SPECTROSCOPIC ELLIPSOMETRIC STUDIES ON THE OPTICAL PROPERTIES OF PHOSPHORUS DOPED NANOCRYSTALLINE NiO THIN FILMS.

DAS, N. S.; CHATTOPADHYAY, K. K.; SAHA, B.; THAPA, R.

Undoped and phosphorus doped nanocrystalline nickel oxide thin films have been synthesized on silicon and glass substrates by RF magnetron sputtering technique in pure Ar atmosphere. Proper phase formation was confirmed by X-ray diffraction analysis. Energy band gaps were determined using UV-Vis spectra. Formation of NiO nanoparticle of dimension ~15 nm was confirmed using HRTEM. Doping of phosphorus as an impurity was confirmed from EDX spectra and XPS studies. Spectroscopic ellipsometric studies were performed on such films and the spectra were analyzed with a suitable model. Optical constants were determined and refractive indices were found to increase with increase of phosphorus doping percentages.

ELLIPSOMETRY; OPTICAL properties of metals; PHOSPHORUS; DOPED semiconductors; X-ray spectroscopy; NANOCRYSTALS; NICKEL; THIN films; MAGNETRON sputtering

International Journal of Nanoscience, 2011, Vol 10, Issue 4/5, p985

0219-581X

Academic Journal

10.1142/S0219581X11008678