Works matching IS 10637826 AND DT 2018 AND VI 52 AND IP 16
1
- Semiconductors, 2018, v. 52, n. 16, p. 2149, doi. 10.1134/S1063782618160406
- Zinovyev, V. A.;
- Zinovieva, A. F.;
- Katsuba, A. V.;
- Smagina, Zh. V.;
- Dvurechenskii, A. V.;
- Borodavchenko, O. M.;
- Zhivulko, V. D.;
- Mudryi, A. V.
- Article
2
- Semiconductors, 2018, v. 52, n. 16, p. 2146, doi. 10.1134/S1063782618160285
- Shtrom, I. V.;
- Kotlyar, K. P.;
- Filosofov, N. G.;
- Serov, A. Yu.;
- Krizhkov, D. I.;
- Samsonenko, Yu. B.;
- Ilkiev, I. V.;
- Reznik, R. R.;
- Agekyan, V. F.;
- Cirlin, G. E.
- Article
3
- Semiconductors, 2018, v. 52, n. 16, p. 2143, doi. 10.1134/S1063782618160261
- Sergeeva, K. A.;
- Sergeev, A. A.;
- Postnova, I. V.;
- Voznesenskiy, S. S.
- Article
4
- Semiconductors, 2018, v. 52, n. 16, p. 2140, doi. 10.1134/S1063782618160352
- Tarasenko, N. V.;
- Butsen, A. V.;
- Nevar, A. A.;
- Tarasenka, N. N.;
- Stankevičius, E.;
- Gečys, P.;
- Trusovas, R.;
- Daugnoraitė, E.;
- Račiukaitis, G.
- Article
5
- Semiconductors, 2018, v. 52, n. 16, p. 2135, doi. 10.1134/S1063782618160340
- Spirina, A. A.;
- Nastovjak, A. G.;
- Neizvestny, I. G.;
- Shwartz, N. L.
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6
- Semiconductors, 2018, v. 52, n. 16, p. 2132, doi. 10.1134/S1063782618160339
- Sokolovskii, A. S.;
- Besedina, N. A.;
- Berdnikov, Yu.;
- Dubrovskii, V. G.
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7
- Semiconductors, 2018, v. 52, n. 16, p. 2128, doi. 10.1134/S1063782618160327
- Sobolev, M. S.;
- Lazarenko, A. A.;
- Mizerov, A. M.;
- Nikitina, E. V.;
- Pirogov, E. V.;
- Timoshnev, S. N.;
- Bouravleuv, A. D.
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8
- Semiconductors, 2018, v. 52, n. 16, p. 2124, doi. 10.1134/S1063782618160315
- Sibirev, N. V.;
- Koryakin, A. A.;
- Berdnikov, Y. S.
- Article
9
- Semiconductors, 2018, v. 52, n. 16, p. 2120, doi. 10.1134/S1063782618160303
- Sibirev, N. V.;
- Belyaev, V. V.;
- Berdnikov, Y. S.
- Article
10
- Semiconductors, 2018, v. 52, n. 16, p. 2117, doi. 10.1134/S1063782618160297
- Shubina, K. Yu.;
- Berezovskaya, T. N.;
- Mokhov, D. V.;
- Morozov, I. A.;
- Kotlyar, K. P.;
- Mizerov, A. M.;
- Nikitina, E. V.;
- Bouravleuv, A. D.
- Article
11
- Semiconductors, 2018, v. 52, n. 16, p. 2114, doi. 10.1134/S1063782618160212
- Mitrofanov, M. I.;
- Levitskii, I. V.;
- Voznyuk, G. V.;
- Tatarinov, E. E.;
- Rodin, S. N.;
- Lundin, W. V.;
- Evtikhiev, V. P.;
- Mizerov, M.N.
- Article
12
- Semiconductors, 2018, v. 52, n. 16, p. 2111, doi. 10.1134/S1063782618160133
- Komarov, F. F.;
- Makhavikou, M. A.;
- Vlasukova, L. A.;
- Milchanin, O. V.;
- Skuratov, V. A.;
- Vuuren, A. Janse;
- Neetling, J. N.;
- Parkhomenko, I. N.;
- Żuk, J.
