38, n. 4, p. 396, doi. 10.1134/S1063785012040256
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Vortex glass state in superconductors with fractal clusters of normal phase.
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- Technical Physics Letters, 2010, v. 36, n. 5, p. 400, doi. 10.1134/S1063785010050032
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Intercalation of iridium atoms into a graphene layer on a metal.
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- Technical Physics Letters, 2009, v. 35, n. 8, p. 740, doi. 10.1134/S106378500908015X
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Enhancement of the transversal magnetooptical Kerr effect in nanoperforated cobalt films.
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- Technical Physics Letters, 2009, v. 35, n. 7, p. 589, doi. 10.1134/S1063785009070025
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Changes in the self-diffusion coefficient during the crystal-melt phase transition.
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- Technical Physics Letters, 2009, v. 35, n. 7, p. 670, doi. 10.1134/S1063785009070244
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Influence of metal-ferroelectric contacts on the space charge formation in ferroelectric thin film capacitors.
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- Technical Physics Letters, 2009, v. 35, n. 7, p. 585, doi. 10.1134/S1063785009070013
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Fluctuation conductivity of Bi<sub>2</sub>Sr<sub>2</sub>CaCu<sub>2</sub>O<sub>8 + δ</sub> in a two-band superconductivity model.
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- Technical Physics Letters, 2009, v. 35, n. 6, p. 521, doi. 10.1134/S1063785009060121
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Effect of the self-organized cluster structure in LaSrMnO films on the slope of the temperature dependence of resistivity.
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- Technical Physics Letters, 2008, v. 34, n. 10, p. 870, doi. 10.1134/S1063785008100180
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Modified laser diffractometer for investigating biological microobjects.
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- Technical Physics Letters, 2008, v. 34, n. 10, p. 878, doi. 10.1134/S1063785008100209
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Reflection electron-energy-loss spectroscopy of Fe<sub> x </sub>Si<sub>1 − x </sub> thin films.
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- Technical Physics Letters, 2008, v. 34, n. 5, p. 381, doi. 10.1134/S1063785008050064
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Effect of cyclic annealing on the static and high-frequency characteristics of YBCO-film-based resonant structures.
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- Technical Physics Letters, 2008, v. 34, n. 5, p. 384, doi. 10.1134/S1063785008050076
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Thermovoltaic effect in thin-film samarium-sulfide-based structures.
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- Technical Physics Letters, 2008, v. 34, n. 4, p. 361, doi. 10.1134/S1063785008040263
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Effect of elastic interactions on the formation of silicon nanocrystals on noncrystalline substrates in microwave low-pressure gas discharge plasma.
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- Technical Physics Letters, 2007, v. 33, n. 4, p. 284, doi. 10.1134/S1063785007040049
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Size effects in nanostructured ferroelectric films.
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- Technical Physics Letters, 2007, v. 33, n. 3, p. 231, doi. 10.1134/S1063785007030145
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Influence of the method of protective oxide formation in a multielement structure on the dark current of a multiscan photodetector.
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- Technical Physics Letters, 2007, v. 33, n. 3, p. 220, doi. 10.1134/S106378500703011X
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Effect of bias voltage on the structure of thin tantalum boride films.
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- Technical Physics Letters, 2007, v. 33, n. 3, p. 190, doi. 10.1134/S1063785007030029
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Photosensitivity of thin-film structures based on CuIn<sub>3</sub>Se<sub>5</sub> and CuIn<sub>5</sub>Se<sub>8</sub> ternary semiconductor compounds.
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- Technical Physics Letters, 2007, v. 33, n. 2, p. 111, doi. 10.1134/S106378500702006X
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Photosensitive point structures based on CuIn<sub>2 m + 1</sub>Se<sub>3 m + 2</sub> crystals.
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- Technical Physics Letters, 2007, v. 33, n. 2, p. 166, doi. 10.1134/S1063785007020228
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Two-fold mechanism of the interaction of incident light with a phase diffraction grating.
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- Technical Physics Letters, 2006, v. 32, n. 12, p. 1071, doi. 10.1134/S1063785006120224
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Dielectric Properties of Al<sub>1.1</sub>Be<sub>0.6</sub>B<sub>22</sub> Crystals.
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- Technical Physics Letters, 2006, v. 32, n. 11, p. 996, doi. 10.1134/S1063785006110277
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Photochromism enhancement in thin RbAg<sub>4</sub>I<sub>5</sub> films using simultaneous hydrogen-induced sensitization.
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- Technical Physics Letters, 2006, v. 32, n. 7, p. 567, doi. 10.1134/S1063785006070054
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A New Method for the Structural Analysis of Thin Island Films.
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- Technical Physics Letters, 2005, v. 31, n. 10, p. 888, doi. 10.1134/1.2121848
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The Magnetic Anisotropy of Thin Epitaxial CrO<sub>2</sub> Films Studied by Ferromagnetic Resonance.
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- Technical Physics Letters, 2005, v. 31, n. 9, p. 802, doi. 10.1134/1.2061752
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