Works matching DE "IMPURITY distribution in semiconductors"


Results: 160
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    Impurity detection in polymer parts for the semiconductor manufacturing industry.

    Published in:
    Technisches Messen, 2018, v. 85, n. 11, p. 700, doi. 10.1515/teme-2018-0056
    By:
    • Moldaschl, T.;
    • Arnold, T.;
    • Zauner, M.;
    • Meislitzer, S.;
    • Obersteiner, D.;
    • De Biasio, M.;
    • Steinbrener, J.;
    • Neumaier, L.;
    • Molzbichler, Albert;
    • Cramer, Heinz;
    • Ottersböck, B.;
    • Oreski, G.;
    • Voronko, Y.;
    • Kraft, M.;
    • Hirschl, Christina
    Publication type:
    Article
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    Impurity quantum phase transitions.

    Published in:
    Philosophical Magazine, 2006, v. 86, n. 13/14, p. 1807, doi. 10.1080/14786430500070396
    By:
    • Vojta, Matthias
    Publication type:
    Article
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    Far infrared study of local impurity modes of Boron-doped PbTe.

    Published in:
    Journal of Materials Science, 2012, v. 47, n. 5, p. 2384, doi. 10.1007/s10853-011-6057-8
    By:
    • Nikolic, P.;
    • Paraskevopoulos, K.;
    • Zachariadis, G.;
    • Valasiadis, O.;
    • Zorba, T.;
    • Vujatovic, S.;
    • Nikolic, N.;
    • Aleksic, O.;
    • Ivetic, T.;
    • Cvetkovic, O.;
    • Blagojevic, V.;
    • Nikolic, M.
    Publication type:
    Article
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    PECVD growth of crystalline silicon from its tetrafluoride.

    Published in:
    Crystal Research & Technology, 2010, v. 45, n. 9, p. 899, doi. 10.1002/crat.201000090
    By:
    • P. Sennikov;
    • D. Pryakhin;
    • N. Abrosimov;
    • B. Andreev;
    • Yu. Drozdov;
    • M. Drozdov;
    • A. Kuznetsov;
    • A. Murel;
    • H.J. Pohl;
    • H. Riemann;
    • V. Shashkin
    Publication type:
    Article
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    Neutron Powder Diffraction Study in LaAgMnO.

    Published in:
    Journal of Superconductivity & Novel Magnetism, 2011, v. 24, n. 6, p. 1933, doi. 10.1007/s10948-011-1147-z
    By:
    • Samantaray, B.;
    • Srivastava, S. K.;
    • Ravi, S.;
    • Dhiman, I.;
    • Das, A.
    Publication type:
    Article
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    Pattern formation in semiconductors.

    Published in:
    Nature, 1999, v. 397, n. 6718, p. 398
    By:
    • Bel¿kov, V. V.;
    • Hirschinger, J.;
    • Novák, V.;
    • Niedernostheide, F.-J.;
    • Ganichev, S.D.;
    • Prettl, W.
    Publication type:
    Article
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    KLEIN TUNNELING IN THE PRESENCE OF RANDOM IMPURITIES.

    Published in:
    International Journal of Modern Physics C: Computational Physics & Physical Computation, 2012, v. 23, n. 12, p. 1, doi. 10.1142/S0129183112500805
    By:
    • PALPACELLI, S.;
    • MENDOZA, M.;
    • HERRMANN, H. J.;
    • SUCCI, S.
    Publication type:
    Article
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    NMR investigation of boron impurities in refined metallurgical grade silicon.

    Published in:
    Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 9, p. 2031, doi. 10.1002/pssa.201431908
    By:
    • Grafe, Hans‐Joachim;
    • Löser, Wolfgang;
    • Schmitz, Steffen;
    • Sakaliyska, Miroslava;
    • Wurmehl, Sabine;
    • Eisert, Stefan;
    • Reichenbach, Birk;
    • Acker, Jörg;
    • Rietig, Anja;
    • Ducke, Jana;
    • Müller, Tim
    Publication type:
    Article
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