Works matching IS 2010135X AND DT 2012 AND VI 2 AND IP 2
1
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12410093
- GRINBERG, ILYA;
- TAKENAKA, HIROYUKI;
- SHIN, YOUNG-HAN;
- RAPPE, ANDREW M.
- Article
2
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12020018
- Article
3
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12410068
- Article
4
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X1241007X
- WANG, C. L.;
- ARAGÓ, C.;
- MARQUÉS, M. I.
- Article
5
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12410020
- Article
6
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X1241010X
- BOKOV, ALEXEI A.;
- YE, ZUO-GUANG
- Article
7
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12410032
- SHVARTSMAN, V. V.;
- KHOLKIN, A. L.
- Article
8
- Journal of Advanced Dielectrics, 2012, v. 2, n. 2, p. -1, doi. 10.1142/S2010135X12410056
- Article