Works matching DE "SEMICONDUCTOR industry"
Results: 2429
Power in waiting.
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- Power Engineer, 2006, v. 20, n. 5, p. 38, doi. 10.1049/pe:20060507
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- Article
IN BRIEF.
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- Power Engineer, 2004, v. 18, n. 6, p. 45
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- Article
Micrel ups the power stakes.
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- Power Engineer, 2004, v. 18, n. 6, p. 44
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- Article
Converter slashes talk-time.
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- Power Engineer, 2004, v. 18, n. 6, p. 44
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- Article
Seconds out.
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- Power Engineer, 2004, v. 18, n. 6, p. 36, doi. 10.1049/pe:20040608
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- Article
WELCOME TO THE POWER HOUSE.
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- Power Engineer, 2004, v. 18, n. 6, p. 10
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- Article
Vicor unveils bricks.
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- Power Engineer, 2004, v. 18, n. 6, p. 9
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- Article
Ericsson straddles power alliances.
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- Power Engineer, 2004, v. 18, n. 6, p. 9
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- Article
National ramps up power products.
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- Power Engineer, 2004, v. 18, n. 5, p. 43
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- Article
SIXTY SECONDS: Power takes priority.
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- 2004
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- Interview
Night rider.
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- Power Engineer, 2004, v. 18, n. 2, p. 44
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- Article
Pre-Evaluating the Technical Efficiency Gains from Potential Mergers and Acquisitions in the IC Design Industry.
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- International Journal of Information Technology & Decision Making, 2020, v. 19, n. 2, p. 525, doi. 10.1142/S021962202050008X
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- Article
INNOVATIVE BUSINESS MODELS IN SEMICONDUCTOR FOUNDRY INDUSTRY:: FROM SILICON INTELLECTUAL PROPERTY PERSPECTIVES.
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- International Journal of Information Technology & Decision Making, 2011, v. 10, n. 3, p. 411, doi. 10.1142/S0219622011004385
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- Article
Nanomachining Bridges Precision Engineering and Nanotechnology.
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- Innovation, 2004, v. 4, n. 3, p. 25
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- Article
Discovery of Nanoscale Electric Field‐Induced Phase Transitions in ZrO<sub>2</sub>.
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- Advanced Functional Materials, 2023, v. 33, n. 41, p. 1, doi. 10.1002/adfm.202303636
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- Article
DNA‐Based Nanofabrication for Nanoelectronics.
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- Advanced Functional Materials, 2022, v. 32, n. 16, p. 1, doi. 10.1002/adfm.202112331
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- Article
Reconfigurable Carbon Nanotube Barristor.
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- Advanced Functional Materials, 2022, v. 32, n. 11, p. 1, doi. 10.1002/adfm.202107454
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- Article
Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.
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- 2025
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- Correction Notice
Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.
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- Journal of Intelligent Manufacturing, 2025, v. 36, n. 1, p. 357, doi. 10.1007/s10845-023-02245-7
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- Article
Modelling and analysis of multiple cluster tools system with random failures using coloured Petri net.
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- International Journal of Advanced Manufacturing Technology, 2010, v. 50, n. 9-12, p. 897, doi. 10.1007/s00170-010-2592-8
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- Article
Accelerating fabrication speed in two-laser beam stereolithography system using adaptive crosshatch technique.
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- International Journal of Advanced Manufacturing Technology, 2010, v. 50, n. 9-12, p. 1003, doi. 10.1007/s00170-010-2576-8
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- Article
The implementation of SCM concepts and information technology to the photomask supply management of IC companies.
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- International Journal of Advanced Manufacturing Technology, 2010, v. 49, n. 1-4, p. 227, doi. 10.1007/s00170-009-2370-7
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- Article
No-wait two-stage multiprocessor flow shop scheduling with unit setup.
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- International Journal of Advanced Manufacturing Technology, 2010, v. 44, n. 9/10, p. 921, doi. 10.1007/s00170-008-1865-y
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- Article
Lot cycle time prediction in a ramping-up semiconductor manufacturing factory with a SOM–FBPN-ensemble approach with multiple buckets and partial normalization.
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- International Journal of Advanced Manufacturing Technology, 2009, v. 42, n. 11/12, p. 1206, doi. 10.1007/s00170-008-1665-4
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- Article
Daily planning and scheduling system for the EDS process in a semiconductor manufacturing facility.
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- International Journal of Advanced Manufacturing Technology, 2009, v. 41, n. 5/6, p. 568, doi. 10.1007/s00170-008-1505-6
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- Article
Simulation-based optimization of dispatching rules for semiconductor wafer fabrication system scheduling by the response surface methodology.
