Works matching DE "LINE drivers (Integrated circuits)"
1
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4786, doi. 10.1007/s11664-025-11892-w
- Chen, Weizhong;
- Deng, Zhijie;
- Chen, Zesheng;
- Zhou, Yangqi;
- Han, Zhengsheng;
- Wang, Zeheng
- Article
2
- Construction Machinery & Equipment, 2020, v. 51, n. 12, p. 1
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800251
- Woo, Youngjun;
- Hong, Woonggi;
- Yang, Sang Yoon;
- Kim, Ho Jin;
- Cha, Jun‐Hwe;
- Lee, Jae Eun;
- Lee, Khang June;
- Kang, Taegyu;
- Choi, Sung‐Yool
- Article
4
- Stochastic Models, 2017, v. 33, n. 3, p. 430, doi. 10.1080/15326349.2017.1312446
- Perel, Efrat;
- Yechiali, Uri
- Article
5
- Refrigeration Engineering & Technology, 2024, v. 60, n. 3, p. 1, doi. 10.15673/ret.v60i3.3000
- Лужанська, Г. В.;
- Бабаєв, Є. С.;
- Сергеєв, М. І.;
- Паламарчук, О. О.;
- Фуркаленко, О. Л.
- Article
6
- Instrumentation, Mesures, Métrologies, 2020, v. 19, n. 3, p. 211, doi. 10.18280/i2m.190306
- Xusheng Wang;
- Khan, Imran;
- Ming Zhang;
- Llaser, Nicolas
- Article
7
- Telecommunication Engineering, 2023, v. 63, n. 9, p. 1427, doi. 10.20079/j.issn.1001-893x.220210001
- Article
8
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 620, doi. 10.1002/sdtp.10210
- Shim, Dahye;
- Choi, Joung‐Mi;
- Jang, Hyung‐Uk;
- Nam, Sang‐Jin;
- Kim, Dong‐Kyu;
- Yoo, Seung‐Jin;
- Kim, Tae‐Hun;
- Lee, Ju‐Young;
- Jun, Myung‐chul;
- Kang, In‐Byeong
- Article
9
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1281, doi. 10.1002/sdtp.10093
- Tu, Chun‐Da;
- Chen, Yung‐Chih;
- Huang, Cheng‐Han;
- Hong, Kai‐Wei;
- Chang, Hsiang‐Sheng;
- Kuo, Chung‐Hong
- Article
10
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1293, doi. 10.1002/sdtp.10099
- Lin, Chih‐Lung;
- Wu, Chia‐En;
- Lee, Ching‐En
- Article
11
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 701, doi. 10.1002/j.2168-0159.2014.tb00184.x
- Yoshida, Hidefumi;
- Tanaka, Kohei;
- Murata, Mitsuhiro;
- Noma, Takeshi;
- Nishiyama, Takayuki;
- Yonebayashi, Ryo;
- Kanehiro, Masayuki;
- Nakanishi, Yohei
- Article
12
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1127, doi. 10.1002/j.2168-0159.2014.tb00293.x
- Tai, Ya‐Hsiang;
- Lin, Chun‐Yu;
- Rao, Yong‐Nien
- Article
13
- 2013
- Saito, Nobuyoshi;
- Ueda, Tomomasa;
- Miura, Kentaro;
- Nakano, Shintaro;
- Sakano, Tatsunori;
- Maeda, Yuya;
- Yamaguchi, Hajime;
- Amemiya, Isao
- Other
14
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 5, doi. 10.1002/j.2168-0159.2012.tb05693.x
- Wu, Zhongyuan;
- Duan, Liye;
- Yuan, Guangcai;
- Jiang, Chunsheng;
