Works matching IS 10637826 AND DT 2010 AND VI 44 AND IP 8
Results: 28
Metal-insulator-semiconductor barriers with a nanometer-thick aluminum nitride insulator on p-type silicon.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1030, doi. 10.1134/S1063782610080130
- By:
- Publication type:
- Article
Raman scattering in organic semiconductors based on erbium biphthalocyanine molecules and chlorine-containing europium-lutetium triphthalocyanine molecules.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1044, doi. 10.1134/S1063782610080166
- By:
- Publication type:
- Article
Raman studies of silicon nanocrystals embedded in silicon suboxide layers.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1040, doi. 10.1134/S1063782610080154
- By:
- Publication type:
- Article
Electron structure and spectral characteristics of Cd-substituted Ge-based clathrates.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 987, doi. 10.1134/S106378261008004X
- By:
- Publication type:
- Article
InGaAs tunnel-injection structures with nanobridges: Excitation transfer and luminescence kinetics.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1050, doi. 10.1134/S1063782610080178
- By:
- Publication type:
- Article
Photoluminescence of nitro-substituted europium (III) phthalocyanines.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1070, doi. 10.1134/S1063782610080208
- By:
- Publication type:
- Article
Effect of spacer layers on current-voltage characteristics of resonant-tunneling diode.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1034, doi. 10.1134/S1063782610080142
- By:
- Publication type:
- Article
Study of spin centers in nanocrystalline titanium dioxide with a high degree of photocatalytic activity.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1059, doi. 10.1134/S106378261008018X
- By:
- Publication type:
- Article
Study of photoluminescence and electroluminescence mechanisms in quantum-confined InSb/InAs heterostructures.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1064, doi. 10.1134/S1063782610080191
- By:
- Publication type:
- Article
Relaxation of crystal lattice parameters and structural ordering in InGaAs epitaxial alloys.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1106, doi. 10.1134/S1063782610080270
- By:
- Publication type:
- Article
Structural and electrical properties of SiGe-on-insulator substrates fabricated by direct bonding.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1101, doi. 10.1134/S1063782610080269
- By:
- Publication type:
- Article
A study of raman and rutherford backscattering spectra of amorphous carbon films modified with platinum.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1074, doi. 10.1134/S106378261008021X
- By:
- Publication type:
- Article
Interference effects in the electroreflectance and electroluminescence spectra of InGaN/AlGaN/GaN light-emitting-diode heterostructures.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1090, doi. 10.1134/S1063782610080245
- By:
- Publication type:
- Article
Efficient photoelectric converters of ultraviolet radiation based on ZnS and CdS with low-resistivity surface layers.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1080, doi. 10.1134/S1063782610080221
- By:
- Publication type:
- Article
Two-electron tin centers arising in glassy chalcogenides of arsenic due to nuclear reactions.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 978, doi. 10.1134/S1063782610080026
- By:
- Publication type:
- Article
Study of minority carrier diffusion lengths in photoactive layers of multijunction solar cells.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1084, doi. 10.1134/S1063782610080233
- By:
- Publication type:
- Article
Interaction of copper impurity with radiation defects in silicon doped with boron.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 983, doi. 10.1134/S1063782610080038
- By:
- Publication type:
- Article
Development and photoelectric properties of In/ p-AgAsS surface-barrier structures.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1025, doi. 10.1134/S1063782610080129
- By:
- Publication type:
- Article
Features of the charge transfer in structures based on thin layers of bismuth-modified arsenic triselenide.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1004, doi. 10.1134/S1063782610080075
- By:
- Publication type:
- Article
Properties of ZnO whiskers under CO-laser irradiation.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1113, doi. 10.1134/S1063782610080282
- By:
- Publication type:
- Article
Capacitance-voltage characteristics of the electrolyte- n-InN surface and electron states at the interface.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1020, doi. 10.1134/S1063782610080117
- By:
- Publication type:
- Article
Electron scattering by acceptor centers in p-AgTe at low temperatures.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1008, doi. 10.1134/S1063782610080087
- By:
- Publication type:
- Article
InP/GaAsSb type-II DHBTs with GaAsSb/lnGaAs superlattice-base and GaAsSb bulk-base structures.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1096, doi. 10.1134/S1063782610080257
- By:
- Publication type:
- Article
A study of the process of decomposition of supersaturated GaAs:Fe solid solution by scanning probe microscopy.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 975, doi. 10.1134/S1063782610080014
- By:
- Publication type:
- Article
Optical properties of thin GaSe/ n-Si(111) films.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1012, doi. 10.1134/S1063782610080099
- By:
- Publication type:
- Article
Direct tunneling of electrons in Al- n-Si-SiO- n-Si structures under conditions of nonstationary depletion of the semiconductor surface of the majority charge carriers.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 1016, doi. 10.1134/S1063782610080105
- By:
- Publication type:
- Article
Study of main HgMnZnTe band parameters.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 993, doi. 10.1134/S1063782610080051
- By:
- Publication type:
- Article
Statistical method of deep-level transient spectroscopy in semiconductors.
- Published in:
- Semiconductors, 2010, v. 44, n. 8, p. 997, doi. 10.1134/S1063782610080063
- By:
- Publication type:
- Article