Works matching DE "MOLECULAR beam epitaxy"
1
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4291, doi. 10.1007/s11664-024-11673-x
- Hardy, Matthew T.;
- Lang, Andrew C.;
- Hart, James L.;
- Jin, Eric N.;
- Nepal, Neeraj;
- Gokhale, Vikrant J.;
- Downey, Brian P.;
- Katzer, D. Scott;
- Litwin, Peter M.;
- Sales, Maria Gabriela;
- Growden, Tyler A.;
- Wheeler, Virginia D.
- Article
2
- Journal of Electronic Materials, 2025, v. 54, n. 4, p. 2913, doi. 10.1007/s11664-025-11772-3
- Cao, Hechun;
- Zhao, Dongyang;
- Hu, Tao;
- Zheng, Yunzhe;
- Bai, Wei;
- Chen, Yan;
- Yang, Jing;
- Zhang, Yuanyuan;
- Cheng, Yan;
- Huang, Rong;
- Tang, Xiaodong;
- Wang, Jianlu;
- Chu, Junhao
- Article
3
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 5803, doi. 10.1007/s11664-024-11082-0
- Saxena, P. K.;
- Srivastava, P.;
- Srivastava, A.
- Article
4
- Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2789, doi. 10.1007/s11664-024-10952-x
- Sarney, Wendy L.;
- Ji, Mihee;
- Leff, Asher C.;
- Larkin, LeighAnn S.;
- Garrett, Gregory A.;
- Sampath, Anand V.;
- Wraback, Michael
- Article
5
- Surface Engineering, 2012, v. 28, n. 7, p. 540, doi. 10.1179/1743294412Y.0000000014
- Hu, B;
- Man, B Y;
- Liu, M;
- Chen, C S;
- Gao, X G;
- Xu, S C;
- Wang, C C
- Article
6
- Surface Engineering, 2004, v. 20, n. 3, p. 205, doi. 10.1179/026708404225015040
- Ramamoorthy, K.;
- Jayachandran, M.;
- Sankaranarayanan, K.;
- Ganesan, V.;
- Misra, P.;
- Kukreja, L. M.;
- Sanjeeviraja, C.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15654, doi. 10.1007/s10854-019-01947-0
- Wang, Ruqing;
- Wang, Jinwei;
- He, Guofang;
- Yang, Donghai;
- Zhang, Weicai;
- Liu, Juncheng
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 5, p. 3927, doi. 10.1007/s10854-017-8332-1
- Ghosh, Kankat;
- Sarkar, Ritam;
- Bhunia, Swagata;
- Laha, Apurba
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1939, doi. 10.1007/s10854-017-8104-y
- Sertel, T.;
- Ozen, Y.;
- Cetin, S. S.;
- Ozturk, M. K.;
- Ozcelik, S.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16215, doi. 10.1007/s10854-017-7523-0
- Zhang, Zhiyuan;
- Huang, Jingyun;
- Chen, Shanshan;
- Pan, Xinhua;
- Chen, Lingxiang;
- Ye, Zhizhen
- Article
11
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 11046, doi. 10.1007/s10854-017-6888-4
- Wang, Minhuan;
- Fan, Lele;
- Bian, Jiming;
- Zhang, Dong;
- Liu, Hongzhu;
- Sun, Hongjun;
- Luo, Yingmin
- Article
12
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7429, doi. 10.1007/s10854-017-6432-6
- Xu, Yuan;
- Chang, Benkang;
- Chen, Liang;
- Chen, Xinlong;
- Qian, Yunsheng
- Article
13
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9341, doi. 10.1007/s10854-016-4974-7
- Zhang, Xu;
- Liu, Zhi;
- He, Chao;
- Cheng, Buwen;
- Xue, Chunlai;
- Li, Chuanbo;
- Wang, Qiming
- Article
14
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 4285, doi. 10.1007/s10854-015-2980-9
- Kuo, Shou-Yi;
- Chen, Wei-Chun;
- Yang, Jui-Fu;
- Hsiao, Chien-Nan;
- Lai, Fang-I
- Article
15
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2480, doi. 10.1007/s10854-015-2709-9
- Fan, Jenn-Chyuan;
- Lo, Yun-Yo;
- Huang, Man-Fang;
- Chen, Wei-Chi;
- Liu, Chien-Chen;
- Lee, C.;
- Chiang, Yu-Chia
- Article
16
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1197, doi. 10.1007/s10854-014-1709-5
- Ma, Quan-Bao;
- Lieten, Ruben;
- Borghs, Gustaaf
- Article
17
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 9, p. 3371, doi. 10.1007/s10854-013-1257-4
- Bhat, Thirumaleshwara;
- Rajpalke, Mohana;
- Roul, Basanta;
- Kumar, Mahesh;