- Article
13
- Semiconductors, 2018, v. 52, n. 16, p. 2107, doi. 10.1134/S1063782618160170
- Lutsenko, E. V.;
- Rzheutski, M. V.;
- Vainilovich, A. G.;
- Svitsiankou, I. E.;
- Shulenkova, V. A.;
- Muravitskaya, E. V.;
- Alexeev, A. N.;
- Petrov, S. I.;
- Yablonskii, G. P.
- Article
14
- Semiconductors, 2018, v. 52, n. 16, p. 2103, doi. 10.1134/S1063782618160157
- Lapina, V. A.;
- Pavich, T. A.;
- Pershukevich, P. P.
- Article
15
- Semiconductors, 2018, v. 52, n. 16, p. 2099, doi. 10.1134/S106378261816011X
- Kazak, N. S.;
- Agabekov, V. E.;
- Kurilkina, S. N.;
- Belyi, V. N.
- Article
16
- Semiconductors, 2018, v. 52, n. 16, p. 2096, doi. 10.1134/S1063782618160145
- Kotlyar, K. P.;
- Soshnikov, I. P.;
- Morozov, I. A.;
- Berezovskaya, T. N.;
- Kryzhanovskaya, N. V.;
- Kudryashov, D. A.;
- Lysak, V. V.
- Article
17
- Semiconductors, 2018, v. 52, n. 16, p. 2092, doi. 10.1134/S106378261816008X
- Fedorov, V. V.;
- Bolshakov, A. D.;
- Dvoretckaia, L. N.;
- Sapunov, G. A.;
- Kirilenko, D. A.;
- Mozharov, A. M.;
- Shugurov, K. Yu.;
- Shkoldin, V. A.;
- Cirlin, G. E.;
- Mukhin, I. S.
- Article
18
- Semiconductors, 2018, v. 52, n. 16, p. 2088, doi. 10.1134/S1063782618160054
- Bolshakov, A. D.;
- Dvoretckaia, L. N.;
- Fedorov, V. V.;
- Sapunov, G. A.;
- Mozharov, A. M.;
- Shugurov, K. Yu.;
- Shkoldin, V. A.;
- Mukhin, M. S.;
- Cirlin, G. E.;
- Mukhin, I. S.
- Article
19
- Semiconductors, 2018, v. 52, n. 16, p. 2085, doi. 10.1134/S1063782618160042
- Berdnikov, Yu. S.;
- Sibirev, N. V.
- Article
20
- Semiconductors, 2018, v. 52, n. 16, p. 2081, doi. 10.1134/S1063782618160030
- Astankova, K. N.;
- Kozhukhov, A. S.;
- Gorokhov, E. B.;
- Azarov, I. A.;
- Latyshev, A. V.
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21
- Semiconductors, 2018, v. 52, n. 16, p. 2078, doi. 10.1134/S1063782618160376
- Ushakov, N. M.;
- Vasil'kov, M. Yu.;
- Shaturnuy, V. R.
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22
- Semiconductors, 2018, v. 52, n. 16, p. 2073, doi. 10.1134/S1063782618160364
- Tarasov, I. A.;
- Smolyarova, T. E.;
- Yakovlev, I. A.;
- Kosyrev, N. N.;
- Komarov, V. A.;
- Nemtsev, I. V.;
- Varnakov, S. N.;
- Patrin, S. G.;
- Ovchinnikov, S. G.
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23
- Semiconductors, 2018, v. 52, n. 16, p. 2070, doi. 10.1134/S1063782618160121
- Khramov, E. V.;
- Privezentsev, V. V.
- Article
24
- Semiconductors, 2018, v. 52, n. 16, p. 2068, doi. 10.1134/S1063782618160248
- Prislopski, S. Ya.;
- Gaponenko, S. V.;
- Monaico, E.;
- Sergentu, V. V.;
- Tiginyanu, I. M.
