Works matching DE "SILICON nitride"
1
- Nanomaterials (2079-4991), 2025, v. 15, n. 10, p. 731, doi. 10.3390/nano15100731
- Butt, Muhammad A.;
- Imran Akca, B.;
- Mateos, Xavier
- Article
2
- Nanomaterials (2079-4991), 2025, v. 15, n. 10, p. 705, doi. 10.3390/nano15100705
- Maier, Christian;
- Egger, Larissa;
- Köck, Anton;
- Becker, Sören;
- Niehaus, Jan Steffen;
- Reichmann, Klaus
- Article
3
- Biosensors (2079-6374), 2025, v. 15, n. 5, p. 287, doi. 10.3390/bios15050287
- Zhao, Lihuan;
- Wang, Jiajun;
- Wu, Lin-Sheng;
- Zhao, Xin
- Article
4
- Solid State Technology, 2001, v. 44, n. 11, p. 26
- Article
5
- Solid State Technology, 2001, v. 44, n. 4, p. 75
- Levy, Sagy;
- Boom, Robin;
- Lam, James;
- Kepten, Avishai
- Article
6
- Solid State Technology, 2000, v. 43, n. 4, p. 79
- Laxman, Ravi K.;
- Anderson, Timothy D.;
- Mestemacher, John A.
- Article
7
- Journal of Electronic Materials, 2025, v. 54, n. 2, p. 1228, doi. 10.1007/s11664-024-11601-z
- Ji, Xiaoli;
- Chen, Fan;
- Liu, Jian;
- Ma, Qianqian;
- Qiao, Ruochen;
- Xu, Zhihao
- Article
8
- Journal of Electronic Materials, 2024, v. 53, n. 9, p. 5212, doi. 10.1007/s11664-024-11228-0
- Kanika;
- Jaggi, Neena;
- Saini, Than Singh
- Article
9
- Surface Engineering, 2021, v. 37, n. 8, p. 1043, doi. 10.1080/02670844.2021.1908738
- Wang, Ping;
- Ma, Qun;
- Chen, Xiaomin;
- Zhang, Chunqing
- Article
10
- Surface Engineering, 2020, v. 36, n. 7, p. 745, doi. 10.1080/02670844.2020.1730062
- Rukhande, Sanjay W.;
- Rathod, W. S.
- Article
11
- Surface Engineering, 2020, v. 36, n. 7, p. 770, doi. 10.1080/02670844.2019.1688015
- Shu, Kun;
- Zhang, Chuanwei;
- Zheng, Dezhi;
- Gu, Le;
- Wang, Liqin
- Article
12
- Surface Engineering, 2020, v. 36, n. 5, p. 456, doi. 10.1080/02670844.2018.1564199
- Meziani, Samir;
- Moussi, Aberrahmane;
- Mahiou, Linda;
- Antoni, Frederic;
- Outemzabet, Ratiba
- Article
13
- Surface Engineering, 2020, v. 36, n. 1, p. 49, doi. 10.1080/02670844.2018.1555214
- Article
14
- Surface Engineering, 2019, v. 35, n. 1, p. 54, doi. 10.1080/02670844.2018.1454997
- Wang, Hongjun;
- Li, Qintao;
- Wu, Xiujuan
- Article
15
- Surface Engineering, 2017, v. 33, n. 5, p. 362, doi. 10.1080/02670844.2016.1230975
- Hu, J.;
- Fang, L.;
- Liao, X.-L.;
- Shi, L.-T.
- Article
16
- Surface Engineering, 2013, v. 29, n. 10, p. 749, doi. 10.1179/1743294413Y.0000000178
- Pang, J.;
- Bai, Y.;
- Qin, F.;
- Pan, L.;
- Zhao, Y.;
- Kang, R.
