Works matching DE "MULTILAYERS"
1
- Defence Technology, 2025, v. 48, p. 104, doi. 10.1016/j.dt.2025.01.009
- Hao'nan Guo;
- Yunbo Shi;
- Rui Zhao;
- Yu'nan Chen;
- Peng Zhang;
- Liang Chen;
- Tao Guo
- Article
2
- Nanophotonics (21928606), 2025, v. 14, n. 10, p. 1587, doi. 10.1515/nanoph-2024-0619
- Seo, Seok-Beom;
- Lee, Jong-Goog;
- Yu, Jae-Seon;
- Kim, Jae-Hyun;
- Jung, Serang;
- Kang, Gumin;
- Ko, Hyungduk;
- Hu, Run;
- Lee, Eungkyu;
- Kim, Sun-Kyung
- Article
3
- Revista Cubana de Física, 2017, v. 34, n. 1, p. 80
- MEJÍA-LÓPEZ, J.;
- MEJÍA-LÓPEZ, A.
- Article
5
- Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2852, doi. 10.1007/s11664-024-10982-5
- Article
6
- Surface Engineering, 2022, v. 38, n. 1, p. 54, doi. 10.1080/02670844.2022.2028059
- Erard, Gwendoline A. E.;
- Nielsen, Jacob Obitsø;
- Pantleon, Karen
- Article
7
- Surface Engineering, 2018, v. 34, n. 6, p. 423, doi. 10.1080/02670844.2017.1327009
- Rezaeiolum, A.;
- Aliofkhazraei, M.;
- Karimzadeh, A.;
- Rouhaghdam, A. S.;
- Miresmaeili, R.
- Article
8
- Surface Engineering, 2015, v. 31, n. 1, p. 52, doi. 10.1179/1743294414Y.0000000388
- Li, G.;
- Zhang, M. L.;
- Huang, J.;
- Sun, Z. Y.;
- Wu, Y. X.
- Article
9
- Surface Engineering, 2014, v. 30, n. 9, p. 624, doi. 10.1179/1743294414Y.0000000283
- Gao, F.;
- Yang, Q.;
- Liu, R.;
- Huang, X.
- Article
10
- Surface Engineering, 2014, v. 30, n. 1, p. 36, doi. 10.1179/1743294413Y.0000000177
- Ji, J.;
- Niu, Y.;
- Wu, J.;
- Yu, Z.
- Article
11
- Macromolecular Rapid Communications, 2013, v. 34, n. 23/24, p. 1820, doi. 10.1002/marc.201300571
- Carregal‐Romero, Susana;
- Rinklin, Philipp;
- Schulze, Susanne;
- Schäfer, Martin;
- Ott, Andrea;
- Hühn, Dominik;
- Yu, Xiang;
- Wolfrum, Bernhard;
- Weitzel, Karl‐Michael;
- Parak, Wolfgang J.
- Article
12
- Macromolecular Rapid Communications, 2013, v. 34, n. 21, p. 1670, doi. 10.1002/marc.201300624
- Zheng, Zhikun;
- Ruiz‐Vargas, Carlos S.;
- Bauer, Thomas;
- Rossi, Antonella;
- Payamyar, Payam;
- Schütz, Andri;
- Stemmer, Andreas;
- Sakamoto, Junji;
- Schlüter, A. Dieter
- Article
13
- Angewandte Chemie, 2015, v. 127, n. 26, p. 7697, doi. 10.1002/ange.201502177
- Jin, Gyuhyung;
- Shin, Mikyung;
- Kim, Seung-Hyun;
- Lee, Haeshin;
- Jang, Jae-Hyung
- Article
14
- Angewandte Chemie, 2014, v. 126, n. 47, p. 13079, doi. 10.1002/ange.201407140
- Han, Rui;
- Ha, Ji Won;
- Xiao, Chaoxian;
- Pei, Yuchen;
- Qi, Zhiyuan;
- Dong, Bin;
- Bormann, Nicholas L.;
- Huang, Wenyu;
- Fang, Ning
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 8, p. 6434, doi. 10.1007/s10854-018-8624-0
- Zhang, H.;
- Yan, S. S.;
- Li, S. T.;
- Su, S. C.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5200, doi. 10.1007/s10854-016-6176-8
- Cheng, Xuxin;
- Li, Xiaoxia;
- Cui, Haining
- Article
17
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3254, doi. 10.1007/s10854-016-5916-0
- Ojo, A.;
- Salim, H.;
- Olusola, O.;
- Madugu, M.;
- Dharmadasa, I.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12604, doi. 10.1007/s10854-016-5392-6
- Wu, Muying;
- Yu, Shihui;
- He, Lin;
