Works matching IS 08857156 AND DT 2010 AND VI 25 AND IP 2

Results: 105

F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 221, doi. 10.1154/1.3455044

By:

Hönicke, P.;
Beckhoff, B.;
Kolbe, M.;
Giuberton, D.;
Pepponi, G.;
van den Berg, J.

Publication type:

Article

F-62 Characterization of Nanoparticles with X-ray Spectrometry Under Grazing Incidence Conditions.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 221, doi. 10.1154/1.3455043

By:

Reinhardt, F.;
Beckhoff, B.;
Pollakowski, B.;
Bresch, H.;
Seeger, S.

Publication type:

Article

F-74 Invited —Analysis of Indoor Fine Dust.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 221, doi. 10.1154/1.3455042

By:

Fittschen, U. E. A.;
Rehmers, A.;
Santen, M.;
Wesselmann, M.

Publication type:

Article

F-33 Trace Element Detection Using Monochromatic Wavelength Dispersive X-ray Fluorescence.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455041

By:

Havrilla, G. J.;
Collins, M.;
Montoya, V.;
Chen, Z.;
Wei, F.

Publication type:

Article

F-76 Invited —Different Applications of Polycapillaries to X-ray Spectroscopy.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455040

By:

Sánchez, H. J.;
Pérez, R. D.;
Pérez, C. A.

Publication type:

Article

F-31 Discovering the Selenium Metabolism and Its Impact for Health Prevention by TXRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455039

By:

Gross, A.;
Stosnach, H.;
Renko, K.;
Behrends, T.;
Schomburg, L.

Publication type:

Article

F-72 Invited —TXRF- A Versatile Tool for Trace Element Analysis: A Review.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455038

By:

Wobrauschek, P.

Publication type:

Article

D-96 In-Situ Neutron Diffraction Study of Residual Stress in Steel Ammonia Nurse Tank Welds.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455037

By:

Sisneros, T. A.;
Brown, D. W.;
Russel, A.;
Chumbley, S.;
Becker, A.

Publication type:

Article

D-101 Invited —A Next Generation Neutron Diffraction Strain Scanner for Steady-State Sources.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455035

By:

Rogge, R. B.

Publication type:

Article

D-48 XRD Stress Analyses on Surfaces with Curvature Radius below 1mm, a New Challenge!

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455034

By:

Haase, A.;
Klatt, M.;
Schafmeister, A.;
Stabenow, R.

Publication type:

Article

D-50 Invited —Thermo-Mechanical Behavior of Thin Films and Small Structures Characterized by Synchrotron X-ray Diffraction.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 220, doi. 10.1154/1.3455033

By:

Keckes, J.

Publication type:

Article

F-68 Visualizing the 17th Century Underpainting Using Mobile and Synchrotron-Based Scanning Macro-XRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455031

By:

Alfeld, M.;
Janssens, K.;
Dik, J.;
Siddons, P. D.;
van de Wetering, E.

Publication type:

Article

F-17 Invited —The Photo-Oxidative Degradation of Matisse's Le Bonheur De Vivre (1905–6): X-ray-Based Methods for Degradation Mechanism Identification.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455030

By:

Mass, J. L.;
Buckley, B.;
Little, M.

Publication type:

Article

F-12 Glancing Incidence XRF for the Analysis of Early Chinese Bronze Mirrors.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455029

By:

Zuneska, R. W.;
Rong, J.;
Vander, I.;
Cadieu, F. J.

Publication type:

Article

F-38 The Challenges of XRF Analysis of Cultural Heritage Glass Objects.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455028

By:

Kaiser, B. J.;
Brill, R.

Publication type:

Article

F-28 XRF Line and Area Scans in the Examination of Works of Art.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455027

By:

Trentelman, K.

Publication type:

Article

C-10 Invited —Going Beyond XRF: Use of Micro-Fluorescence and Diffraction to Understand How a Cultural Heritage Object Was Made and How It Ages and Degrades.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455026

By:

Walton, M.;
Schofield, E. J.;
Sarangi, R.;
Webb, S.;
Mehta, A.;
Meirer, F.

Publication type:

Article

F-34 Selecting the Appropriate X-ray Optic for the Right Application.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455025

By:

Havrilla, G. J.;
Montoya, V.

Publication type:

Article

D-28 High Speed 3D Diffraction Imaging.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 219, doi. 10.1154/1.3455024

By:

Evan, J. P. O.;
Chan, J. W.;
Godber, S. X.;
Peatfield, I.;
Rogers, K. D.;
Dicken, A.;
Rogers, J.

Publication type:

Article

F-26 Invited —X-ray Chemical Imaging in Scanning and Projection Modes in the Laboratory.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455023

By:

Tsuji, K.;
Nakano, K.

Publication type:

Article

F-29 Overlay of Laboratory-Based 3D X-ray Imaging Systems.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455022

By:

Patterson, B. M.;
Havrilla, G. J.;
Jackson, B.

Publication type:

Article

F-37 Macroscopic X-ray Fluorescence Capability for Large-Scale Elemental Mapping.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455021

By:

Volz, H. M.;
Havrilla, G. J.;
Aikin Jr., R. M.;
Montoya, V. M.;
Duffield, A. N.

Publication type:

Article

F-3 STXM Imaging of Organic Coatings on Grains in Primitive Interplanetary Dust: Implications for Formation of Pre-Biotic Organic Matter and Grain Sticking in the Early Solar System.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455020

By:

Flynn, G. J.;
Wirick, S.;
Jacobsen, C.;
Keller, L. P.;
Sandford, S. A.

Publication type:

Article

D-1 Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of Silver Indium Selenide Films Prepared by Laser Ablation.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455018

By:

Pathak, D.;
Bedi, R. K.;
Kaur, D.

