Works matching DE "PIEZOELECTRIC devices"
1
- Actuators, 2025, v. 14, n. 5, p. 212, doi. 10.3390/act14050212
- Liu, Shengyu;
- Liu, Junming;
- Wang, Conghui;
- Zhan, Yang
- Article
2
- Nanomaterials (2079-4991), 2025, v. 15, n. 10, p. 708, doi. 10.3390/nano15100708
- Wu, Lin-Xin;
- Ma, Shi-Jia;
- Li, Meng-Jie;
- Zhang, Xian-Lei;
- Zheng, Gang;
- Liang, Zheng;
- Li, Ru;
- Dong, Hao;
- Zhang, Jun;
- Long, Yun-Ze
- Article
3
- Journal of Oral Implantology, 2025, v. 51, n. 1, p. 14, doi. 10.1563/aaid-joi-D-24-00066
- Alevizakos, Vasilios;
- Friederichs, Aileen;
- Rahlf, Björn;
- Gellrich, Nils-Claudius;
- Jehn, Philipp;
- Schiller, Marcus
- Article
4
- Journal of Oral Implantology, 2024, v. 50, n. 5, p. 537, doi. 10.1563/aaid-joi-D-24-00049
- Kitaygorodskiy, Aleksandr;
- Gregory, Richard L.;
- Lim, Glendale;
- Hamada, Yusuke
- Article
5
- Journal of Oral Implantology, 2019, v. 45, n. 5, p. 356, doi. 10.1563/aaid-joi-D-19-00050
- Stoetzer, Marcus;
- Alevizakos, Vasilios;
- Rahlf, Björn;
- Gellrich, Nils-Claudius;
- Kampmann, Andreas;
- von See, Constantin
- Article
6
- Revista Cubana de Física, 2011, v. 28, n. 2, p. 105
- García-Puente, Y.;
- Santana-Gil, A.;
- Peláiz-Barranco, A.;
- García-Zaldívar, O.;
- Calderón-Piñr, F.;
- García-Wong, A. C.
- Article
7
- Journal of Electronic Materials, 2024, v. 53, n. 12, p. 7621, doi. 10.1007/s11664-024-11475-1
- Barman, Jaydev;
- Sarkar, Madhuparna;
- Mukherjee, Nillohit;
- Das, Sukhen;
- Bag, Rajib;
- Bose, Navonil
- Article
8
- Aeronautical Journal, 2013, v. 117, n. 1196, p. 971, doi. 10.1017/S0001924000008642
- Gresil, M.;
- Giurgiutiu, V.
- Article
9
- Government Technology, 2011, v. 24, n. 5, p. 30
- Article
10
- Surface Engineering, 2011, v. 27, n. 6, p. 403, doi. 10.1179/026708410X12736782825975
- Article
11
- Cartographic Journal, 2003, v. 40, n. 3, p. 294, doi. 10.1179/000870403225013041
- McCallum, Don;
- Rowell, Jonathan;
- Ungar, Simon
- Article
12
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 20, p. 18659, doi. 10.1007/s10854-019-02218-8
- Yin, Baoyi;
- Huan, Yu;
- Wang, Zhenxing;
- Lin, Xiujuan;
- Huang, Shifeng;
- Wei, Tao
- Article
13
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 8, p. 7558, doi. 10.1007/s10854-019-01070-0
- Xia, Mengjie;
- Luo, Cuixian;
- Su, Xiaoxiao;
- Li, Yinhui;
- Li, Pengwei;
- Hu, Jie;
- Li, Gang;
- Jiang, Huabei;
- Zhang, Wendong
- Article
14
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 5, p. 4437, doi. 10.1007/s10854-019-00732-3
- Kaur, Jasleen;
- Singh, Harminder
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14046, doi. 10.1007/s10854-018-9536-8
- Patra, Aniket;
- Sasmal, Abhishek;
- Seal, Anshuman;
- Sen, Shrabanee
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 7, p. 5337, doi. 10.1007/s10854-017-8499-5
- Tan, Zhi;
- Xing, Jie;
- Wu, Jiagang;
- Chen, Qiang;
- Zhang, Wen;
- Zhu, Jianguo;
- Xiao, Dingquan
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 1, p. 784, doi. 10.1007/s10854-017-7973-4
- Goncalves, L. F.;
- Rocha, L. S. R.;
- Longo, E.;
- Simões, A. Z.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 22, p. 17363, doi. 10.1007/s10854-017-7669-9
- Xiong, Yanling;
- Wu, Mingze;
- Yang, Wenlong;
- Chen, Wen;
- Wang, Li;
- Zhou, Zhongxiang
- Article
19
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 5, p. 4458, doi. 10.1007/s10854-016-6075-z
- Ma, Jian;
- Wu, Bo;
- Wu, Wenjuan;
- Chen, Min
- Article
20
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5259, doi. 10.1007/s10854-016-4422-8
- Yu, Lei;
- Hao, Jigong;
- Chu, Ruiqing;
- Xu, Zhijun;
- Du, Juan;
- Li, Wei;
- Yao, Zhongran
- Article
21
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1239, doi. 10.1007/s10854-015-3881-7
- Fan, Tao;
- Zou, Guangping;
- Yang, Lihong
- Article
22
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 606, doi. 10.1007/s10854-015-3795-4
- Zhao, Tian-Long;
- Wang, Chun-Ming;
- Chen, Jianguo;
- Wang, Chun-Lei;
- Dong, Shuxiang
- Article
23
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6843, doi. 10.1007/s10854-015-3299-2
- Fei, Lingjuan;
- Zhou, Zhiyong;
- Hui, Shipeng;
- Dong, Xianlin
- Article
24
