In the present work, Zinc-Tin-Oxide (ZTO) thin films were deposited on glass substrate with varying concentration (ZnO:SnO2-100:0, 90:10, 70:30 and 50:50 wt.%) at room temperature by flash evaporation technique. These deposited ZTO film were annealed in vacuum to study the thermal stability and to see the effects on the structural and optical properties. The XRF spectra revealed the presence of Zinc and Tin with varying concentration in ZTO thin films. XRD results show the crystallinity of the ZTO films was improved with increasing the concentration of SnO2 and post annealing. The surface composition and oxidation state were analyzed by X-ray photoelectron spectroscopy. The variation of % composition shows as the concentration of SnO2 increases from 0 to 50%, the atomic ratio of Sn/Zn and O/Zn increases for both types of ZTO films and deficiency of oxygen has been appeared after annealing. The optical band gap was also found to be decreased for both types of films with increasing concentration of SnO2.