- Krupanidhi, S.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 5, p. 1635, doi. 10.1007/s10854-012-0987-z
- Fan, Dongsheng;
- Zeng, Zhaoquan;
- Dorogan, Vitaliy;
- Hirono, Yusuke;
- Li, Chen;
- Mazur, Yuriy;
- Yu, Shui-Qing;
- Johnson, Shane;
- Wang, Zhiming;
- Salamo, Gregory
- Article
19
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1799, doi. 10.1007/s10854-012-0665-1
- Riordan, Nathaniel;
- Gogineni, Chaturvedi;
- Johnson, Shane;
- Lu, Xianfeng;
- Tiedje, Tom;
- Ding, Ding;
- Zhang, Yong-Hang;
- Fritz, Rafael;
- Kolata, Kolja;
- Chatterjee, Sangam;
- Volz, Kerstin;
- Koch, Stephan
- Article
20
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 972, doi. 10.1007/s10854-011-0529-0
- Article
21
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1024, doi. 10.1007/s10854-010-0104-0
- Kang Min Kim;
- Krishnamurthy, Daivasigamani;
- Yuji Sakai;
- Jong-Uk Seo;
- Hasegawa, Shigehiko;
- Asahi, Hajime
- Article
22
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 425, doi. 10.1007/s10854-008-9661-x
- Ibáñez, J.;
- Alarcón-Lladó, E.;
- Cuscó, R.;
- Artús, L.;
- Fowler, D.;
- Patanè, A.;
- Uesugi, K.;
- Suemune, I.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 68, doi. 10.1007/s10854-007-9540-x
- Herms, Martin;
- Zeimer, Ute;
- Sonia, Gnanapragasam;
- Brunner, Frank;
- Richter, Eberhard;
- Weyers, Markus;
- Tränkle, Günther;
- Behm, Thomas;
- Irmer, Gert;
- Pensl, Gerhard;
- Denker, Andrea;
- Opitz-Coutureau, Jörg
- Article
24
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 96, doi. 10.1007/s10854-008-9657-6
- Nasi, L.;
- Bocchi, C.;
- Germini, F.;
- Prezioso, M.;
- Gombia, E.;
- Mosca, R.;
- Frigeri, P.;
- Trevisi, G.;
- Seravalli, L.;
- Franchi, S.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 347, doi. 10.1007/s10854-008-9656-7
- Piotrowski, T.;
- Kaczmarczyk, M.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 805, doi. 10.1007/s10854-007-9453-8
- Lahourcade, Lise;
- Bellet-Amalric, Edith;
- Monroy, Eva;
- Chauvat, Marie Pierre;
- Ruterana, Pierre
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 311, doi. 10.1007/s10854-007-9335-0
- Kakemoto, Hirofumi;
- Higuchi, Tohru;
- Shibata, Hajime;
- Wada, Satoshi;
- Tsurumi, Takaaki
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 131, doi. 10.1007/s10854-007-9305-6
- Usui, Hiroyuki;
- Yasuda, Hidehiro;
- Mori, Hirotaro
- Article
29
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 11, p. 1157, doi. 10.1007/s10854-007-9255-z
- Mejía-García, C.;
- Winter, A.;
- López-López, M.;
- Gilinsky, A.;
- Pascher, H.
- Article
30
- Journal of Materials Science Letters, 2003, v. 22, n. 6, p. 483, doi. 10.1023/A:1022992502295
- Shen, D.;
- Au, S.Y.;
- Han, G.;
- Que, D.;
- Wang, N.;
- Sou, I. K.
- Article
31
- Computational Mechanics, 2023, v. 72, n. 5, p. 927, doi. 10.1007/s00466-023-02319-6
- Pan, Qing;
- Zhang, Jin;
- Rabczuk, Timon;
- Chen, Chong;
- Yang, Xiaofeng
- Article
32
- Measurement Techniques, 2010, v. 53, n. 6, p. 615, doi. 10.1007/s11018-010-9550-6
- Burlakov, I.;
- Demin, A.;
- Levin, G.;
- Piskunov, N.;
- Zabotnov, S.;
- Kashuba, A.
- Article
33
- Inorganic Materials, 2020, v. 56, n. 1, p. 66, doi. 10.1134/S0020168520010070
- Kostryukov, V. F.;
- Mittova, I. Ya.;
- Ali, Saud
- Article
34
- Inorganic Materials, 2019, v. 55, n. 4, p. 315, doi. 10.1134/S0020168519040095
- Ladugin, M. A.;
- Andreev, A. Yu.;
- Yarotskaya, I. V.;
- Ryaboshtan, Yu. L.;
- Bagaev, T. A.;
- Padalitsa, A. A.;
- Marmalyuk, A. A.;
- Vasil'ev, M. G.
- Article
35
- Inorganic Materials, 2014, v. 50, n. 5, p. 443, doi. 10.1134/S0020168514050136
- Nuriyev, I.;
- Nazarov, A.;
- Sadygov, R.;
- Hajiyev, M.