- Article
25
- Semiconductors, 2018, v. 52, n. 16, p. 2065, doi. 10.1134/S1063782618160224
- Muravijova, D. V.;
- Ermakov, I. A.;
- Eurov, D. A.;
- Kirilenko, D. A.;
- Kurdyukov, D. A.;
- Rabchinskii, M. K.;
- Shvidchenko, A. V.;
- Trofimuk, A. D.;
- Baidakova, M. V.
- Article
26
- Semiconductors, 2018, v. 52, n. 16, p. 2061, doi. 10.1134/S1063782618160200
- Article
27
- Semiconductors, 2018, v. 52, n. 16, p. 2057, doi. 10.1134/S1063782618160194
- Mikoushkin, V. M.;
- Bryzgalov, V. V.;
- Makarevskaya, E. A.;
- Solonitsyna, A. P.;
- Marchenko, D.E.
- Article
28
- Semiconductors, 2018, v. 52, n. 16, p. 2054, doi. 10.1134/S1063782618160108
- Gurinovich, L. I.;
- Trotsiuk, L. L.;
- Kulakovich, O. S.;
- Sushko, N. I.;
- Demir, H. V.;
- Gaponenko, S. V.
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29
- Semiconductors, 2018, v. 52, n. 16, p. 2049, doi. 10.1134/S1063782618160091
- Goray, L. I.;
- Asadchikov, V. E.;
- Roshchin, B. S.;
- Volkov, Yu. O.;
- Tikhonov, A. M.
- Article
30
- Semiconductors, 2018, v. 52, n. 16, p. 2046, doi. 10.1134/S1063782618160078
- Dunaevskiy, M. S.;
- Alekseev, P. A.;
- Monakhov, A. M.;
- Sokolovskii, G. S.;
- Baranov, A. N.;
- Arinero, R.;
- Teissier, R.
- Article
31
- Semiconductors, 2018, v. 52, n. 16, p. 2039, doi. 10.1134/S1063782618160182
- Muhammad Maqbool;
- Alruwaili, Amani;
- Milinovic, Dunja;
- Khan, Tahirzeb;
- Ali, Ghafar;
- Ahmad, Iftikhar
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32
- Semiconductors, 2018, v. 52, n. 16, p. 2030, doi. 10.1134/S1063782618160066
- Demir, I.;
- Altuntas, I.;
- Kasapoğlu, A. E.;
- Mobtakeri, S.;
- Gür, E.;
- Elagoz, S.
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33
- Semiconductors, 2018, v. 52, n. 16, p. 2026, doi. 10.1134/S106378261816039X
- Lianhong Yang;
- Guo, Fuqiang;
- Zhang, Baohua;
- Li, Yanqing;
- Chen, Dunjun
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34
- Semiconductors, 2018, v. 52, n. 16, p. 2022, doi. 10.1134/S1063782618160236
- Petrosyan, S. G.;
- Yesayan, A. E.;
- Nersesyan, S. R.;
- Khachatryan, V. A.
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35
- Semiconductors, 2018, v. 52, n. 16, p. 2017, doi. 10.1134/S1063782618160169
- Yajie Li;
- Wang, Pengfei;
- Meng, Fangyuan;
- Yu, Hongyan;
- Zhou, Xuliang;
- Wang, Huolei;
- Pan, Jiaoqing
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36
- Semiconductors, 2018, v. 52, n. 16, p. 2007, doi. 10.1134/S1063782618160273
- Seyidov, MirHasan Yu.;
- Suleymanov, R. A.;
- Şale, Yasin;
- Kandemir, Buket Bilgen
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37
- Semiconductors, 2018, v. 52, n. 16, p. 1998, doi. 10.1134/S106378261816025X
- Rabehi, A.;
- Amrani, M.;
- Benamara, Z.;
- Akkal, B.;
- Ziane, A.;
- Guermoui, M.;
- Hatem-Kacha, A.;
- Monier, G.;
- Gruzza, B.;
- Bideux, L.;
- Robert-Goumet, C.
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38
- Semiconductors, 2018, v. 52, n. 16, p. 1991, doi. 10.1134/S1063782618160029
- Ajayan, J.;
- Ravichandran, T.;
- Mohankumar, P.;
- Prajoon, P.;
- Pravin, J. Charles;
- Nirmal, D.
- Article