- Li, Yanzhao;
- Yan, Liangchen;
- Cheng, Jun;
- Wang, Gang;
- Jin, Song
- Article
15
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1076, doi. 10.1002/j.2168-0159.2012.tb05977.x
- Zheng, Guang-Ting;
- Liu, Po-Tsun;
- Wu, Meng-Chyi;
- Yang, Meng-Chuan;
- Chu, Li-Wei;
- Wu, Che-Yao
- Article
16
- Frontiers in Plant Science, 2022, v. 13, p. 1, doi. 10.3389/fpls.2022.822634
- Zhang, Ruochong;
- Koh, Sally Shuxian;
- Teo, Mark Ju Teng;
- Bi, Renzhe;
- Zhang, Shuyan;
- Dev, Kapil;
- Urano, Daisuke;
- Dinish, U. S.;
- Olivo, Malini
- Article
17
- Security & Communication Networks, 2022, p. 1, doi. 10.1155/2022/1940708
- Zhang, Kai;
- Gao, Jihao;
- Wang, YunFei;
- Liang, MingLiang
- Article
18
- Annals of the Faculty of Engineering Hunedoara - International Journal of Engineering, 2011, v. 9, n. 3, p. 279
- DANIŠOVÁ, Nina;
- MAJERÍK, Jozef
- Article
19
- Journal of Electrical & Computer Engineering, 2024, v. 2024, p. 1, doi. 10.1155/2024/5556491
- G., Sugumaran;
- N., Amutha Prabha
- Article
20
- Engineering Letters, 2007, v. 15, n. 2, p. 327
- Zhi-Ming Lin;
- Hsin-Chi Lai
- Article
21
- Optical & Quantum Electronics, 2018, v. 50, n. 11, p. 1, doi. 10.1007/s11082-018-1625-7
- Article
22
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 267, doi. 10.1007/s10836-012-5290-7
- Article
23
- Cybernetics & Systems Analysis, 2007, v. 43, n. 3, p. 450, doi. 10.1007/s10559-007-0069-z
- Article
24
- International Journal of Industrial Electronics Control & Optimization, 2023, v. 6, n. 2, p. 123
- Naderi, Roya;
- Babaei, Ebrahim
- Article
25
- Mathematical Modelling of Engineering Problems, 2025, v. 12, n. 3, p. 900, doi. 10.18280/mmep.120316
- Hariyawan, Mohammad Yanuar;
- Ma'ady, Mochamad Nizar Palefi;
- Widyantara, Helmy;
- Anamisa, Devie Rosa;
- Sugijanto, Haykal Azrel Putra;
- Tjahyadi, Nathanael
- Article
27
- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-23889-0
- Yang, Jin;
- Lee, Jihwan;
- Land, Michelle A.;
- Lai, Shujuan;
- Igoshin, Oleg A.;
- St-Pierre, François
- Article
28
- International Journal of Distributed Sensor Networks, 2017, v. 13, n. 5, p. 1, doi. 10.1177/1550147717709962
- Le, Thanh-Dat;
- Shin, Oh-Soon
- Article
29
- Journal of Electrical & Computer Engineering, 2010, p. 1, doi. 10.1155/2010/273486
- Kwan, Raymond;
- Leung, Cyril
- Article
30
- Journal of Sensors, 2021, p. 1, doi. 10.1155/2021/6538185
- Article
31
- Mathematical Methods of Operations Research, 2016, v. 83, n. 3, p. 295, doi. 10.1007/s00186-015-0529-6
- Göttlich, S.;
- Kühn, S.;
- Schwarz, J.;
- Stolletz, R.
