Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon.Published in:Journal of Spectroscopy, 2021, v. 2021, p. 1, doi. 10.1155/2021/2860007By:Chang, Ying;He, Saisai;Sun, Mingyuan;Xiao, Aixia;Zhao, Jiaxin;Ma, Lulu;Qiu, WeiPublication type:Article