Results: 20
Structural and Dielectric Study of Thin Amorphous Layers of the Ge–Sb–Te System Prepared by RF Magnetron Sputtering.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 201, doi. 10.1134/S106378262002013X
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- Publication type:
- Article
Influence of Radiation Defects Induced by Low-Energy Protons at a Temperature of 83 K on the Characteristics of Silicon Photoelectric Structures.
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- Semiconductors, 2020, v. 54, n. 2, p. 196, doi. 10.1134/S1063782620020062
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- Article
Investigation of the Influences of Post-Thermal Annealing on Physical Properties of TiO2 Thin Films Deposited by RF Sputtering.
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- Semiconductors, 2020, v. 54, n. 2, p. 268, doi. 10.1134/S1063782620020086
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- Publication type:
- Article
Comparative Analysis of Injection Microdisk Lasers Based on InGaAsN Quantum Wells and InAs/InGaAs Quantum Dots.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 263, doi. 10.1134/S1063782620020177
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- Article
Long-Wavelength LEDs in the Atmospheric Transparency Window of 4.6–5.3 μm.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 253, doi. 10.1134/S1063782620020189
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- Publication type:
- Article
Edge-Termination Technique for High-Voltage Mesa-Structure 4H-SiC Devices: Negative Beveling.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 258, doi. 10.1134/S1063782620020153
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- Article
Effect of Temperature on the Characteristics of 4H-SiC UV Photodetectors.
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- Semiconductors, 2020, v. 54, n. 2, p. 246, doi. 10.1134/S1063782620020128
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- Article
Model of the Effect of the Gate Bias on MOS Structures under Ionizing Radiation.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 240, doi. 10.1134/S1063782620020025
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- Publication type:
- Article
Model of the Negative-Bias Temperature Instability of p-MOS Transistors.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 233, doi. 10.1134/S1063782620020037
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- Publication type:
- Article
Molecular States of Composite Fermions in Self-Organized InP/GaInP Quantum Dots in Zero Magnetic Field.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 190, doi. 10.1134/S1063782620020165
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- Publication type:
- Article
Ge/Si Core/Shell Quantum Dots in an Alumina Matrix: Influence of the Annealing Temperature on the Optical Properties.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 181, doi. 10.1134/S1063782620020207
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- Publication type:
- Article
Exactly Solvable Model Problem on a Graphene Nanoribbon with Zigzag Edges.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 222, doi. 10.1134/S1063782620020074
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- Publication type:
- Article
Structural and Photoluminescence Properties of Graphite-Like Carbon Nitride.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 228, doi. 10.1134/S1063782620020049
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- Publication type:
- Article
Energy-Efficient Gas Sensors Based on Nanocrystalline Indium Oxide.
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- Semiconductors, 2020, v. 54, n. 2, p. 217, doi. 10.1134/S1063782620020098
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- Article
Dielectric Spectroscopy and Features of the Mechanism of the Semiconductor–Metal Phase Transition in VO2 Films.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 205, doi. 10.1134/S1063782620020116
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- Article
Effect of Temperature on the Morphology of Planar GaAs Nanowires (Simulation).
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 212, doi. 10.1134/S1063782620020190
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- Article
Profiling Mobility Components near the Heterointerfaces of Thin Silicon Films.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 176, doi. 10.1134/S1063782620020219
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- Publication type:
- Article
Fabrication and Analysis of the Current Transport Mechanism of Ni/n-GaN Schottky Barrier Diodes through Different Models.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 169, doi. 10.1134/S1063782620020141
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- Publication type:
- Article
Negative Differential Conductivity of Lanthanum-Oxide-Based Structures.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 163, doi. 10.1134/S1063782620020104
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- Publication type:
- Article
Thermal Conductivity of Cu2ZnGe1 –xSnxSe4 Alloys.
- Published in:
- Semiconductors, 2020, v. 54, n. 2, p. 159, doi. 10.1134/S1063782620020050
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- Article