Works matching IS 10637826 AND DT 2014 AND VI 48 AND IP 4
Results: 26
Specific features of the sol-gel formation and optical properties of 3 d metal/porous silicon composites.
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- Semiconductors, 2014, v. 48, n. 4, p. 551, doi. 10.1134/S1063782614040174
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Morphological characteristics of grain boundaries in multicrystalline silicon.
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- Semiconductors, 2014, v. 48, n. 4, p. 476, doi. 10.1134/S1063782614040228
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p-GaSb(Ox)/ n-GaSb native-oxide heterojunctions: Non-vacuum process and photoelectric properties.
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- Semiconductors, 2014, v. 48, n. 4, p. 455, doi. 10.1134/S106378261404023X
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Electrical properties of MOS diodes In/TiO/ p-CdTe.
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- Semiconductors, 2014, v. 48, n. 4, p. 487, doi. 10.1134/S1063782614040071
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Long-channel field-effect transistor with short-channel transistor properties.
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- Semiconductors, 2014, v. 48, n. 4, p. 481, doi. 10.1134/S1063782614040137
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Structure and properties of electrodeposited films and film stacks for precursors of chalcopyrite and kesterite solar cells.
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- Semiconductors, 2014, v. 48, n. 4, p. 521, doi. 10.1134/S1063782614040150
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On the polarization caused by bulk charges and the ionic conductivity in TlInSe crystals.
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- Semiconductors, 2014, v. 48, n. 4, p. 427, doi. 10.1134/S1063782614040253
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On the thermal properties of AgTe and AgSe in the region of the phase transition.
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- Semiconductors, 2014, v. 48, n. 4, p. 423, doi. 10.1134/S1063782614040058
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Analytical model of the electrical instability mechanism in multibarrier heterostructures with tunnel-opaque barriers.
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- Semiconductors, 2014, v. 48, n. 4, p. 465, doi. 10.1134/S1063782614040113
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Formation of built-in potential in Si (100) crystals under microwave plasma treatment.
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- Semiconductors, 2014, v. 48, n. 4, p. 511, doi. 10.1134/S1063782614040277
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Effect of the tin impurity on the energy spectrum and photoelectric properties of nanostructured InO films.
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- Semiconductors, 2014, v. 48, n. 4, p. 451, doi. 10.1134/S1063782614040083
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Thermoelectric efficiency of intermetallic compound ZnSb.
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- Semiconductors, 2014, v. 48, n. 4, p. 432, doi. 10.1134/S1063782614040095
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Defect formation and recrystallization mechanisms in silicon-on-sapphire films under ion irradiation.
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- Semiconductors, 2014, v. 48, n. 4, p. 517, doi. 10.1134/S1063782614040265
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Features of the band structure of (CuInSe)(MeSe) alloys (Me = Mn, Fe).
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- Semiconductors, 2014, v. 48, n. 4, p. 417, doi. 10.1134/S1063782614040101
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Properties of ZnCoO films produced by pulsed laser deposition with fast particle separation.
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- Semiconductors, 2014, v. 48, n. 4, p. 538, doi. 10.1134/S1063782614040186
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Effect of low-temperature annealing on the quality of InSe layered single crystals and the characteristics of n-InSe/ p-InSe heterojunctions.
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- Semiconductors, 2014, v. 48, n. 4, p. 545, doi. 10.1134/S1063782614040149
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Study of GaInP solar-cell interfaces by variable-flux spectral measurements.
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- Semiconductors, 2014, v. 48, n. 4, p. 459, doi. 10.1134/S1063782614040216
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Current flow through metal shunts in ohmic contacts to n-Si.
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- Semiconductors, 2014, v. 48, n. 4, p. 492, doi. 10.1134/S1063782614040241
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Light emission from tin-dioxide crystals.
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- Semiconductors, 2014, v. 48, n. 4, p. 442, doi. 10.1134/S1063782614040034
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Nonlinear optical effect upon the irradiation of GaN with cluster ions.
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- Semiconductors, 2014, v. 48, n. 4, p. 446, doi. 10.1134/S1063782614040125
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Ultra-wide electroluminescence spectrum of LED heterostructures based on GaPAsN semiconductor alloys.
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- Semiconductors, 2014, v. 48, n. 4, p. 501, doi. 10.1134/S106378261404006X
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Electrodeposited zinc oxide arrays with the moth-eye effect.
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- Semiconductors, 2014, v. 48, n. 4, p. 531, doi. 10.1134/S1063782614040162
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Composite materials based on nanostructured zinc oxide.
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- Semiconductors, 2014, v. 48, n. 4, p. 471, doi. 10.1134/S1063782614040022
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Model of the behavior of MOS structures under ionizing irradiation.
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- Semiconductors, 2014, v. 48, n. 4, p. 505, doi. 10.1134/S1063782614040046
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Electrical properties of MOS capacitors formed by PEALD grown AlO on silicon.
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- Semiconductors, 2014, v. 48, n. 4, p. 497, doi. 10.1134/S1063782614040204
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Calculation of the electron mobility for the Δ model of the conduction band of germanium single crystals.
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- Semiconductors, 2014, v. 48, n. 4, p. 438, doi. 10.1134/S1063782614040198
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