- Article
32
- Microwave & Optical Technology Letters, 1999, v. 22, n. 2, p. 97, doi. 10.1002/(SICI)1098-2760(19990720)22:2<97::AID-MOP6>3.0.CO;2-V
- Cappuccino, Gregorio;
- Cocorullo, Giuseppe;
- Corsonello, Pasquale
- Article
33
- IET Intelligent Transport Systems (Wiley-Blackwell), 2016, v. 10, n. 10, p. 623, doi. 10.1049/iet-its.2016.0072
- Wang, Jian‐Min;
- Wu, Sen‐Tung;
- Su, Wei‐Yuan;
- Lin, Yu‐Liang
- Article
34
- IETE Technical Review, 2022, v. 39, n. 2, p. 357, doi. 10.1080/02564602.2020.1860838
- Mahato, Bidyut;
- Majumdar, Saikat;
- Paul, Samrat;
- Pal, Pradipta Kumar;
- Jana, Kartick Chandra
- Article
35
- IETE Technical Review, 2021, v. 38, n. 2, p. 267, doi. 10.1080/02564602.2020.1726215
- Mahato, Bidyut;
- Majumdar, Saikat;
- Vatsyayan, Sambit;
- Jana, K. C.
- Article
36
- Probability in the Engineering & Informational Sciences, 2008, v. 22, n. 4, p. 653, doi. 10.1017/S0269964808000375
- Article
37
- Probability in the Engineering & Informational Sciences, 2008, v. 22, n. 4, p. 477, doi. 10.1017/S0269964808000296
- Article
38
- Probability in the Engineering & Informational Sciences, 2008, v. 22, n. 4, p. 519, doi. 10.1017/S0269964808000314
- Article
39
- Electric Machines & Control / Dianji Yu Kongzhi Xuebao, 2022, v. 26, n. 1, p. 96, doi. 10.15938/j.emc.2022.01.011
- Article
40
- Nigerian Journal of Technology, 2015, v. 34, n. 3, p. 573, doi. 10.4314/njt.v34i3.21
- Nnadi, D. B. N.;
- Oti, S. E.;
- Ezika, P. C.
- Article
41
- Applied Physics A: Materials Science & Processing, 2019, v. 125, n. 3, p. 1, doi. 10.1007/s00339-019-2491-2
- Sahu, Manisha;
- Pradhan, Sanjib Kumar;
- Hajra, Sugato;
- Panigrahi, Basanta K.;
- Choudhary, R. N. P.
- Article
42
- Concurrency & Computation: Practice & Experience, 2011, v. 23, n. 1, p. 86, doi. 10.1002/cpe.1606
- Gómez, Crispín;
- Gómez, María E.;
- López, Pedro;
- Duato, José
- Article
43
- EvoDevo, 2023, v. 14, n. 1, p. 1, doi. 10.1186/s13227-023-00214-y
- Massri, Abdull Jesus;
- McDonald, Brennan;
- Wray, Gregory A.;
- McClay, David R.
- Article
44
- Energies (19961073), 2019, v. 12, n. 23, p. 4546, doi. 10.3390/en12234546
- Yin, Shan;
- Wu, Yingzhe;
- Liu, Yitao;
- Pan, Xuewei
- Article
45
- Journal of Electromagnetic Waves & Applications, 2023, v. 37, n. 14, p. 1187, doi. 10.1080/09205071.2023.2227849
- Sakaci, Furkan Hasan;
- Yener, Suayb Cagri
- Article
46
- International Journal of Remote Sensing, 2004, v. 25, n. 3, p. 511, doi. 10.1080/0143116031000139845
- Deschenes, F.;
- Ziou, D.;
- Auclair-Fortier, M.-F.
- Article
47
- Electronics & Electrical Engineering, 2019, v. 25, n. 3, p. 39, doi. 10.5755/j01.eie.25.3.23674
- Filus, Zdzislaw;
- Checinski, Jacek
- Article
48
- Journal of Electrical & Computer Engineering Innovations (JECEI), 2024, v. 12, n. 1, p. 69, doi. 10.22061/jecei.2023.9574.636
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 22, p. 5, doi. 10.1049/el.2016.1111
- Article
50
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 18, p. 1415, doi. 10.1049/el.2015.0417
- Delias, A.;
- Martin, A.;
- Bouysse, P.;
- Nebus, J. M.;
- Quéré, R.
- Article