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5686, doi. 10.1007/s10854-015-3120-2
- Ji, Wanbin;
- Chu, Ruiqing;
- Xu, Zhijun;
- Hao, Jigong;
- Cheng, Renfei;
- Chen, Xueyan;
- Xu, Yan
- Article
25
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4425, doi. 10.1007/s10854-015-2920-8
- Article
26
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2649, doi. 10.1007/s10854-014-1924-0
- Qiu, Yu;
- Yang, Dechao;
- Lei, Jixue;
- Zhang, Heqiu;
- Ji, Jiuyu;
- Yin, Bing;
- Bian, Jiming;
- Zhao, Yu;
- Hu, Lizhong
- Article
27
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 5, p. 1685, doi. 10.1007/s10854-012-0996-y
- Zhou, Changrong;
- Yang, Huabin;
- Zhou, Qin;
- Chen, Guohua;
- Li, Weizhou;
- Wang, Hua
- Article
28
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 3, p. 927, doi. 10.1007/s10854-012-0851-1
- Zhang, Yangyang;
- Jiang, Shenglin;
- Fan, Maoyan;
- Zeng, Yike;
- Yu, Yan;
- He, Jungang
- Article
29
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 1, p. 331, doi. 10.1007/s10854-012-0750-5
- Hu, Yaobin;
- Liu, Xinyu;
- Jiang, Minhong;
- Zhang, Xiaowen
- Article
30
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 501, doi. 10.1007/s10854-011-0425-7
- Article
31
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 11, p. 1213, doi. 10.1007/s10854-009-0049-3
- Jin Sung Kang;
- Hak Sung Kim;
- Jongeun Ryu;
- Hahn, H. Thomas;
- Seonhee Jang;
- Jae Woo Joung
- Article
32
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1090, doi. 10.1007/s10854-008-9832-9
- Ying Yuan;
- Shuren Zhang;
- Xiaohua Zhou
- Article
33
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1140, doi. 10.1007/s10854-007-9492-1
- Ramam, Koduri;
- Lopez, Marta
- Article
34
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 195, doi. 10.1007/s10854-007-9331-4
- Tilak, V.;
- Jiang, J.;
- Batoni, P.;
- Knobloch, A.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 267, doi. 10.1007/s10854-007-9209-5
- Article
36
- Journal of Materials Science Letters, 2003, v. 22, n. 23, p. 1679, doi. 10.1023/B:JMSL.0000004647.81141.c3
- Lee, Won Gyu;
- Yang, O-Bong
- Article
37
- Cellulose, 2021, v. 28, n. 10, p. 6323, doi. 10.1007/s10570-021-03896-6
- Ram, Farsa;
- Biswas, Bipul;
- Torris, Arun;
- Kumaraswamy, Guruswamy;
- Shanmuganathan, Kadhiravan
- Article
38
- Biomedical Microdevices, 2008, v. 10, n. 3, p. 329, doi. 10.1007/s10544-007-9140-9
- Motoo, Kohei;
- Toda, Naoya;
- Arai, Fumihito;
- Fukuda, Toshio;
- Sekiyama, Kosuke;
- Nakajima, Masahiro
- Article
39
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2015, v. 15, n. 1, p. 407, doi. 10.1002/pamm.201510194
- Merkel, Eugen;
- Ricoeur, Andreas
- Article
40
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2014, v. 14, n. 1, p. 307, doi. 10.1002/pamm.201410141
- Krüger, Thomas;
- Ams, Alfons
- Article
41
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2014, v. 14, n. 1, p. 191, doi. 10.1002/pamm.201410083
- Article
42
- Continuum Mechanics & Thermodynamics, 2018, v. 30, n. 2, p. 267, doi. 10.1007/s00161-017-0599-1
- Marin, Marin;
- Öchsner, Andreas
- Article
43
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 4, p. 197, doi. 10.1134/S1061830916040057
- Konovalov, S.;
- Kuz'menko, A.
- Article
44
- 2015
- Potapov, A.;
- Polyakov, V.;
- Syasko, V.;
- Popov, A.;
- Kurianova, P.
- Erratum
45
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 7, p. 387, doi. 10.1134/S1061830915070049
- Article
46
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 1, p. 22, doi. 10.1134/S1061830915010088
- Zaitseva, N.;
- Stepanov, B.
- Article
47
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 11, p. 642, doi. 10.1134/S1061830914110059
- Konovalov, S.;
- Kuz'menko, A.
- Article
48
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 7, p. 399, doi. 10.1134/S1061830913070061
- Mel'kanovich, A.;
- Konovalov, S.
- Article
49
- Russian Journal of Nondestructive Testing, 2012, v. 48, n. 10, p. 584, doi. 10.1134/S1061830912100063
- Konovalov, S.;
- Kuz'menko, A.
- Article
50
- Russian Journal of Nondestructive Testing, 2012, v. 48, n. 7, p. 418, doi. 10.1134/S1061830912070017
- Article