- Article
17
- Surface Engineering, 2011, v. 27, n. 6, p. 436, doi. 10.1179/174329409X409495
- Yilbas, B S;
- Arif, A F M;
- Karatas, C
- Article
18
- Surface Engineering, 2010, v. 26, n. 3, p. 224, doi. 10.1179/174329409X455449
- Article
19
- Surface Engineering, 2008, v. 24, n. 6, p. 464, doi. 10.1179/026708408X336373
- Wu, H. Y.;
- Zhang, P. Z.;
- Xu, Z.
- Article
20
- Surface Engineering, 2006, v. 22, n. 1, p. 63, doi. 10.1179/174329406X84985
- Kim, B.;
- Bae, J.;
- Han, S. S.
- Article
21
- Surface Engineering, 2003, v. 19, n. 6, p. 410, doi. 10.1179/026708403225010136
- Amaral, M.;
- Oliveira, F. J.;
- Belmonte, M.;
- Fernandes, A. J. S.;
- Costa, F. M.;
- Silva, R. F.
- Article
22
- Chemistry - A European Journal, 2020, v. 26, n. 27, p. 6006, doi. 10.1002/chem.201904995
- Pei, Shien;
- Guo, Jianfeng;
- He, Zhishun;
- Huang, Liang‐ai;
- Lu, Tongzhou;
- Gong, Junjie;
- Shao, Haibo;
- Wang, Jianming
- Article
23
- Chemistry - A European Journal, 2020, v. 26, n. 10, p. 2187, doi. 10.1002/chem.201904529
- Bhat, Shrikant;
- Wiehl, Leonore;
- Haseen, Shariq;
- Kroll, Peter;
- Glazyrin, Konstantin;
- Gollé‐Leidreiter, Philipp;
- Kolb, Ute;
- Farla, Robert;
- Tseng, Jo‐Chi;
- Ionescu, Emanuel;
- Katsura, Tomoo;
- Riedel, Ralf
- Article
24
- Chemistry - A European Journal, 2019, v. 25, n. 69, p. 15887, doi. 10.1002/chem.201903897
- Mallmann, Mathias;
- Niklaus, Robin;
- Rackl, Tobias;
- Benz, Maximilian;
- Chau, Thanh G.;
- Johrendt, Dirk;
- Minár, Ján;
- Schnick, Wolfgang
- Article
25
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 20, p. 18432, doi. 10.1007/s10854-019-02197-w
- Manan, Abdul;
- Khan, Arshad;
- Ullah, Atta;
- Ahmad, Arbab Safeer;
- Wazir, Arshad Hussain;
- Iqbal, Javed;
- Ullah, Mati
- Article
26
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15267, doi. 10.1007/s10854-019-01899-5
- Zhang, Qingji;
- Jing, Jiangping;
- Chen, Zhuoyuan;
- Sun, Mengmeng;
- Li, Jiarun;
- Li, Yan;
- Xu, Likun
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 23, p. 20081, doi. 10.1007/s10854-018-0139-1
- Yang, Ning;
- Li, Shizheng;
- Yang, Jinlin;
- Li, Hongbo;
- Ye, Xiaojun;
- Liu, Cui;
- Yuan, Xiao
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19353, doi. 10.1007/s10854-018-0064-3
- Kolli, Sowmya;
- Sunkara, Mahendra;
- Alphenaar, Bruce
- Article
29
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 16, p. 12168, doi. 10.1007/s10854-017-7031-2
- Fukuda, Shinji;
- Shimada, Kazuhiko;
- Izu, Noriya;
- Miyazaki, Hiroyuki;
- Iwakiri, Shoji;
- Hirao, Kiyoshi
- Article
30
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 11, p. 8278, doi. 10.1007/s10854-017-6541-2
- Fukuda, Shinji;
- Shimada, Kazuhiko;
- Izu, Noriya;
- Miyazaki, Hiroyuki;
- Hirao, Kiyoshi;
- Iwakiri, Shoji
- Article
31
- 2017
- Chen, Xiaobo;
- Yang, Wen;
- Yang, Peizhi;
- Yuan, Junbao;
- Zhao, Fei;
- Hao, Jiabo;
- Tang, Yu
- Erratum
32
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 10, p. 10003, doi. 10.1007/s10854-016-5071-7
- Huang, Zhen;
- Zhang, Yuantao;
- Deng, Gaoqiang;