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- International Journal of Advanced Manufacturing Technology, 2009, v. 41, n. 1/2, p. 110, doi. 10.1007/s00170-008-1462-0
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- Article
A fuzzy-neural approach for estimating the monthly output of a semiconductor manufacturing factory.
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- International Journal of Advanced Manufacturing Technology, 2008, v. 39, n. 5/6, p. 589, doi. 10.1007/s00170-007-1228-0
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- Article
A joint GA+DP approach for single burn-in oven scheduling problems with makespan criterion.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 35, n. 5/6, p. 587, doi. 10.1007/s00170-006-0738-5
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- Article
A real time marking inspection scheme for semiconductor industries.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 34, n. 9/10, p. 926, doi. 10.1007/s00170-006-0669-1
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- Article
A simulated model for cycle time reduction by acquiring optimal lot size in semiconductor manufacturing.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 34, n. 9/10, p. 1008, doi. 10.1007/s00170-006-0884-9
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- Article
A WIP-based exception-management model for integrated circuit back-end production processes.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 33, n. 11/12, p. 1263, doi. 10.1007/s00170-006-0559-6
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- Article
Machining characteristics on the ultra-precision dicing of silicon wafer.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 33, n. 7/8, p. 662, doi. 10.1007/s00170-006-0499-1
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- Article
An industrial solution to object pose estimation for automatic semiconductor fabrication.
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- International Journal of Advanced Manufacturing Technology, 2007, v. 32, n. 9/10, p. 969, doi. 10.1007/s00170-006-0409-6
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- Article
Job releasing and throughput planning for wafer fabrication under demand fluctuating make-to-stock environment.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 31, n. 3/4, p. 316, doi. 10.1007/s00170-005-0185-8
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- Article
The practices of integrating manufacturing execution system and six sigma methodology.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 30, n. 7/8, p. 761, doi. 10.1007/s00170-005-0090-1
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- Article
Product-mix decision in a mixed-yield wafer fabrication scenario.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 7/8, p. 746, doi. 10.1007/s00170-005-2568-2
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- Article
A study on performance of introducing ERP to semiconductor related industries in Taiwan.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 1/2, p. 89, doi. 10.1007/s00170-004-2488-6
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- Article
Research on AOCTPN-based modeling and simulation technology of semiconductor fabrication line.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 28, n. 7/8, p. 814, doi. 10.1007/s00170-004-2409-8
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- Article
Analysis of priority mix planning for the fabrication of semiconductors under uncertainty.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 28, n. 3/4, p. 351, doi. 10.1007/s00170-004-2369-z
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- Article
Performance evaluation of introducing QS-9000 to the Taiwanese semiconductor industry.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 27, n. 9/10, p. 1011, doi. 10.1007/s00170-004-2288-z
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- Article
Dispatching of overhead hoist vehicles in a fab intrabay using a multimission-oriented controller.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 27, n. 7/8, p. 824, doi. 10.1007/s00170-004-2244-y
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- Article
Conjunctive simulated scheduling.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 26, n. 11/12, p. 1409, doi. 10.1007/s00170-004-2114-7
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- Article
An operator staffing and assignment model for foundry fabs.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 26, n. 11/12, p. 1429, doi. 10.1007/s00170-004-2124-5
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- Article
Single machine scheduling with multiple objectives in semiconductor manufacturing.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 26, n. 9/10, p. 950, doi. 10.1007/s00170-004-2074-y
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- Article
Product Mix Optimization for Semiconductor Manufacturing Based on AHP and ANP Analysis.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 25, n. 11/12, p. 1144, doi. 10.1007/s00170-003-1956-8
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- Article
Real-coded genetic algorithm for stochastic optimization: A tool for recipe qualification of semiconductor manufacturing under noisy environments.
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- International Journal of Advanced Manufacturing Technology, 2005, v. 25, n. 3/4, p. 361, doi. 10.1007/s00170-003-1935-0
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- Article
A replacement consideration for the end-of-life product in the green life cycle environment.
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- International Journal of Advanced Manufacturing Technology, 2004, v. 24, n. 11/12, p. 925, doi. 10.1007/s00170-003-1809-5
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- Publication type:
- Article
A simulated annealing algorithm for integration of shop floor control strategies in semiconductor wafer fabrication.
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- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 75, doi. 10.1007/s00170-002-1444-6
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- Publication type:
- Article
Integrated topology and controller optimization of motion systems in the frequency domain.
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- Structural & Multidisciplinary Optimization, 2015, v. 51, n. 3, p. 673, doi. 10.1007/s00158-014-1161-4
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- Article
A joint encoder–decoder framework for supporting energy efficient audio decoding.
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- Multimedia Systems, 2009, v. 15, n. 2, p. 101, doi. 10.1007/s00530-009-0152-6
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- Publication type:
- Article