- Yang, Lei
- Article
19
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3202, doi. 10.1007/s10854-015-4145-2
- Nedjem, Zoubir;
- Seghier, Tahar;
- Hadjadj, Abdelchafik
- Article
20
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3778, doi. 10.1007/s10854-015-4222-6
- Wang, Yubo;
- Dai, Bo;
- Huang, Bao;
- Ren, Yong;
- Xu, Jing;
- Wang, Zhen;
- Tan, Shijie;
- Ni, Jing
- Article
21
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 8224, doi. 10.1007/s10854-015-3485-2
- Wang, Ming;
- Wang, Dong;
- Schaaf, Peter
- Article
22
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 5009, doi. 10.1007/s10854-015-3014-3
- Kuru, Hilal;
- Kockar, Hakan;
- Alper, Mursel
- Article
23
- 2015
- Kuru, Hilal;
- Kockar, Hakan;
- Alper, Mursel;
- Haciismailoglu, Murside
- Erratum
24
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3168, doi. 10.1007/s10854-015-2813-x
- Article
25
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2411, doi. 10.1007/s10854-015-2699-7
- Tekgül, Atakan;
- Alper, Mursel;
- Kockar, Hakan;
- Haciismailoglu, Murside
- Article
26
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 294, doi. 10.1007/s10854-014-2398-9
- Article
27
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2016, v. 16, n. 1, p. 377, doi. 10.1002/pamm.201610177
- Article
28
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2015, v. 15, n. 1, p. 231, doi. 10.1002/pamm.201510106
- Simon, Jaan-Willem;
- Höwer, Daniel;
- Reese, Stefanie
- Article
29
- Numerical Methods for Partial Differential Equations, 2023, v. 39, n. 2, p. 1778, doi. 10.1002/num.22954
- Article
30
- Microbial Ecology, 2015, v. 69, n. 1, p. 45, doi. 10.1007/s00248-014-0485-3
- Meng, Fanming;
- Gao, Guixiang;
- Jia, Zhihong
- Article
31
- Chemical Engineering Research & Design: Transactions of the Institution of Chemical Engineers Part A, 2023, v. 191, p. 27, doi. 10.1016/j.cherd.2023.01.018
- Caetano, Gabriela Costa;
- Franco, Danielle Mitze Muller;
- Canile, Fernanda Maciel;
- Vaz, Boniek Gontijo;
- Ostroski, Indianara Conceição
- Article
32
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 2, p. 707, doi. 10.1007/s10008-020-04846-1
- Nishshanke, G. B. M. M. M.;
- Thilakarathna, B. D. K. K.;
- Albinsson, I.;
- Mellander, B.-E.;
- Bandara, T. M. W. J.
- Article
33
- Computational Mechanics, 2019, v. 63, n. 2, p. 219, doi. 10.1007/s00466-018-1592-7
- Gebhardt, Cristian Guillermo;
- Hofmeister, Benedikt;
- Hente, Christian;
- Rolfes, Raimund
- Article
34
- Strength of Materials, 2020, v. 52, n. 5, p. 812, doi. 10.1007/s11223-020-00235-1
- Eskitaşçioğlu, M.;
- Küçük, O.;
- Eskitaşçioğlu, G.;
- Eraslan, O.;
- Belli, S.
- Article
35
- Strength of Materials, 2015, v. 47, n. 1, p. 186, doi. 10.1007/s11223-015-9646-y
- Article
36
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 6, p. 318, doi. 10.1134/S1061830913060028
- Builo, S.;
- Ivanochkin, P.;
- Myasnikova, N.
- Article
37
- Inorganic Materials, 2018, v. 54, n. 2, p. 140, doi. 10.1134/S002016851802005X
- Domashevskaya, E. P.;
- Builov, N. S.;
- Lukin, A. N.;
- Sitnikov, A. V.
