Works matching IS 10637826 AND DT 2016 AND VI 50 AND IP 8
Results: 27
Temperature dependence of the hall coefficient in the ВiSb System ( x = 0.06, 0.12).
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- Semiconductors, 2016, v. 50, n. 8, p. 996, doi. 10.1134/S1063782616080248
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Spectra of low-temperature photoluminescence in thin polycrystalline CdTe films.
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- Semiconductors, 2016, v. 50, n. 8, p. 1001, doi. 10.1134/S1063782616080194
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Study of the impurity photoconductivity in p-InSb using epitaxial p contacts.
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- Semiconductors, 2016, v. 50, n. 8, p. 1005, doi. 10.1134/S1063782616080108
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Electrical, optical, and photoluminescence properties of ZnO films subjected to thermal annealing and treatment in hydrogen plasma.
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- Semiconductors, 2016, v. 50, n. 8, p. 1010, doi. 10.1134/S1063782616080029
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Conduction in titanium dioxide films and metal-TiO-Si structures.
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- Semiconductors, 2016, v. 50, n. 8, p. 1015, doi. 10.1134/S1063782616080133
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Electrical and photoelectric properties of n-TiN/ p-HgInTe heterostructures.
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- Semiconductors, 2016, v. 50, n. 8, p. 1020, doi. 10.1134/S1063782616080236
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Room temperature de Haas-van Alphen effect in silicon nanosandwiches.
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- Semiconductors, 2016, v. 50, n. 8, p. 1025, doi. 10.1134/S1063782616080273
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Prompt quality monitoring of InSe and GaSe semiconductor crystals by the nuclear quadrupole resonance technique.
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- Semiconductors, 2016, v. 50, n. 8, p. 1034, doi. 10.1134/S1063782616080200
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Photoluminescence kinetics slowdown in an ensemble of GaN/AlN quantum dots upon tunneling interaction with defects.
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- Semiconductors, 2016, v. 50, n. 8, p. 1038, doi. 10.1134/S1063782616080042
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Elastic strains and delocalized optical phonons in AlN/GaN superlattices.
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- Semiconductors, 2016, v. 50, n. 8, p. 1043, doi. 10.1134/S1063782616080169
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Nonequilibrium chemical potential in a two-dimensional electron gas in the quantum-Hall-effect regime.
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- Semiconductors, 2016, v. 50, n. 8, p. 1049, doi. 10.1134/S1063782616080170
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Effect of uniaxial deformation on the current-voltage characteristic of a p-Ge/ n-GaAs heterostructure.
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- Semiconductors, 2016, v. 50, n. 8, p. 1054, doi. 10.1134/S106378261608011X
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Carrier velocity effect on carbon nanotube Schottky contact.
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- Semiconductors, 2016, v. 50, n. 8, p. 1056, doi. 10.1134/S1063782616080285
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Electromagnetic radiation of electrons in corrugated graphene.
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- Semiconductors, 2016, v. 50, n. 8, p. 1060, doi. 10.1134/S1063782616080157
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Graphene-oxide films printed on rigid and flexible substrates for a wide spectrum of applications.
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- Semiconductors, 2016, v. 50, n. 8, p. 1065, doi. 10.1134/S1063782616080066
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Study of the photoinduced degradation of tandem photovoltaic converters based on a-Si:H/μ c-Si:H.
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- Semiconductors, 2016, v. 50, n. 8, p. 1074, doi. 10.1134/S1063782616080030
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Dynamic thermoelectric model of a light-emitting structure with a current spreading layer.
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- Semiconductors, 2016, v. 50, n. 8, p. 1079, doi. 10.1134/S1063782616080224
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Comparison of the characteristics of solar cells fabricated from multicrystalline silicon with those fabricated from silicon obtained by the monolike technology.
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- Semiconductors, 2016, v. 50, n. 8, p. 1085, doi. 10.1134/S1063782616080091
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Transition times between the extremum points of the current-voltage characteristic of a resonant tunneling diode with hysteresis.
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- Semiconductors, 2016, v. 50, n. 8, p. 1092, doi. 10.1134/S1063782616080121
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Optical properties of photodetectors based on single GaN nanowires with a transparent graphene contact.
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- Semiconductors, 2016, v. 50, n. 8, p. 1097, doi. 10.1134/S106378261608008X
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Heterojunction low-barrier gaas diodes with an improved reverse I-V characteristic.
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- Semiconductors, 2016, v. 50, n. 8, p. 1102, doi. 10.1134/S106378261608025X
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Estimation of the efficiency of the introduction of a porous layer into a silicon-on-sapphire structure substrate to enhance the reliability of devices under irradiation.
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- Semiconductors, 2016, v. 50, n. 8, p. 1107, doi. 10.1134/S1063782616080054
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On a silicon-based photonic-crystal cavity for the near-IR region: Numerical simulation and formation technology.
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- Semiconductors, 2016, v. 50, n. 8, p. 1112, doi. 10.1134/S1063782616080212
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On a two-layer SiN/SiO dielectric mask for low-resistance ohmic contacts to AlGaN/GaN HEMTs.
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- Semiconductors, 2016, v. 50, n. 8, p. 1117, doi. 10.1134/S1063782616080078
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Formation of donors in germanium-silicon alloys implanted with hydrogen ions with different energies.
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- Semiconductors, 2016, v. 50, n. 8, p. 1122, doi. 10.1134/S1063782616080182
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Changes in the conductivity of lead-selenide thin films after plasma etching.
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- Semiconductors, 2016, v. 50, n. 8, p. 1125, doi. 10.1134/S1063782616080261
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Effect of an increase in the density of collision cascades on the efficiency of the generation of primary displacements during the ion bombardment of Si.
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- Semiconductors, 2016, v. 50, n. 8, p. 989, doi. 10.1134/S1063782616080145
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