Publication type:

Article

D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455017

By:

Jang, Y. -i.;
Park, K. -h.;
Bang, K. -h.

Publication type:

Article

D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 218, doi. 10.1154/1.3455016

By:

Ulyanenkov, A.;
Rinaldi, F.;
Menzel, S.;
Benediktovich, A.;
Zhilik, A.;
Feranchuk, I.;
Saito, K.

Publication type:

Article

D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455014

By:

Pöllmann, H.;
Maier, R.;
Riedl, U.;
Blaj, G.

Publication type:

Article

D-30 Invited —Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455013

By:

Holt, M.;
Hruszkewycz, S.;
Winarski, R.;
Rose, V.;
Maser, J.

Publication type:

Article

D-20 Invited —Three Dimensional X-ray Diffraction Microscopy.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455012

By:

Margulies, L.;
Poulsen, H. F.;
Schmidt, S.;
Jensen, D. J.;
Vaughan, G.;
Wright, J.

Publication type:

Article

D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCo3).

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455010

By:

Sitepu, H.;
O'Connor, B. H.;
Li, D.

Publication type:

Article

D-77 XRD Anisotropic Broadening of Nano-Particles.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455009

By:

Wang, Y.;
Chan, S. L. I.;
Shen, Y. R.;
Amal, R.;
Kiatkittipong, K.

Publication type:

Article

F-50 Invited —Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455003

By:

McGlinchey, C.;
Kaiser, B.;
Howe, T.

Publication type:

Article

C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1−xSo4 (0≤x≤1) by Rietveld Refinement.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455008

By:

Zaidi, S. R.;
Sitepu, H.;
Shen, S.;
Al-Yami, N.

Publication type:

Article

D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455006

By:

Kaduk, J. A.;
Wong-Ng, W.

Publication type:

Article

D-74 Invited — High-Resolution Powder X-ray Diffraction Study of Complex Minerals.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455005

By:

Antao, S. M.

Publication type:

Article

F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455004

By:

Martins, A.;
McGlinchey, C.;
Daffner, L. A.;
Messier, P.;
Chapman, A.

Publication type:

Article

D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 217, doi. 10.1154/1.3455007

By:

Rowles, M. R.;
McGregor, K.;
Snook, G. A.;
Madsen, I. C.;
Scarlett, N.V.Y.;
Lanyon, M.;
Urban, A.;
Styles, M. J.;
Riley, D. P.

Publication type:

Article

D-3 An Archaeologist's Dilemma.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455002

By:

Rogers, K. D.;
Beckett, S.;
Kuhn, S.;
Chamberlain, A.;
Clement, J.

Publication type:

Article

C-8 Invited —Analyzing Stratigraphy with a Dual XRD/XRF Instrument.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455001

By:

Chiari, G.

Publication type:

Article

F-19 Invited —Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3455000

By:

Shortland, A. J.;
Domoney, K.;
Kuhn, S.

Publication type:

Article

F-59 Characterization of Gemstones by Multiple Excitation EDXRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3454999

By:

Haller, M.;
Rößiger, V.;
Peretti, A.;
Günther, D.

Publication type:

Article

F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 216, doi. 10.1154/1.3454998

By:

Hara, S.;
Kawahara, N.;
Matsuo, T.;
Doi, M.

Publication type:

Article

F-41 X-ray Fluorescence Analysis of Palladium in Non-Homogeneous Organics and Slurries via Gel Suspensions.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454997

By:

Burns, D. W.;
Yang, Y.;
Yusuf, S.;
Coler, D. G.

Publication type:

Article

F-61 Depth-Resolved Speciation of Buried Nanolayers.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454995

By:

Pollakowski, B.;
Beckhoff, B.

Publication type:

Article

F-11 Glancing Versus Normal XRF Excitation with Monochromatic and Polychromatic Radiation for the Composition Analysis of SmCo Based Films on Silicon Wafers.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454994

By:

Cadieu, F. J.;
Vander, I.;
Zuneska, R. W.

Publication type:

Article

F-60 XRS for Preventive Conservation of Cultural Heritage.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454990

By:

Van Grieken, R.

Publication type:

Article

F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454988

By:

Elam, W. T.;
Scruggs, B.;
Eggert, F.;
Nicolosi, J.

Publication type:

Article

F-55 Indoor Air Quality in Brazilian Schools Nearby Industries: The Case of Curitiba.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454987

By:

Godoi, R. H. M.;
Godoi, A. F. L.;
Arantes, M. G.;
Gonçalves Jr, S. J.;
Stroppa, L. C.;
Alves, R.;
Gardolinski, J. E. Ferreira da Costa;
dos Reis Neto, J. Manoel;
Reynaldo, E. M. Fortunato de Lucena;
Alfody, B.;
Makarovska, Y.;
Van Grieken, R.

Publication type:

Article

F-39 Invited — Micro-XRF Analysis of Metal Alloys: From the Laboratory Calibration Towards In-Situ Analyses.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 214, doi. 10.1154/1.3454986

By:

Karydas, A. G.;
Kantarelou, V.;
Sokaras, D.;
Wegrzynek, D.;
Chinea-Cano, E.;
Markowicz, A.;
Wobrauschek, P.;
Streli, C.;
Uhlir, K.;
Griesser, M.

Publication type:

Article

F-7 Characterization of Silicon Drift Detectors for EDXRF.

Published in:

Powder Diffraction, 2010, v. 25, n. 2, p. 214, doi. 10.1154/1.3454985

By:

Redus, R.;
Pantazis, T.;
Pantazis, J.;
Huber, A.

Publication type:

Article