- Li, Baozhu;
- Cui, Shuang;
- Liang, Hongwei;
- Chang, Yuchun;
- Song, Junfeng;
- Zhang, Baolin;
- Du, Guotong
- Article
33
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3888, doi. 10.1007/s10854-015-4238-y
- Wang, Weihui;
- Peng, Qing;
- Dai, Yiquan;
- Qian, Zhengfang;
- Liu, Sheng
- Article
34
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2579, doi. 10.1007/s10854-015-2726-8
- Lin, Yow-Jon;
- Tsao, Hou-Yen;
- Liu, Day-Shan
- Article
35
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 9, p. 1346, doi. 10.1007/s10854-011-0311-3
- Ningbo Liao;
- Xi Tao;
- Miao Zhang;
- Wei Xue
- Article
36
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 10, p. 1026, doi. 10.1007/s10854-008-9815-x
- Article
37
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 76, doi. 10.1007/s10854-007-9448-5
- Danieluk, Dominik;
- Bradley, Ann L.;
- Mitra, Anirban;
- O'Reilly, Lisa;
- Lucas, Olibanji F.;
- Cowley, Aidan;
- McNally, Patrick J.;
- Foy, Barry;
- McGlynn, Enda
- Article
38
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 285, doi. 10.1007/s10854-007-9513-0
- Claudio, Gianfranco;
- Calnan, Sonya;
- Bass, Kevin;
- Boreland, Matt
- Article
39
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 902, doi. 10.1007/s10854-008-9679-0
- Tyagi, Hitender Kumar;
- George, P. J.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 471, doi. 10.1007/s10854-007-9365-7
- Article
41
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 323, doi. 10.1007/s10854-007-9321-6
- Hasanuzzaman, Mohammad;
- Haddara, Yaser M.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 29, doi. 10.1007/s10854-007-9181-0
- Kobayashi, S.;
- Ohrui, N.;
- Chao, Y. C.;
- Aoki, T.;
- Kobayashi, H.;
- Asakawa, T.
- Article
43
- Journal of Materials Science Letters, 2003, v. 22, n. 12, p. 895, doi. 10.1023/A:1024479107007
- Feng Ye;
- Sheng Chen;
- Iwasa, M.
- Article
44
- Biomedical Microdevices, 2008, v. 10, n. 5, p. 611, doi. 10.1007/s10544-008-9172-9
- Ashwini Gopal;
- Zhiquan Luo;
- Jae Lee;
- Karthik Kumar;
- Bin Li;
- Kazunori Hoshino;
- Christine Schmidt;
- Paul Ho;
- Xiaojing Zhang
- Article
45
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2015, v. 15, n. 1, p. 147, doi. 10.1002/pamm.201510064
- Ruck, Johannes;
- Othmani, Yamen;
- Lube, Tanja;
- Khader, Iyas;
- Kailer, Andreas;
- Böhlke, Thomas
- Article
46
- Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2014, v. 92, n. 2, p. 178, doi. 10.1016/j.fbp.2013.12.012
- Hassan, Ines Ben;
- Lafforgue, Christine;
- Ayadi, Abdelmonem;
- Schmitz, Philippe
- Article
47
- Strength of Materials, 2023, v. 55, n. 2, p. 302, doi. 10.1007/s11223-023-00525-4
- Galenko, V. Y.;
- Khvorostyanyi, V. V.
- Article
48
- Strength of Materials, 2021, v. 53, n. 6, p. 950, doi. 10.1007/s11223-022-00363-w
- Brusilová, A.;
- Gábrišová, Z.;
- Švec, P.;
- Schrek, A.
- Article
49
- Strength of Materials, 2016, v. 48, n. 5, p. 610, doi. 10.1007/s11223-016-9804-x
- Article
50
- Strength of Materials, 2014, v. 46, n. 1, p. 71, doi. 10.1007/s11223-014-9517-y
- Article