- Article
38
- Inorganic Materials, 2015, v. 51, n. 11, p. 1111, doi. 10.1134/S0020168515100027
- Blinkov, I.;
- Volkhonsky, A.;
- Sergevnin, V.;
- Tabachkova, N.
- Article
39
- Inorganic Materials, 2015, v. 51, n. 7, p. 668, doi. 10.1134/S0020168515070079
- Ivicheva, S.;
- Kargin, Yu.;
- Kutsev, S.;
- Volkov, V.
- Article
40
- Inorganic Materials, 2015, v. 51, n. 3, p. 197, doi. 10.1134/S0020168515020144
- Pashchenko, A.;
- Chebotarev, S.;
- Lunin, L.
- Article
41
- Electronic Materials, 2022, v. 3, n. 4, p. 344, doi. 10.3390/electronicmat3040028
- Boni, Georgia A.;
- Filip, Lucian D.;
- Radu, Cristian;
- Chirila, Cristina;
- Pasuk, Iuliana;
- Botea, Mihaela;
- Pintilie, Ioana;
- Pintilie, Lucian
- Article
42
- Colloids & Interfaces, 2024, v. 8, n. 6, p. 61, doi. 10.3390/colloids8060061
- Bykov, A. G.;
- Loglio, G.;
- Miller, R.;
- Tsyganov, E. A.;
- Wan, Z.;
- Noskov, B. A.
- Article
43
- International Journal of Modern Manufacturing Technologies (IJMMT), 2023, v. 15, n. 1, p. 44, doi. 10.54684/ijmmt.2023.15.1.44
- Cerlinca, Delia;
- Spinu, Sergiu;
- Glovnea, Marilena
- Article
44
- Electronic Science & Technology, 2023, v. 36, n. 1, p. 7, doi. 10.16180/j.cnki.issn1007-7820.2023.01.002
- Article
45
- Research in Nondestructive Evaluation, 2018, v. 29, n. 1, p. 18, doi. 10.1080/09349847.2016.1213005
- Kim, Jungmin;
- Le, Minhhuy;
- Lee, Jinyi;
- Kim, Sejin;
- Hwang, Young-Ha
- Article
46
- International Journal of Energy Research, 2021, v. 45, n. 4, p. 5619, doi. 10.1002/er.6188
- Seo, Byungseok;
- Cha, Youngsun;
- Kim, Sangtae;
- Choi, Wonjoon
- Article
47
- Advanced Electronic Materials, 2022, v. 8, n. 12, p. 1, doi. 10.1002/aelm.202200845
- Zhang, Qiqi;
- Zhao, Yunchi;
- He, Congli;
- Huo, Yuping;
- Cui, Baoshan;
- Zhu, Zengtai;
- Zhang, Guangyu;
- Yu, Guoqiang;
- He, Bin;
- Zhang, Yi;
- Lyu, Haochang;
- Guo, Yaqin;
- Qi, Jie;
- Shen, Shipeng;
- Wei, Hongxiang;
- Shen, Baogen;
- Wang, Shouguo
- Article
48
- Advanced Electronic Materials, 2022, v. 8, n. 9, p. 1, doi. 10.1002/aelm.202101380
- Wang, Jian;
- Lau, Yong‐Chang;
- Zhou, Weinan;
- Seki, Takeshi;
- Sakuraba, Yuya;
- Kubota, Takahide;
- Ito, Keita;
- Takanashi, Koki
- Article
49
- Advanced Electronic Materials, 2022, v. 8, n. 8, p. 1, doi. 10.1002/aelm.202101161
- Farronato, Matteo;
- Melegari, Margherita;
- Ricci, Saverio;
- Hashemkhani, Shahin;
- Bricalli, Alessandro;
- Ielmini, Daniele
- Article
50
- Advanced Electronic Materials, 2022, v. 8, n. 8, p. 1, doi. 10.1002/aelm.202101161
- Farronato, Matteo;
- Melegari, Margherita;
- Ricci, Saverio;
- Hashemkhani, Shahin;
- Bricalli, Alessandro;
- Ielmini, Daniele
- Article