Works matching IS 10637826 AND DT 2011 AND VI 45 AND IP 7
1
- Semiconductors, 2011, v. 45, n. 7, p. 958, doi. 10.1134/S1063782611070177
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2
- Semiconductors, 2011, v. 45, n. 7, p. 872, doi. 10.1134/S1063782611070153
- Mynbaev, K.;
- Bazhenov, N.;
- Ivanov-Omskii, V.;
- Mikhailov, N.;
- Yakushev, M.;
- Sorochkin, A.;
- Remesnik, V.;
- Dvoretsky, S.;
- Varavin, V.;
- Sidorov, Yu.
- Article
3
- Semiconductors, 2011, v. 45, n. 7, p. 907, doi. 10.1134/S1063782611070219
- Talochkin, A.;
- Chistokhin, I.
- Article
4
- Semiconductors, 2011, v. 45, n. 7, p. 865, doi. 10.1134/S1063782611070049
- Article
5
- Semiconductors, 2011, v. 45, n. 7, p. 926, doi. 10.1134/S1063782611070232
- Yakushev, M.;
- Gutakovsky, A.;
- Sabinina, I.;
- Sidorov, Yu.
- Article
6
- Semiconductors, 2011, v. 45, n. 7, p. 850, doi. 10.1134/S1063782611070190
- Romaka, V.;
- Rogl, P.;
- Hlil, E.;
- Stadnyk, Yu.;
- Budgerak, S.
- Article
7
- Semiconductors, 2011, v. 45, n. 7, p. 880, doi. 10.1134/S1063782611070025
- Bagaev, V.;
- Klevkov, Yu.;
- Kolosov, S.;
- Krivobok, V.;
- Onishchenko, E.;
- Shepel, A.
- Article
8
- Semiconductors, 2011, v. 45, n. 7, p. 944, doi. 10.1134/S1063782611070098
- Goldman, E.;
- Kukharskaya, N.;
- Narishkina, V.;
- Chucheva, G.
- Article
9
- Semiconductors, 2011, v. 45, n. 7, p. 950, doi. 10.1134/S1063782611070086
- Gaponenko, N.;
- Kortov, V.;
- Orekhovskaya, T.;
- Nikolaenko, I.;
- Pustovarov, V.;
- Zvonarev, S.;
- Slesarev, A.;
- Prislopski, S.
- Article
10
- Semiconductors, 2011, v. 45, n. 7, p. 917, doi. 10.1134/S1063782611070207
- Article
11
- Semiconductors, 2011, v. 45, n. 7, p. 861, doi. 10.1134/S1063782611070050
- Article
12
- Semiconductors, 2011, v. 45, n. 7, p. 962, doi. 10.1134/S1063782611070116
- Kryzhanovskaya, N.;
- Blokhin, S.;
- Maximov, M.;
- Nadtochy, A.;
- Zhukov, A.;
- Fedorova, K.;
- Ledentsov, N.;
- Ustinov, V.;
- Il'inskaya, N.;
- Bimberg, D.
- Article
13
- Semiconductors, 2011, v. 45, n. 7, p. 888, doi. 10.1134/S106378261107013X
- Article
14
- Semiconductors, 2011, v. 45, n. 7, p. 954, doi. 10.1134/S1063782611070037
- Bilenko, D.;
- Galushka, V.;
- Jarkova, E.;
- Mysenko, I.;
- Terin, D.;
- Hasina, E.
- Article
15
- Semiconductors, 2011, v. 45, n. 7, p. 912, doi. 10.1134/S1063782611070062
- Bodnar, I.;
- Rud, V.;
- Rud, Yu.;
- Lozhkin, D.
- Article
16
- Semiconductors, 2011, v. 45, n. 7, p. 837, doi. 10.1134/S1063782611070141
- Moskvin, P.;
- Rashkovetskii, L.;
- Sizov, F.;
- Moshnikov, V.
- Article
17
- Semiconductors, 2011, v. 45, n. 7, p. 845, doi. 10.1134/S1063782611070128
- Kulbachinskii, V.;
- Kytin, V.;
- Lavrukhina, Z.;
- Kuznetsov, A.;
- Markelov, A.;
- Shevelkov, A.
- Article
18
- Semiconductors, 2011, v. 45, n. 7, p. 966, doi. 10.1134/S1063782611070244
- Zhukov, A.;
- Arakcheeva, E.;
- Gordeev, N.;
- Zubov, F.;
- Kryzhanovskaya, N.;
- Maximov, M.;
- Savelyev, A.
- Article
19
- Semiconductors, 2011, v. 45, n. 7, p. 900, doi. 10.1134/S1063782611070104
- Article
20
- Semiconductors, 2011, v. 45, n. 7, p. 857, doi. 10.1134/S1063782611070165
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21
- Semiconductors, 2011, v. 45, n. 7, p. 894, doi. 10.1134/S1063782611070074
- Borschak, V.;
- Smyntyna, V.;
- Brytavskyi, Ie.;
- Balaban, A.;
- Zatovskaya, N.
- Article
22
- Semiconductors, 2011, v. 45, n. 7, p. 935, doi. 10.1134/S1063782611070220
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