- Article
36
- Inorganic Materials, 2013, v. 49, n. 8, p. 749, doi. 10.1134/S0020168513070108
- Matveev, S.;
- Denisov, S.;
- Chalkov, V.;
- Shengurov, V.;
- Nikolichev, D.;
- Boryakov, A.;
- Trushin, V.;
- Pitirimova, E.
- Article
37
- Inorganic Materials, 2012, v. 48, n. 7, p. 665, doi. 10.1134/S0020168512070126
- Permikina, E.;
- Kashuba, A.;
- Arbenina, V.
- Article
38
- Inorganic Materials, 2010, v. 46, n. 10, p. 1065, doi. 10.1134/S0020168510100079
- Selivanov, Yu. G.;
- Chizhevskii, E. G.;
- Martovitskiy, V. P.;
- Knotko, A. V.;
- Zasavitskii, I. I.
- Article
39
- Inorganic Materials, 2009, v. 45, n. 1, p. 13, doi. 10.1134/S0020168509010038
- Yakushev, M.;
- Babenko, A.;
- Sidorov, Yu.
- Article
40
- Inorganic Materials, 2008, v. 44, n. 11, p. 1157, doi. 10.1134/S0020168508110010
- Filatov, D. O.;
- Kruglova, M. V.;
- Isakov, M. A.;
- Siprova, S. V.;
- Marychev, M. O.;
- Shengurov, V. G.;
- Chalkov, V. Yu.;
- Denisov, S. A.
- Article
41
- Inorganic Materials, 2007, v. 43, n. 4, p. 331, doi. 10.1134/S0020168507040012
- Denisov, S.;
- Svetlov, S.;
- Chalkov, V.;
- Shengurov, V.;
- Pavlov, D.;
- Korotkov, E.;
- Pitirimova, E.;
- Trushin, V.
- Article
42
- Inorganic Materials, 2005, v. 41, n. 11, p. 1131, doi. 10.1007/s10789-005-0273-z
- Shengurov, V. G.;
- Svetlov, S. P.;
- Chalkov, V. Yu.;
- Gorshenin, G. N.;
- Shengurov, D. V.;
- Denisov, S. A.
- Article
43
- Inorganic Materials, 2003, v. 39, n. 1, p. 3, doi. 10.1023/A:1021822715712
- Shengurov, V.G.;
- Svetlov, S.P.;
- Chalkov, V. Yu.;
- Andreev, B.A.;
- Krasil'nik, Z.F.;
- Ber, B. Ya.;
- Drozdov, Yu. N.
- Article
44
- Micro & Nano Letters (Wiley-Blackwell), 2020, v. 15, n. 1, p. 41, doi. 10.1049/mnl.2019.0167
- Chakraborty, Debraj;
- Maity, Biswajit;
- Mukherjee, Moumita
- Article
45
- Micro & Nano Letters (Wiley-Blackwell), 2019, v. 14, n. 10, p. 1052, doi. 10.1049/mnl.2018.5825
- Dazheng Chen;
- Yu Xu;
- Zhiyuan An;
- Zhe Li;
- Chunfu Zhang
- Article
46
- NPJ 2D Materials & Applications, 2025, v. 9, n. 1, p. 1, doi. 10.1038/s41699-025-00535-7
- Hilse, Maria;
- Rodriguez, Justin;
- Gray, Jennifer;
- Yao, Jinyuan;
- Ding, Shaoqing;
- Liu, Derrick Shao Heng;
- Li, Mo;
- Young, Joshua;
- Liu, Ying;
- Engel-Herbert, Roman
- Article
47
- Advanced Electronic Materials, 2023, v. 9, n. 3, p. 1, doi. 10.1002/aelm.202201193
- Chai, Jixing;
- Liu, Qianhu;
- Chen, Liang;
- Cao, Ben;
- Kong, Deqi;
- Lin, Tingjun;
- Wang, Wenliang;
- Li, Guoqiang
- Article
48
- Advanced Electronic Materials, 2022, v. 8, n. 4, p. 1, doi. 10.1002/aelm.202101103
- Hodgson, Peter D.;
- Lane, Dominic;
- Carrington, Peter J.;
- Delli, Evangelia;
- Beanland, Richard;
- Hayne, Manus
- Article
49
- Advanced Electronic Materials, 2022, v. 8, n. 3, p. 1, doi. 10.1002/aelm.202100927
- Wu, Rongting;
- Wu, Ze‐Bin;
- Božović, Ivan
- Article
50
- Advanced Electronic Materials, 2022, v. 8, n. 1, p. 1, doi. 10.1002/aelm.202100777
- Rio Calvo, Marta;
- Rodriguez, Jean‐Baptiste;
- Cornet, Charles;
- Cerutti, Laurent;
- Ramonda, Michel;
- Trampert, Achim;
- Patriarche, Gilles;
- Tournié, Éric
- Article