Works matching IS 10637842 AND DT 2009 AND VI 54 AND IP 4
Results: 26
Formation of a misorientation band in the elastic field of a disclination dipole.
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- Technical Physics, 2009, v. 54, n. 4, p. 549, doi. 10.1134/S1063784209040161
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Low-field ion microscopy.
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- Technical Physics, 2009, v. 54, n. 4, p. 580, doi. 10.1134/S1063784209040215
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Experimental study of critical thermal load during boiling of binary liquid mixtures.
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- Technical Physics, 2009, v. 54, n. 4, p. 597, doi. 10.1134/S1063784209040252
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Generalization of the Zhukovsky function to the electric field of gratings formed by tilted metallic strips.
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- Technical Physics, 2009, v. 54, n. 4, p. 452, doi. 10.1134/S1063784209040021
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Effect of magnetic field on freely moving superconductors in the audio band.
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- Technical Physics, 2009, v. 54, n. 4, p. 542, doi. 10.1134/S106378420904015X
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Influence of relaxation processes on amplitude and shape of echo signals.
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- Technical Physics, 2009, v. 54, n. 4, p. 457, doi. 10.1134/S1063784209040033
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Nonlinear effects in damping of a standing wave in a gas.
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- Technical Physics, 2009, v. 54, n. 4, p. 476, doi. 10.1134/S1063784209040069
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Classification of shock wave reflections from a wedge. Part 2: Experimental and numerical simulations of different types of Mach reflections.
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- Technical Physics, 2009, v. 54, n. 4, p. 497, doi. 10.1134/S1063784209040094
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Determining angles of incidence and heights of quantum dot faces by analyzing X-ray diffuse and specular scattering.
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- Technical Physics, 2009, v. 54, n. 4, p. 561, doi. 10.1134/S1063784209040185
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Influence of shape and chemical and phase compositions of iron-containing particles on microwave performance of composites with an insulating matrix.
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- Technical Physics, 2009, v. 54, n. 4, p. 569, doi. 10.1134/S1063784209040197
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Dynamics of twist effect in a dual-frequency nematic liquid crystal.
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- Technical Physics, 2009, v. 54, n. 4, p. 555, doi. 10.1134/S1063784209040173
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Electron-impact fragmentation of ascorbic acid.
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- Technical Physics, 2009, v. 54, n. 4, p. 463, doi. 10.1134/S1063784209040045
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Dynamic drag of dislocations in crystal with structural imperfections.
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- Technical Physics, 2009, v. 54, n. 4, p. 590, doi. 10.1134/S1063784209040239
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Femtosecond Fourier interferometry of a nonideal plasma.
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- Technical Physics, 2009, v. 54, n. 4, p. 520, doi. 10.1134/S1063784209040124
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Properties of the transport layer formed at the interface between two polymer films.
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- Technical Physics, 2009, v. 54, n. 4, p. 575, doi. 10.1134/S1063784209040203
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On diffusion lengths of Ga adatoms on AlAs(111) and GaAs(111) surfaces.
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- Technical Physics, 2009, v. 54, n. 4, p. 586, doi. 10.1134/S1063784209040227
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Electrostatic instability of a heavily charged conducting liquid jet.
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- Technical Physics, 2009, v. 54, n. 4, p. 482, doi. 10.1134/S1063784209040070
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Classification of shock wave reflections from a wedge. Part 1: Boundaries and domains of existence for different types of reflections.
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- Technical Physics, 2009, v. 54, n. 4, p. 491, doi. 10.1134/S1063784209040082
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Variation in thickness of wetting water films in nonuniform electric field.
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- Technical Physics, 2009, v. 54, n. 4, p. 469, doi. 10.1134/S1063784209040057
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Relation between a linear thermal expansion coefficient and residual stresses.
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- Technical Physics, 2009, v. 54, n. 4, p. 535, doi. 10.1134/S1063784209040148
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Chemical potential jump during evaporation of a Fermi gas.
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- Technical Physics, 2009, v. 54, n. 4, p. 443, doi. 10.1134/S106378420904001X
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Algorithm for determining the aerodynamic characteristics of a freely flying object from discrete data of ballistic experiment. Part 2.
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- Technical Physics, 2009, v. 54, n. 4, p. 511, doi. 10.1134/S1063784209040112
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Poisson ratio and plasticity of glasses.
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- Technical Physics, 2009, v. 54, n. 4, p. 594, doi. 10.1134/S1063784209040240
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Algorithm for determining the aerodynamic characteristics of a freely flying object from discrete data of ballistic experiment. Part I.
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- Technical Physics, 2009, v. 54, n. 4, p. 504, doi. 10.1134/S1063784209040100
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Effect of mechanical deformation on development of helium porosity.
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- Technical Physics, 2009, v. 54, n. 4, p. 527, doi. 10.1134/S1063784209040136
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Formation of silicon carbide and diamond nanoparticles in the surface layer of a silicon target during short-pulse carbon ion implantation.
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- Technical Physics, 2009, v. 54, n. 4, p. 600, doi. 10.1134/S1063784209040264
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